专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JPS62192290A LASER BEAM MACHINE 失效
公开(公告)号：JPS62192290A
公开(公告)日：1987-08-22
申请号：JP3298486
申请日：1986-02-19
申请人： HITACHI LTD , RIKAGAKU KENKYUSHO
发明人： HOSOMI NOBUYUKI , KANEKIYO HIROSHI , MURAKAMI SEI , KASUYA KEIKO , TSUKAGOSHI MIKIRO
IPC分类号： C12N15/09 , B23K26/382 , C12M1/00 , C12N1/00 , C12N5/00 , C12N5/10 , C12N13/00 , C12N15/00
摘要： PURPOSE:To perform the laser beam machining properly for various samples by projecting the laser light from one direction of a sample by the 1st optical path, by projecting on the sample from another direction by the 2nd optical path by providing an optical path switching means. CONSTITUTION:The sample case 20 containing a sample is set on a sample base 2, the image picked up by a TV camera 25 is displayed on a monitor TV 40 and a table driving part 3 is roughly set to the position suitable for the work by driving the table driving part 3 with watching this display. The alignment of the position where the laser light of each sample is projected and the laser light projecting position is then performed. Shutters 52, 53 are closed at the completion time of this alignment. The laser light emitted from a laser light source (YAG laser) 1 selects the shutters 52, 53 of an optical path shifting device 5, thereafter, the work is executed by projecting the laser light on the sample through the selected optical path by the shutter 7 or 8, or shutters 7 and 8.

2. 发明专利

JPS62192289A LIGHTING METHOD FOR OBSERVATION OF LASER BEAM PIERCING DEVICE 失效
公开(公告)号：JPS62192289A
公开(公告)日：1987-08-22
申请号：JP3298286
申请日：1986-02-19
申请人： HITACHI LTD , RIKAGAKU KENKYUSHO
发明人： MURAKAMI SEI , HOSOMI NOBUYUKI , KANEKIYO HIROSHI , KIMURA NOBUO , KASUYA KEIKO , TSUKAGOSHI MIKIRO
IPC分类号： C12N15/09 , B23K26/12 , B23K26/382 , C12M1/00 , C12N1/00 , C12N13/00 , C12N15/00
摘要： PURPOSE:To correctly perform a piercing at the aiming position of a sample by eliminating the slippage between the image plain face of an observing image and the condensing position of laser light, by using the monochromatic light having the same wavelength as that of the laser light for piercing for the lighting light source for observation. CONSTITUTION:The laser light for piercing the sample 6 of the raw cell, etc., to be placed on a sample base 4 is projected from a laser oscillator 7, reflected by a half mirror 2 and condensed on the sample 6 through an objective lens 3. On the other hand, only the light component in the same wavelength as that of the laser light is selectively made translucent by a filter 11 on the lighting light emitted from a light source 10 to irradiate the sample 6 from the lower part. In this way the image of the sample 6 can be observed by an observer from an eyepiece 1 through the objective lens 3 and can be observed by a display device 9 via TV camera 8. Since the wavelengths of the light for observation and the laser beam become the same, the focus distance becomes the same and consequently the slippage between the image plain face of the observing image and the condensing position of the laser light is eliminated and the control of the piercing position of the sample is facilitated.

3. 发明专利

JPS62195277A PROCESSING OF LIVE SAMPLE 失效
公开(公告)号：JPS62195277A
公开(公告)日：1987-08-28
申请号：JP3298386
申请日：1986-02-19
申请人： HITACHI LTD , RIKAGAKU KENKYUSHO
发明人： KANEKIYO HIROSHI , HOSOMI NOBUYUKI , MURAKAMI SEI , KAWAMOTO MUNEO , KASUYA KEIKO , TSUKAGOSHI MIKIRO
IPC分类号： C12M1/00 , C12M1/42 , C12N1/00 , C12N5/00 , C12N13/00 , C12Q1/04 , G01N33/48
摘要： PURPOSE:To make it possible to realize processing suitable for the aimed live sample, by subjecting image signals obtained by taking photographs of the live sample with a camera to image processing, extracting characteristic and judging the resultant characteristic with predetermined characteristic information about the sample. CONSTITUTION:Image signals obtained by taking photographs of a live sample 1 with a TV camera 11 are subjected to image processing to extract characteristic (F3), which is then compared with predetermined characteristic information about the aimed live sample to distinguish the live sample from the sample other than the aimed sample whether the similarity of both is a permissible value or above. Processing is then carried out according to the distinction. In some cases, the aimed live sample is kept alive after the processing and the live sample other than the aimed one is killed after the processing. Perforating, cutting, removing, joining, etc., may be cited as the processing.

4. 发明专利

JPS63259465A CELL POSITION DETECTOR 失效
公开(公告)号：JPS63259465A
公开(公告)日：1988-10-26
申请号：JP9309987
申请日：1987-04-17
申请人： HITACHI LTD , RIKAGAKU KENKYUSHO
发明人： KAMESHIMA KOJI , OGAWA YURIKO , KIMURA NOBUO , KASUYA KEIKO , TSUKAGOSHI MIKIRO
IPC分类号： G01N33/48 , C12M1/34 , G06T1/00 , G06T7/00
摘要： PURPOSE:To automate cell monitoring work, by a method wherein contour features of a cell are extracted and pictures containing the most of cell contours are cut out from a contour feature image to judge the position of cells from the cut-out pictures. CONSTITUTION:An incubation container 1 is scanned from an address signal of a controller 4 by a TV camers 2 to photograph a cell S in a liquid as a set of pixels. An image of the cell S is transferred to a processor 3. The image transferred is processed with a feature extractor within the processor 3 to obtain an image data of a contour line of the cell. The image data is transferred to a cutting out circuit to cut out several pictures according to on set pixels. The number of features of the contour of the cell is counted in the cut-out pictures to determine the max. number of features. Then, address corresponding to max. of the number of pictures, namely, the position of the cell is judged. The cell positioned at the address is irradiated with a laser beam 5 to bore the cell and substance is taken in. In this manner, information on the position of an image is determined to control the laser light for irradiation, thereby achieving a higher workability.

5. 发明专利

JPS62195278A LASER PROCESSING OF LIVE SAMPLE 失效
公开(公告)号：JPS62195278A
公开(公告)日：1987-08-28
申请号：JP3298586
申请日：1986-02-19
申请人： HITACHI LTD , RIKAGAKU KENKYUSHO
发明人： MURAKAMI SEI , HOSOMI NOBUYUKI , KANEKIYO HIROSHI , KASUYA KEIKO , TSUKAGOSHI MIKIRO
IPC分类号： C12N15/09 , B23K26/00 , C12M1/00 , C12N1/00 , C12N5/00 , C12N5/04 , C12N13/00 , C12N15/00
摘要： PURPOSE:To survive a live sample after laser processing, by observing the shape of the live sample and reducing the quantity of laser beam irradiation when there is no repair on shape of the live sample. CONSTITUTION:For example, cells are irradiated with laser beams to transfect a substance, e.g. gene, etc., into the live cells and the surface shape of the irradiated part is modified and processed into a state for incorporation of the substance. In the process, the condition of the live cells is imaged to compare the shape with that before irradiation of the laser beams. If the shape is not repaired to that before the irradiation, the quantity of laser beam irradiation is reduced.

6. 发明专利

JP2520665B2 失效
公开(公告)号：JP2520665B2
公开(公告)日：1996-07-31
申请号：JP26081987
申请日：1987-10-16
申请人： RIKAGAKU KENKYUSHO
发明人： TSUKAGOSHI MIKIRO , KASUYA KEIKO
IPC分类号： G01N21/64

7. 发明专利

JPH0682881B2 失效
公开(公告)号：JPH0682881B2
公开(公告)日：1994-10-19
申请号：JP19537185
申请日：1985-09-04
申请人： RIKAGAKU KENKYUSHO
发明人： UEHARA KYOJI , SASADA HIROYUKI , UKAJI NOBUYOSHI , KASUYA KEIKO
IPC分类号： H01S3/108 , H01S3/02 , H01S3/13 , H01S3/20

8. 发明专利

JPH03169090A OSCILLATION OF WAVELENGTH VARIABLE EXTREME ULTRAVIOLET COHERENT RAY BY USE OF MOLECULE 失效
公开(公告)号：JPH03169090A
公开(公告)日：1991-07-22
申请号：JP30957789
申请日：1989-11-29
申请人： RIKAGAKU KENKYUSHO
发明人： TSUKIYAMA KOICHI , TSUKAGOSHI MIKIRO , KASUYA KEIKO
IPC分类号： H01S3/10 , H01S3/108
摘要： PURPOSE:To realize the oscillation of the high luminance and wavelength variable extreme ultraviolet coherent ray by the mixture of four waves of visible and ultraviolet pulse laser beams by jetting molecules as pulse jet synchronized with the laser beams, using the molecules for nonlinear mediums. CONSTITUTION:In the four-wave mixture laser oscillation method wherein a first laser beam W1, which brings about two-photon resonance intermediate excitation in a nonlinear medium, and a second laser beam W2, which is difference in wavelength from this laser beam W1, are applied at the same time so as to oscillate a third laser beam WXUV, a molecule is used for the nonlinear medium, and this molecule is jetted as the pulse jet synchronized with the first and second laser beams W1 and W2. Accordingly, nonlinearity susceptibility increases, and the strength of extreme ultraviolet ray increases remarkably. Moreover, by using the pulse jet flow of molecules, a nonlinear medium in high density can be obtained in vacuum in a short time. Hereby, the generation of a coherent beam in a broad wavelength range becomes possible.

9. 发明专利

JPH01199140A PHOTOELECTRON SPECTROSCOPY FOR SOLID-STATE SURFACE 失效
公开(公告)号：JPH01199140A
公开(公告)日：1989-08-10
申请号：JP2447688
申请日：1988-02-04
申请人： RIKAGAKU KENKYUSHO
发明人： MUNAKATA TOSHIAKI , KASUYA KEIKO
IPC分类号： G01N23/227 , G01N21/00
摘要： PURPOSE:To enable the highly sensitive measurement of an excitation level on a solid-state surface, by setting the intensity of vacuum ultraviolet laser light at a value whereat the pumping rate thereof exceeds a relaxation time of energy of an electron excited to a non-occupation level. CONSTITUTION:Laser light generated in a vacuum ultraviolet light generating chamber 12 and made to enter a vacuum ultraviolet spectroscope 13 is rid of a fundamental wave and only short wavelength light thereof is introduced into an ultra-high vacuum electron spectroscope 14. Being matched with a time of irradiation of a sample 15 by this short wavelength light, a wavelength-variable laser light for surface excitation is generated from a wavelength-variable laser oscillator 16 through a timing control 10 and applied to the sample 15 and thereby electrons in a solid-state surface are excited to a non-occupation level. The electrons emittted from the surface of the sample 15 are detected by an electron energy analyzer 17 and an electron detector 18, counted by an electron counting device 21 and sent to a computer 20, where the state of the electrons in the solid-state surface is measured. Then, the intensity of the vacuum ultraviolet laser light is set at a value whereat the pumping rate thereof exceeds a relaxation time of energy of an electron excited to the non-occupation level.

10. 发明专利

JPS627838B2 失效
公开(公告)号：JPS627838B2
公开(公告)日：1987-02-19
申请号：JP19137983
申请日：1983-10-13
申请人： RIKAGAKU KENKYUSHO , KAGAKU GIJUTSUCHO
发明人： KASUYA KEIKO , IGAWA YOJI , TSUKAGOSHI MIKIRO , KURATA SHUNICHI
IPC分类号： C12N15/09 , C12M3/00 , C12N1/00 , C12N5/10 , C12N13/00 , C12N15/87 , H01S3/00
摘要： Disclosed is a method and apparatus implanting living cells with a foreign substance with the aid of laser beams. According to this invention living cells are exposed to a laser microbeam of energy sufficient to modify a selected part of the cell to be temporarily transparent to a foreign substance. After the foreign substance gets in the host cell, the selected part of the cell recovers to the original state, thereby confining the foreign substance in the cell.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式