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    • 1. 发明授权
    • Driving device and exposure apparatus
    • 驱动装置和曝光装置
    • US06750947B1
    • 2004-06-15
    • US09590182
    • 2000-06-09
    • Hiroyuki TomitaRyuichi EbinumaMakoto Mizuno
    • Hiroyuki TomitaRyuichi EbinumaMakoto Mizuno
    • G03B2768
    • G03F7/70825G02B7/026G02B15/14
    • A driving device includes a first member, an annular second member arranged outside the first member, an annular first plate for connecting the first and second members to each other, and an annular second plate for connecting the first and second members to each other. The first and second members are moved relative to each other by supplying or exhausting a fluid into or from a space surrounded by the first and second members and the first and second plates. Also, at least one of (i) an inner diameter a1 of a portion of the second member at which the second member is connected to the first plate is different from an inner diameter a2 of a portion of the second member at which the second member is connected to the second plate and (ii) an outer diameter b1 of a portion of the first member at which the first member is connected to the first plate is different from an outer diameter b2 of a portion of the first member at which the first member is connected to the second plate.
    • 驱动装置包括第一构件,布置在第一构件外部的环形第二构件,用于将第一构件和第二构件彼此连接的环形第一板和用于将第一构件和第二构件彼此连接的环形第二板。 通过向第一和第二构件以及第一和第二板围绕的空间供应或排出流体,第一和第二构件相对于彼此移动。 此外,(i)第二构件的与第一板连接的部分的内径a1中的至少一个与第二构件的第二构件的一部分的内径a2不同, 连接到第二板,并且(ii)第一构件与第一板连接的部分的外径b1不同于第一构件的第一构件的第一构件的一部分的外径b2 构件连接到第二板。
    • 5. 发明授权
    • Exposure apparatus and device manufacturing method using the same
    • 曝光装置及其制造方法
    • US5796469A
    • 1998-08-18
    • US891803
    • 1997-07-14
    • Ryuichi Ebinuma
    • Ryuichi Ebinuma
    • G03F7/20G03F9/00G03B27/42G03B27/52
    • G03F7/70358G03F7/70716G03F7/70775G03F7/70833G03F7/70866G03F9/70
    • An exposure apparatus in which a portion of a pattern of a reticle is projected onto a wafer and in which the reticle and the wafer are scanned synchronously such that the pattern of the reticle is transferred to the wafer. The apparatus includes a reticle stage and a wafer stage for scanningly moving the reticle and the wafer, respectively, a measuring system for measuring a deviation of the reticle stage relative to the wafer stage in a predetermined direction other than the direction of scanning movement, and an adjusting device for adjusting the wafer stage on the basis of the measurement by the measuring system. In one aspect, the measuring system includes a laser interferometer. In another aspect, a frame member is provided for supporting the stages, and a flow passageway is provided in the frame member for flowing therethrough a temperature adjusting medium. In yet another aspect, the present invention is directed to an exposure method for the manufacture of microdevices.
    • 将掩模版图形的一部分投影到晶片上并且将掩模版和晶片同步扫描的曝光装置,使得标线片的图案被转印到晶片上。 该装置包括:分划板台和用于分别扫描光罩和晶片的晶片台;测量系统,用于测量除了扫描方向以外的预定方向相对于晶片台的偏离;以及 调整装置,用于基于测量系统的测量来调整晶片台。 在一个方面,测量系统包括激光干涉仪。 在另一方面,提供了一种用于支撑台架的框架构件,并且在框架构件中设置有用于流过温度调节介质的流动通道。 在另一方面,本发明涉及一种用于制造微型器件的曝光方法。