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    • 1. 发明申请
    • PROCESS CONDITION EVALUATION METHOD FOR LIQUID CRYSTAL DISPLAY MODULE
    • 液晶显示模块的工艺条件评估方法
    • US20110070670A1
    • 2011-03-24
    • US12958031
    • 2010-12-01
    • Jeong-Yeop LEEHoon ChoiYoung Seok ChoiKwang-Sik Oh
    • Jeong-Yeop LEEHoon ChoiYoung Seok ChoiKwang-Sik Oh
    • H01L21/66
    • G09G3/006G09G3/3648
    • A process condition evaluation method for a liquid crystal display module (LCM) includes: a first step of obtaining a threshold power measuring pattern, an analysis sample for a cell bonding status in an LCD fabrication process, and obtaining a lower substrate sample by separating an upper substrate from the threshold power measuring pattern; a second step of supplying voltages on a gate pad on the lower substrate sample with sequentially increasing a voltage level by a predetermined unit by using an electrical device, and obtaining a threshold current and a threshold voltage by measuring currents at a drain pad whenever voltage increased by a predetermined unit is applied to the gate pad; and a third step of obtaining threshold power based on the threshold current and the threshold voltage, and thereby evaluating process conditions of the LCM.
    • 液晶显示模块(LCM)的工艺条件评估方法包括:获得阈值功率测量图案的第一步骤,LCD制造工艺中的单元接合状态的分析样本,以及通过分离下一个 上基板从阈值功率测量图案; 第二步骤,通过使用电气装置依次增加预定单位的电压电平,在下部基板样品上的栅极焊盘上提供电压,并且每当电压增加时,通过测量漏极焊盘处的电流来获得阈值电流和阈值电压 通过预定单元施加到栅极焊盘; 以及第三步骤,基于阈值电流和阈值电压获得阈值功率,从而评估LCM的处理条件。
    • 2. 发明授权
    • Process condition evaluation method for liquid crystal display module
    • 液晶显示模块的工艺条件评估方法
    • US08178367B2
    • 2012-05-15
    • US12958031
    • 2010-12-01
    • Jeong-Yeop LeeHoon ChoiYoung Seok ChoiKwang-Sik Oh
    • Jeong-Yeop LeeHoon ChoiYoung Seok ChoiKwang-Sik Oh
    • H01L21/66G01R31/26
    • G09G3/006G09G3/3648
    • A process condition evaluation method for a liquid crystal display module (LCM) includes: a first step of obtaining a threshold power measuring pattern, an analysis sample for a cell bonding status in an LCD fabrication process, and obtaining a lower substrate sample by separating an upper substrate from the threshold power measuring pattern; a second step of supplying voltages on a gate pad on the lower substrate sample with sequentially increasing a voltage level by a predetermined unit by using an electrical device, and obtaining a threshold current and a threshold voltage by measuring currents at a drain pad whenever voltage increased by a predetermined unit is applied to the gate pad; and a third step of obtaining threshold power based on the threshold current and the threshold voltage, and thereby evaluating process conditions of the LCM.
    • 液晶显示模块(LCM)的工艺条件评估方法包括:获得阈值功率测量图案的第一步骤,LCD制造工艺中的单元接合状态的分析样本,以及通过分离下一个 上基板从阈值功率测量图案; 第二步骤,通过使用电气装置依次增加预定单位的电压电平,在下部基板样品上的栅极焊盘上提供电压,并且每当电压增加时,通过测量漏极焊盘处的电流来获得阈值电流和阈值电压 通过预定单元施加到栅极焊盘; 以及第三步骤,基于阈值电流和阈值电压获得阈值功率,从而评估LCM的处理条件。
    • 3. 发明申请
    • Process condition evaluation method for liquid crystal display module
    • 液晶显示模块的工艺条件评估方法
    • US20090289655A1
    • 2009-11-26
    • US12314695
    • 2008-12-15
    • Jeong-Yeop LeeHoon ChoiYoung-Seok ChoiKwang-Sik Oh
    • Jeong-Yeop LeeHoon ChoiYoung-Seok ChoiKwang-Sik Oh
    • G01R31/00
    • G09G3/006G09G3/3648
    • A process condition evaluation method for a liquid crystal display module (LCM) includes: a first step of obtaining a threshold power measuring pattern, an analysis sample for a cell bonding status in an LCD fabrication process, and obtaining a lower substrate sample by separating an upper substrate from the threshold power measuring pattern; a second step of supplying voltages on a gate pad on the lower substrate sample with sequentially increasing a voltage level by a predetermined unit by using an electrical device, and obtaining a threshold current and a threshold voltage by measuring currents at a drain pad whenever voltage increased by a predetermined unit is applied to the gate pad; and a third step of obtaining threshold power based on the threshold current and the threshold voltage, and thereby evaluating process conditions of the LCM.
    • 液晶显示模块(LCM)的工艺条件评估方法包括:获得阈值功率测量图案的第一步骤,LCD制造工艺中的单元接合状态的分析样本,以及通过分离下一个 上基板从阈值功率测量图案; 第二步骤,通过使用电气装置依次增加预定单位的电压电平,在下部基板样品上的栅极焊盘上提供电压,并且每当电压增加时,通过测量漏极焊盘处的电流来获得阈值电流和阈值电压 通过预定单元施加到栅极焊盘; 以及第三步骤,基于阈值电流和阈值电压获得阈值功率,从而评估LCM的处理条件。
    • 4. 发明授权
    • Process condition evaluation method for liquid crystal display module
    • 液晶显示模块的工艺条件评估方法
    • US07858405B2
    • 2010-12-28
    • US12314695
    • 2008-12-15
    • Jeong-Yeop LeeHoon ChoiYoung Seok ChoiKwang-Sik Oh
    • Jeong-Yeop LeeHoon ChoiYoung Seok ChoiKwang-Sik Oh
    • H01L21/66G01R31/26G01R31/00
    • G09G3/006G09G3/3648
    • A process condition evaluation method for a liquid crystal display module (LCM) includes: a first step of obtaining a threshold power measuring pattern, an analysis sample for a cell bonding status in an LCD fabrication process, and obtaining a lower substrate sample by separating an upper substrate from the threshold power measuring pattern; a second step of supplying voltages on a gate pad on the lower substrate sample with sequentially increasing a voltage level by a predetermined unit by using an electrical device, and obtaining a threshold current and a threshold voltage by measuring currents at a drain pad whenever voltage increased by a predetermined unit is applied to the gate pad; and a third step of obtaining threshold power based on the threshold current and the threshold voltage, and thereby evaluating process conditions of the LCM.
    • 液晶显示模块(LCM)的工艺条件评估方法包括:获得阈值功率测量图案的第一步骤,LCD制造工艺中的单元接合状态的分析样本,以及通过分离下一个 上基板从阈值功率测量图案; 第二步骤,通过使用电气装置依次增加预定单位的电压电平,在下部基板样品上的栅极焊盘上提供电压,并且每当电压增加时,通过测量漏极焊盘处的电流来获得阈值电流和阈值电压 通过预定单元施加到栅极焊盘; 以及第三步骤,基于阈值电流和阈值电压获得阈值功率,从而评估LCM的处理条件。
    • 9. 发明授权
    • Output timing control circuit and semiconductor apparatus using the same
    • 输出定时控制电路及使用其的半导体装置
    • US08959378B2
    • 2015-02-17
    • US13219657
    • 2011-08-27
    • Hoon Choi
    • Hoon Choi
    • G06F1/00H03K5/13
    • H03K5/131
    • An output timing control circuit of a semiconductor apparatus includes a delay amount counter block configured to count a delay amount of an output reset pulse signal based on an external clock signal and output a first counting code, wherein the delay amount counter block is configured to control the delay amount of the output reset pulse signal depending upon a frequency of the external clock signal; an operation block configured to subtract a code value of the first counting code from a code value of a data output delay code, and output a delay control code; and a phase control block configured to control a phase of a read command signal by the number of clocks of a DLL clock signal corresponding to a code value of the delay control code, and output an output enable flag signal.
    • 半导体装置的输出定时控制电路包括:延迟量计数器块,被配置为基于外部时钟信号对输出复位脉冲信号的延迟量进行计数,并输出第一计数代码,其中延迟量计数器块被配置为控制 输出复位脉冲信号的延迟量取决于外部时钟信号的频率; 操作块,被配置为从数据输出延迟码的代码值中减去第一计数代码的代码值,并输出延迟控制代码; 以及相位控制块,被配置为通过与延迟控制代码的代码值相对应的DLL时钟信号的时钟数来控制读取命令信号的相位,并输出输出使能标志信号。