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    • 1. 发明申请
    • Gas discharge laser output light beam parameter control
    • 气体放电激光输出光束参数控制
    • US20060227839A1
    • 2006-10-12
    • US11095293
    • 2005-03-31
    • Herve BesauceleIgor FomenkovWilliam PartloFedor TrintchoukHao Ton That
    • Herve BesauceleIgor FomenkovWilliam PartloFedor TrintchoukHao Ton That
    • H01S3/22
    • H01S3/036H01S3/038H01S3/097H01S3/09702H01S3/134
    • A line narrowed gas discharge laser system and method of operation are disclosed which may comprise: an oscillator cavity; a laser chamber comprising a chamber housing containing a lasing medium gas; at least one peaking capacitor electrically connected to the chamber housing and to a first one of a pair of electrodes; a second one of the pair of electrodes connected to an opposite terminal of the at least one peaking capacitor; a current return path connected to the chamber housing; the one terminal, the first one of the electrodes, the lasing medium gas, the second one of the electrodes, the current return path and the second terminal forming a head current inductive loop having an inductance unique to the particular head current inductive loo; a spectral quality tuning mechanism comprising a mechanism for changing the particular head current inductive loop inductance value for the particular head current inductance loop.
    • 公开了一种窄气体放电激光系统和操作方法,其可以包括:振荡器腔; 激光室,包括容纳激光介质气体的腔室; 至少一个峰值电容器电连接到所述腔室壳体和一对电极中的第一电极; 所述一对电极中的第二个连接到所述至少一个峰值电容器的相对端子; 连接到所述腔室壳体的电流返回路径; 一个端子,第一个电极,激光介质气体,第二个电极,电流返回路径和第二个端子,形成具有特定头电流电感槽独有的电感的头电流感应回路; 光谱质量调谐机构包括用于改变特定头电流电感回路的特定头电流感应环电感值的机构。
    • 5. 发明申请
    • High power high pulse repetition rate gas discharge laser system bandwidth management
    • US20060114956A1
    • 2006-06-01
    • US11000571
    • 2004-11-30
    • Richard SandstromWilliam PartloDaniel BrownJ. Martin AlgotsFedor Trintchouk
    • Richard SandstromWilliam PartloDaniel BrownJ. Martin AlgotsFedor Trintchouk
    • H01S3/22
    • H01S3/08009H01S3/08031H01S3/08059H01S3/097H01S3/1055
    • A line narrowing apparatus and method for a narrow band DUV high power high repetition rate gas discharge laser producing output laser light pulse beam pulses in bursts of pulses is disclosed, which may comprise a dispersive center wavelength selection optic contained within a line narrowing module, selecting at least one center wavelength for each pulse determined at least in part by the angle of incidence of the laser light pulse beam containing the respective pulse on a dispersive wavelength selection optic dispersive surface; a first dispersive optic bending mechanism operatively connected to the dispersive center wavelength selection optic and operative to change the curvature of the dispersive surface in a first manner; and, a second dispersive optic bending mechanism operatively connected to the dispersive center wavelength selection optic and operative to change the curvature of the dispersive surface in a second manner. The first manner may modify a first measure of bandwidth and the second manner may modify a second measure of bandwidth such that the ratio of the first measure to the second measure substantially changes. The first measure may be a spectrum width at a selected percentage of the spectrum peak value (FWX % M) and the second measure may be width within which some selected percentage of the spectral intensity is contained (EX %). The first dispersive optic bending mechanism may change the curvature of the dispersive surface in a first dimension and the second in a second dimension generally orthogonal to the first dimension. The laser system may comprise a beam path insert comprising a material having an different index of refraction and an index of refraction thermal gradient opposite from that of a neighboring optical element. The first dispersive optic bending mechanism may change the curvature of the dispersive surface in a first dimension and the second a second dimension generally parallel to the first dimension. An optical beam twisting element in the lasing cavity may optically twist the laser light pulse beam to present a twisted wavefront to the dispersive center wavelength selection optic. Bending may change the curvature and wavelength selection, e.g., in a burst may create two center wavelength peaks to select FWX % M and EX % independently.
    • 8. 发明申请
    • EUV light source
    • US20050199829A1
    • 2005-09-15
    • US10900839
    • 2004-07-27
    • William PartloNorbert BoweringAlexander ErshovIgor FomenkovDavid MyersIan OliverJohn ViatellaRobert Jacques
    • William PartloNorbert BoweringAlexander ErshovIgor FomenkovDavid MyersIan OliverJohn ViatellaRobert Jacques
    • G03F7/20G21K1/06H01J35/20H05G2/00H01J65/04
    • G03F7/70033B82Y10/00G03F7/70175G03F7/70916G21K1/062G21K2201/061G21K2201/065G21K2201/067H05G2/003H05G2/005H05G2/006H05G2/008
    • An apparatus and method for EUV light production is disclosed which may comprise a laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source control system comprising a target delivery system adapted to deliver moving plasma initiation targets and an EUV light collection optic having a focus defining a desired plasma initiation site, comprising: a target tracking and feedback system comprising: at least one imaging device providing as an output an image of a target stream track, wherein the target stream track results from the imaging speed of the camera being too slow to image individual plasma formation targets forming the target stream imaged as the target stream track; a stream track error detector detecting an error in the position of the target stream track in at least one axis generally perpendicular to the target stream track from a desired stream track intersecting the desired plasma initiation site. At least one target crossing detector may be aimed at the target track and detecting the passage of a plasma formation target through a selected point in the target track. A drive laser triggering mechanism utilizing an output of the target crossing detector to determine the timing of a drive laser trigger in order for a drive laser output pulse to intersect the plasma initiation target at a selected plasma initiation site along the target track at generally its closest approach to the desired plasma initiation site. A plasma initiation detector may be aimed at the target track and detecting the location along the target track of a plasma initiation site for a respective target. An intermediate focus illuminator may illuminate an aperture formed at the intermediate focus to image the aperture in the at least one imaging device. The at least one imaging device may be at least two imaging devices each providing an error signal related to the separation of the target track from the vertical centerline axis of the image of the intermediate focus based upon an analysis of the image in the respective one of the at least two imaging devices. A target delivery feedback and control system may comprise a target delivery unit; a target delivery displacement control mechanism displacing the target delivery mechanism at least in an axis corresponding to a first displacement error signal derived from the analysis of the image in the first imaging device and at least in an axis corresponding to a second displacement error signal derived from the analysis of the image in the second imaging device.
    • 9. 发明申请
    • Discharge produced plasma EUV light source
    • US20070023711A1
    • 2007-02-01
    • US11493945
    • 2006-07-26
    • Igor FomenkovWilliam PartloGerry BlumenstockNortbert BoweringI. OliverXiaojiang PanRodney Simmons
    • Igor FomenkovWilliam PartloGerry BlumenstockNortbert BoweringI. OliverXiaojiang PanRodney Simmons
    • G01J3/10
    • H05G2/003B82Y10/00G03F7/70033G03F7/70166G03F7/70175G03F7/70825G03F7/70891G03F7/70908G03F7/70916G21K1/06G21K2201/064G21K2201/067H01S3/005H01S3/225H05G2/005H05H1/06
    • An DPP EUV source is disclosed which may comprise a debris mitigation apparatus employing a metal halogen gas producing a metal halide from debris exiting the plasma. The EUV source may have a debris shield that may comprise a plurality of curvilinear shield members having inner and outer surfaces connected by light passages aligned to a focal point, which shield members may be alternated with open spaces between them and may have surfaces that form a circle in one axis of rotation and an ellipse in another. The electrodes may be supplied with a discharge pulse shaped to produce a modest current during the axial run out phase of the discharge and a peak occurring during the radial compression phase of the discharge. The light source may comprise a turbomolecular pump having an inlet connected to the generation chamber and operable to preferentially pump more of the source gas than the buffer gas from the chamber. The source may comprise a tuned electrically conductive electrode comprising: a differentially doped ceramic material doped in a first region to at least select electrical conductivity and in a second region at least to select thermal conductivity. The first region may be at or near the outer surface of the electrode structure and the ceramic material may be SiC or alumina and the dopant is BN or a metal oxide, including SiO or TiO2. The source may comprise a moveable electrode assembly mount operative to move the electrode assembly mount from a replacement position to an operating position, with the moveable mount on a bellows. The source may have a temperature control mechanism operatively connected to the collector and operative to regulate the temperature of the respective shell members to maintain a temperature related geometry optimizing the glancing angle of incidence reflections from the respective shell members, or a mechanical positioner to position the shell members. The shells may be biased with a voltage. The debris shield may be fabricated using off focus laser radiation. The anode may be cooled with a hollow interior defining two coolant passages or porous metal defining the passages. The debris shield may be formed of pluralities of large, intermediate and small fins attached either to a mounting ring or hub or to each other with interlocking tabs that provide uniform separation and strengthening and do not block any significant amount of light.
    • 10. 发明申请
    • EUV LIGHT SOURCE COLLECTOR EROSION MITIGATION
    • EUV光源收集器腐蚀减轻
    • US20060289808A1
    • 2006-12-28
    • US11238828
    • 2005-09-28
    • William PartloAlexander ErshovIgor Fomenkov
    • William PartloAlexander ErshovIgor Fomenkov
    • H01J61/62
    • G03F7/70916B82Y10/00G01J1/429G03F7/70033G03F7/70175G03F7/70983G21K1/062G21K2201/067H05G2/003
    • An EUV light source collector erosion mitigation system and method is disclosed which may comprise a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma; a replacement material generator positioned to deliver replacement material comprising the capping material to the collector outer surface at a rate sufficient to replace the capping material removed due to the removing interaction. The replacement material generator may comprise a plurality of replacement material generators positioned to respectively deliver replacement material to a selected portion of the collector outer surface, which may comprise a sputtering mechanism sputtering replacement capping material onto the collector outer surface.
    • 公开了一种EUV光源收集器侵蚀缓解系统和方法,其可以包括收集器,其包括多层反射镜收集器,该多层反射镜收集器包括由封装材料构成的收集器外表面,该封盖材料由于与EUV发光等离子体中产生的材料的去除相互作用而被去除 ; 替代材料发生器定位成将包含封盖材料的替换材料以足以代替由于去除相互作用而去除的封盖材料的速率传送到收集器外表面。 替代材料发生器可以包括多个替换材料发生器,其被定位成分别将替代材料递送到集电器外表面的选定部分,其可以包括溅射机构将溅射替换封盖材料涂覆到集电器外表面上。