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    • 10. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US06937068B2
    • 2005-08-30
    • US10642138
    • 2003-08-18
    • Michiaki NakayamaMasato HamamotoKazutaka MoriSatoru Isomura
    • Michiaki NakayamaMasato HamamotoKazutaka MoriSatoru Isomura
    • H01L27/092H01L27/11H01L27/04
    • H01L27/1104H01L27/0921H01L27/0928
    • An integrated circuit having a CMOS circuit constituted by electrically connecting an n-type well 2, in which p-channel transistor Tp of the CMOS circuit is set, with a supply line Vdd through switching transistor Tps, and electrically connecting a p-type well 3, in which n-channel transistor Tn of the CMOS circuit is set, with supply line Vss through switching transistor Tns. Thermal runaway due to leakage current can be controlled by turning off switching transistors Tps and Tns and supplying potentials suitable for a test to the n-type well 2 and the p-type well 3 from an external unit when the integrated circuit is being tested. Fluctuations of the latch-up phenomenon and operation speed can be prevented by turning on switching transistors Tps and Tns and setting the n-type well 2 and the p-type well 3 to the voltages Vdd and Vss, respectively.
    • 具有CMOS电路的集成电路,其通过将n型阱2(其中CMOS电路的p沟道晶体管Tp被置位)与通过开关晶体管Tps的电源线Vdd电连接而构成,并且电连接p型阱 如图3所示,其中CMOS电路的n沟道晶体管Tn被设置,电源线Vss通过开关晶体管Tns。 当集成电路被测试时,可以通过关断开关晶体管Tps和Tns并从外部单元向n型阱2和p型阱3提供适合于测试的电位来控制由于泄漏电流引起的热失控。 通过接通开关晶体管Tps和Tns并分别将n型阱2和p型阱3分别设置为电压Vdd和Vss可以防止闩锁现象和操作速度的波动。