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    • 3. 发明授权
    • Blank for halftone phase shift photomask and halftone phase shift photomask
    • 用于半色调相移光掩模和半色调相移光掩模的空白
    • US06458496B2
    • 2002-10-01
    • US09736805
    • 2000-12-14
    • Toshiaki MotonagaToshifumi YokoyamaTakafumi OkamuraYoshinori KinaseHiroshi MohriJunji FujikawaHiro-o NakagawaShigeki SumidaSatoshi YusaMasashi Ohtsuki
    • Toshiaki MotonagaToshifumi YokoyamaTakafumi OkamuraYoshinori KinaseHiroshi MohriJunji FujikawaHiro-o NakagawaShigeki SumidaSatoshi YusaMasashi Ohtsuki
    • G03S900
    • G03F1/32B32B17/06
    • A blank for a halftone phase shift photomask in the present invention comprises a transparent substrate and a halftone phase shift film provided thereon, and said halftone phase shift film has a multilayer construction in which at least a first layer capable of being etched with a chlorinated gas and a second layer capable of being etched with a fluorinated gas are disposed in this order from the side near said transparent substrate. A film made of tantalum silicides is suitable to use as the second layer of the halftone phase shift film. When such a blank is first etched with a fluorinated gas and then etched with chlorinated gas, because an etching selective ratio to a transparent substrate made of synthetic quartz and the like can be taken sufficiently while maintaining the applicability to the exposure light with a short wavelength that is characteristic of silicide materials in addition to good chemical stability and good processing properties that are characteristic of tantalum materials, patterning in high precision will be made possible. As a result, it is possible to obtain an ideal halftone phase shift photomask excellent in stability after mask processing and in the applicability to the short wavelength.
    • 本发明中的半色调相移光掩模的空白包括透明基板和设置在其上的半色调相移膜,所述半色调相移膜具有多层结构,其中至少可以用氯化气体蚀刻的第一层 并且能够用氟化气体蚀刻的第二层从靠近所述透明基板的一侧依次设置。 由硅化钽制成的薄膜适用于半色调相移薄膜的第二层。 当首先用氟化气体蚀刻这样的坯料,然后用氯化气体蚀刻时,由于可以充分利用由合成石英等制成的透明基板的蚀刻选择比,同时保持对短波长的曝光光的适用性 这是硅化物材料的特征,除了钽材料的特征的良好的化学稳定性和良好的加工性能之外,将能够高精度地进行图案化。 结果,可以获得在掩模处理之后和在短波长的适用性方面优异的理想半色调相移光掩模。
    • 8. 发明申请
    • Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source
    • 用于检测波长可变半导体激光器的装置和方法以及检查相干光源的方法
    • US20050276288A1
    • 2005-12-15
    • US11197624
    • 2005-08-04
    • Yasuo KitaokaToshifumi YokoyamaKazuhisa Yamamoto
    • Yasuo KitaokaToshifumi YokoyamaKazuhisa Yamamoto
    • G01J1/42H01S3/10H01S5/00H01S5/06H01S5/0625
    • G01J1/4257H01S5/0014H01S5/005H01S5/0092H01S5/06256
    • A method for easily and quickly evaluating the wavelength variability properties of a wavelength-variable semiconductor laser is provided. An inspection device includes a power source for supplying current to a wavelength-variable DBR semiconductor laser having an active region, a phase control region, and a DBR region, a photo-detector for detecting an output intensity of laser beam emitted from the wavelength-variable DBR semiconductor laser, and a transmission type wavelength-selection element that can be inserted into a light path from the wavelength-variable DBR semiconductor laser to the photo-detector. In a state where the transmission type wavelength-selection element is inserted into the light path from the wavelength-variable DBR semiconductor laser to the photo-detector, at least one of a phase current that is supplied to the phase control region and a DBR current that is supplied to the DBR region is changed with respect to a predetermined active current that is supplied to the active region, and the output intensity of the laser beam after the laser beam has passed through the transmission type wavelength-selection element is detected by the photo-detector.
    • 提供了一种容易且快速地评估波长可变半导体激光器的波长变异性的方法。 检查装置包括用于向具有有源区域的波长可变DBR半导体激光器提供电流的电源,相位控制区域和DBR区域,用于检测从波长范围发射的激光束的输出强度的光电检测器, 可变DBR半导体激光器和可以插入到从波长可变DBR半导体激光器到光检测器的光路中的透射型波长选择元件。 在透射型波长选择元件从波长可变DBR半导体激光器插入到光检测器的光路中的状态下,提供给相位控制区域的相电流和DBR电流中的至少一个 提供给DBR区域的电压相对于提供给有源区域的预定有功电流而改变,并且激光束已经通过透射型波长选择元件之后的激光束的输出强度由 光电探测器。
    • 10. 发明授权
    • Phase shift mask and method of producing the same
    • 相移掩模及其制造方法
    • US5972543A
    • 1999-10-26
    • US100083
    • 1998-06-19
    • Toshifumi YokoyamaKoichi MikamiChiaki HatsudaHiroshi Mohri
    • Toshifumi YokoyamaKoichi MikamiChiaki HatsudaHiroshi Mohri
    • H01L21/027G03F1/32G03F9/00
    • G03F1/32
    • A phase shift mask, e.g. a halftone phase shift mask, which need not to form an ultra-fine pattern and is capable of suppressing during exposure the occurrence of a sub-peak of light intensity, which has an adverse effect on the image formation, and which has a light-blocking pattern with a reduced transmittance at a region outside a device pattern area which corresponds to a region subjected to multiple exposure during transfer effected by using the mask. The halftone phase shift mask has on a transparent substrate (101) a halftone phase shift film (102) comprising a single layer or a plurality of layers. The composition of the halftone phase shift film (102) is changed in a region (107) outside a device pattern area on the transparent substrate (101) which corresponds to a multiple-exposure region by a method wherein the region (107) is irradiated with an electromagnetic wave, a particle beam, heat rays, etc., or a method wherein after a region in which the composition is not desired to change has been masked, the whole blank is exposed to an active atmosphere, thereby reducing the transmittance for exposure light at the region (107).
    • 相移掩模,例如 半色调相移掩模,其不需要形成超细图案,并且能够在曝光期间抑制对图像形成产生不利影响的光强度的次峰值的出现, 在对应于通过使用掩模进行的转印期间经受多次曝光的区域的器件图案区域外的区域处的透射率降低的阻挡图案。 半色调相移掩模在透明基板(101)上具有包括单层或多层的半色调相移膜(102)。 通过照射区域(107)的方法,半透明相移膜(102)的组成在与多曝光区域对应的透明基板(101)的装置图案区域外的区域(107)中变化 具有电磁波,粒子束,热射线等,或者其中在组合物不希望改变的区域已被掩蔽之后,整个坯料暴露于活性气氛,从而降低透射率 在区域(107)处的曝光光。