会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Electron microscope
    • 电子显微镜
    • US5552602A
    • 1996-09-03
    • US398684
    • 1995-03-06
    • Hiroshi KakibayashiYasuhiro MitsuiHideo TadokoroKatsuhiro KurodaMasanari KoguchiKazutaka TsujiTatsuo MakishimaMikio IchihashiShigeto Isakozawa
    • Hiroshi KakibayashiYasuhiro MitsuiHideo TadokoroKatsuhiro KurodaMasanari KoguchiKazutaka TsujiTatsuo MakishimaMikio IchihashiShigeto Isakozawa
    • G01N23/04G01R31/305H01J37/26
    • G01R31/305G01N23/046G01N2223/419H01J2237/226
    • 3-dimensional observation on the atomic arrangement and atomic species in a thin-film specimen as well as conventional electron microscope observations is carried out at high speed and accuracy by an electron microscope which measures electrons emitted at high angle from the specimen. For that purpose, the present invention provides a scanning transmission electron microscope having an electron detection device comprising a scintillator converting electrons detected thereby to photons, a photoconductive-film converting photons from the scintillator detected thereby to c.a. 1000 times as many electron-hole pairs as these photons (i.d. avalanche multiplication), an electron gun emitting an electron beam toward the photoconductive-film to detect the holes generated therein, and electron deflector electrodes deflecting the electron beam on the photoconductive-film. Avalanche multiplication in the photoconductive-film amplifies the signal of these photons at so high signal-to-noise ratio that the electron microscope in this invention can detect such weak electrons as emitted at high angle from the specimen at high sensitivity and resolution. Therefore this invention enables a scanning transmission electron microscope to obtain for example 3-dimensional image of point defects and impurity elements existing in joint interfaces and contacts in a ULSI device rapidly and accurately.
    • 通过电子显微镜以高速和准确的方式对薄膜样品中的原子排列和原子种类进行3维观察,以及常规的电子显微镜观察,测量从样品以高角度发射的电子。 为此目的,本发明提供了一种具有电子检测装置的扫描透射电子显微镜,该电子检测装置包括将由此检测的电子转化为光子的闪烁体,从其检测的闪烁体的光电导膜转换光子至c.a. 与这些光子(i.d.雪崩乘法)一样多的电子 - 空穴对的1000倍,向光电导膜发射电子束以检测其中产生的空穴的电子枪以及偏转电子束在光电导膜上的电子偏转器电极。 光电导膜中的雪崩乘法以如此高的信噪比放大了这些光子的信号,使得本发明的电子显微镜能够以高灵敏度和分辨率从样品中以高角度检测出这样的弱电子。 因此,本发明能够使扫描透射电子显微镜能够快速,准确地获得例如存在于ULSI装置的接合界面和触点中的点缺陷和杂质元素的3维图像。