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    • 1. 发明专利
    • Semiconductor laser device
    • 半导体激光器件
    • JPS5976492A
    • 1984-05-01
    • JP17421283
    • 1983-09-22
    • Hitachi Ltd
    • TSUJI SHINJIMORI TAKAODOI KOUNENTAKEDA YUTAKAHIRAO MOTONAONAKAMURA MICHIHARU
    • H01L21/308H01S5/00H01S5/227
    • H01S5/227H01S5/2275
    • PURPOSE:To obtain a semiconductor laser device of easy working and excellent characteristics by a method wherein a surface layer which constitutes a semiconductor laser is composed of an InGaAsP layer whose composition is made specific, and mesa etching is performed with alcoholic solution of a halogen. CONSTITUTION:On an InP substrate 1 of one conductivity type, the first InP clad layer 2 serving as a light enclosed layer of the same conductivity as that layer, an In1-xGaxAsyP1-y(x=0.26, y=0.57) active layer 3, the second InP clad layer 2' serving as a light enclosed layer of a different conductivity type from that of the substrate 1, and the InGaAsP layer serving as the surface layer 4 are laminated and epitaxially grown in liquid phase. Where, the surface layer 4 is made of the In1-xGaxAsyP1-y (x=0.26, y=0.57). Thereafter, a mask 5 composed of an SiO2 film of a fixed pattern is provided on the surface layer 4, and the active layer 3 is changed into a stripe form by mesa etching to one half of the layer 2 with the alcoholic solution of the halogen. Thus, reverse mesa etching is made accurate, and the excellent characteristics are obtained.
    • 目的:通过其中构成半导体激光器的表面层由组成为特定的InGaAsP层构成并用卤素的醇溶液进行台面蚀刻的方法来获得容易工作的半导体激光器件和优异的特性。 构成:在一种导电类型的InP衬底1上,作为与该层相同导电性的光封闭层的第一InP覆盖层2,In1-xGaxAsyP1-y(x = 0.26,y = 0.57)有源层3 ,用作与基板1不同的导电类型的光封闭层的第二InP包覆层2'和用作表面层4的InGaAsP层被层压并以液相外延生长。 其中表面层4由In1-xGaxAsyP1-y(x = 0.26,y = 0.57)制成。 此后,在表面层4上设置由固定图案的SiO 2膜构成的掩模5,通过用卤素的醇溶液通过台面蚀刻将活性层3变成条形,形成层2的一半 。 因此,反面台面蚀刻被精确地获得,并且获得了优异的特性。
    • 4. 发明专利
    • Semiconductor laser element
    • 半导体激光元件
    • JPS59139692A
    • 1984-08-10
    • JP482784
    • 1984-01-17
    • Hitachi Ltd
    • FUKUZAWA TADASHIDOI KOUNENNAKAMURA MICHIHARU
    • H01S5/00H01S5/12H01S5/227
    • H01S5/227H01S5/12H01S5/2275
    • PURPOSE:To reduce the effects caused by the reflected light of a laser beam, and to eliminate mode distribution noises which are generated at the time of transmission by an optical fiber and noises which are generated in case a plural number of longitudinal modes exist by a method wherein a double hetero structure is buried-in with other different semiconductor material and a periodic roughness is formed on the interface of a semiconductor layer wherein the exudation of the laser beam exists. CONSTITUTION:On the (100) surface of an N type InP substrate 1 are grown an N type InP layer 2 (Te doping, impurity concentration 3X10 /cm ) in a depth of 1mum, an In0.73Ga0.27As0.63P0.27 layer 3 (undoping, impurity concentration 5X10 /cm ) in a depth of 0.1mum and a P type In0.78Ga0.22As0.5P0.5 4 (0.4mum) according to an liquid-phase eiptaxial growth method. The semiconductor layer 4 is needed the conditions that the refractive index thereof is slightly smaller than that of the laser active layer 3 and is larger than that of a clad layer. the semiconductor layer 4 is formed in such a way that light oscillated from a laser is exuded in the layer 4 and is propagated in a transversal fundamental mode. As a result, the breaking limit by light in the laser active layer is never exceeded and a large output is obtained. Besides, a diffraction grating is formed on the semiconductor layer. For this reason, distortion is not generated in the active layer, thereby enabling to prolong the lifetime of the laser.
    • 目的:为了减少激光束的反射光的影响,并消除在光纤传输时产生的模式分布噪声和在存在多个纵向模式的情况下产生的噪声 方法,其中双异质结构与其它不同的半导体材料埋入,并且在存在激光束的渗出的半导体层的界面上形成周期性的粗糙度。 构成:在N型InP衬底1的(100)表面上生长深度为1μm的N型InP层2(Te掺杂,杂质浓度3×10 18 / cm 3),In 0.73 Ga 0.5。 27As0.63P0.27层3(未掺杂,杂质浓度5×10 16 / cm 3),深度为0.1μm的P型In 0.78 Ga 0.2 As 0.5 P 0.5.5(0.4mum),根据液体 相位椭圆生长法。 需要半导体层4的折射率略小于激光活性层3的折射率,并且比包覆层的折射率大。 半导体层4的形成方式是使从激光器振荡的光分散在层4中,并且以横向基本模式传播。 结果,永久不会超过激光有源层中的光的破坏极限,并获得大的输出。 此外,在半导体层上形成衍射光栅。 因此,在有源层中不产生畸变,能够延长激光的寿命。