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    • 1. 发明授权
    • Memory using undecoded precharge for high speed data sensing
    • 内存使用未编码的预充电用于高速数据传感
    • US5754482A
    • 1998-05-19
    • US845097
    • 1997-04-21
    • Jeffrey Yangming SuBruce Lee MortonChad Steven Gallun
    • Jeffrey Yangming SuBruce Lee MortonChad Steven Gallun
    • G11C16/06G11C7/12G11C16/24G11C16/28G11C16/04
    • G11C16/28G11C16/24G11C7/12
    • A memory (400) returns all bit lines to a predetermined voltage level optimum for subsequent fast sensing. The memory (400) includes precharge circuitry (106, 108, 110) which begins the precharge operation during the latching phase of a prior access. The precharge circuitry (106, 108, 110) precharges all bit lines, rather than a selected bit line, to the predetermined voltage level prior to address decoding. In order to prevent "walk-up", the memory (400) includes circuitry such as a switched capacitor (138, 140) which draws current from the bit lines to reduce the voltage on a bit line which drove a logic high level in an earlier cycle or which had an increased voltage due to capacitive cross-coupling to an adjacent bit line. The memory (400) may also include devices such as transmission gates (142, 144, 146) to couple together adjacent bit lines and thereby more evenly distribute the precharging.
    • 存储器(400)将所有位线返回到用于随后的快速感测最佳的预定电压电平。 存储器(400)包括在先前访问的锁存阶段期间开始预充电操作的预充电电路(106,108,110)。 在地址解码之前,预充电电路(106,108,110)将所有位线而不是所选择的位线预充电到预定电压电平。 为了防止“走动”,存储器(400)包括诸如开关电容器(138,140)的电路,其从位线吸取电流以减少位线上的电压,从而驱动逻辑高电平 或者由于与相邻位线的电容性交叉耦合而具有增加的电压。 存储器(400)还可以包括诸如用于将相邻位线耦合在一起的传输门(142,144,146)的装置,从而更均匀地分配预充电。
    • 5. 发明授权
    • Method and apparatus for writing an erasable non-volatile memory
    • 用于写入可擦除非易失性存储器的方法和装置
    • US6128224A
    • 2000-10-03
    • US289699
    • 1999-04-09
    • Bruce Lee MortonMichel BronAlexis MarquotGraham StoutEric Boulian
    • Bruce Lee MortonMichel BronAlexis MarquotGraham StoutEric Boulian
    • G11C16/02G11C16/00G11C16/10G11C16/06
    • G11C16/10
    • A method for writing data to non-volatile memory (50) involves alternately applying programming and erase voltages to a control gate wordline of a memory cell. A write includes programming and erasing bits (30, 31, . . . , 32, 33) in the memory array (56). After writing, a verify erase (VE) operation and a verify program (VP) operation are performed to determine if multiple cycles are necessary. The method also permits refreshing data in the array without transferring the data onto a data bus for improved security. In one embodiment, a three transistor EEPROM is written by providing a high voltage to the drain select of the selected wordline, while providing a low voltage to the drain select of other wordlines. Programming and erase voltages are applied to the control gate wordline of the selected wordline in cycles until the write is complete. The memory cell structure allows isolation of each bit in the array to avoid adverse effects on neighbor bits.
    • 一种将数据写入非易失性存储器(50)的方法包括交替地将编程和擦除电压施加到存储器单元的控制门字线。 写入包括存储器阵列(56)中的编程和擦除位(30,31,...,32,33)。 在写入之后,执行验证擦除(VE)操作和验证程序(VP)操作以确定是否需要多个周期。 该方法还允许在阵列中刷新数据而不将数据传输到数据总线上以提高安全性。 在一个实施例中,通过向所选字线的漏极选择提供高电压,同时向其它字线的漏极选择提供低电压来写入三晶体管EEPROM。 编程和擦除电压以周期的形式施加到所选字线的控制栅极字线,直到写入完成。 存储单元结构允许隔离阵列中的每个位,以避免对相邻位的不利影响。