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    • 2. 发明申请
    • Multiple precursor cyclical depositon system
    • 多个前体循环保存系统
    • US20050008779A1
    • 2005-01-13
    • US10913888
    • 2004-08-06
    • Michael YangHyungsuk YoonHui ZhangHongbin FangMing Xi
    • Michael YangHyungsuk YoonHui ZhangHongbin FangMing Xi
    • C23C16/44C23C16/455C23C16/00
    • C23C16/45544C23C16/45531C23C16/45561
    • Embodiments of the present invention relate to an apparatus and method of cyclical deposition utilizing three or more precursors in which delivery of at least two of the precursors to a substrate structure at least partially overlap. One embodiment of depositing a ternary material layer over a substrate structure comprises providing at least one cycle of gases to deposit a ternary material layer. One cycle comprises introducing a pulse of a first precursor, introducing a pulse of a second precursor, and introducing a pulse of a third precursor in which the pulse of the second precursor and the pulse of the third precursor at least partially overlap. In one aspect, the ternary material layer includes, but is not limited to, tungsten boron silicon (WBxSiy), titanium silicon nitride (TiSixNy), tantalum silicon nitride (TaSixNy), silicon oxynitride (SiOxNy), and hafnium silicon oxide (HfSixOy). In one aspect, the composition of the ternary material layer may be tuned by changing the flow ratio of the second precursor to the third precursor between cycles.
    • 本发明的实施方案涉及利用三种或更多种前体的循环沉积的装置和方法,其中至少两种前体至少部分重叠的衬底结构。 在衬底结构上沉积三元材料层的一个实施例包括提供至少一个循环的气体以沉积三元材料层。 一个周期包括引入第一前体的脉冲,引入第二前体的脉冲,以及引入第三前体的脉冲,其中第二前体的脉冲和第三前体的脉冲至少部分重叠。 在一个方面,三元材料层包括但不限于钨硼硅(WBxSiy),氮化硅钛(TiSixNy),氮化钽(TaSixNy),氧氮化硅(SiOxNy)和氧化铪铪(HfSixOy) 。 在一个方面,三元材料层的组成可以通过在循环之间改变第二前体与第三前体的流动比来调节。
    • 5. 发明申请
    • Apparatus for the removal of a set of byproducts from a substrate edge and methods therefor
    • 用于从基板边缘去除一组副产品的设备及其方法
    • US20070068623A1
    • 2007-03-29
    • US11237327
    • 2005-09-27
    • Yunsang KimAndrew BaileyHyungsuk Yoon
    • Yunsang KimAndrew BaileyHyungsuk Yoon
    • C23F1/00H01L21/306
    • H01L21/02087H01J37/321H01J37/32623
    • A plasma processing system including a plasma chamber for processing a substrate is disclosed. The apparatus includes a chuck configured for supporting a first surface of the substrate. The apparatus also includes a plasma resistant barrier disposed in a spaced-apart relationship with respect to a second surface of the substrate, the second surface being opposite the first surface, the plasma resistant barrier substantially shielding a center portion of the substrate and leaving an annular periphery area of the second surface of the substrate substantially unshielded by the plasma resistant barrier. The apparatus further includes at least one powered electrode, the powered electrode operating cooperatively with the plasma resistant barrier to generate confined plasma from a plasma gas, the confined plasma being substantially confined to the annular periphery portion of the substrate and away from the center portion of the substrate.
    • 公开了一种包括用于处理衬底的等离子体室的等离子体处理系统。 该装置包括配置用于支撑基板的第一表面的卡盘。 该装置还包括等离子体阻挡屏障,其相对于衬底的第二表面以间隔开的关系设置,第二表面与第一表面相对,等离子体阻挡屏障基本上屏蔽衬底的中心部分并留下环形 衬底的第二表面的周边区域基本上不受等离子体阻挡屏障的屏蔽。 所述设备还包括至少一个动力电极,所述动力电极与所述等离子体阻挡屏障协同工作以从等离子体气体产生约束等离子体,所述受限等离子体基本上限制在所述衬底的环形周边部分并且远离所述衬底的中心部分 底物。