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    • 2. 发明授权
    • Photodiode structure augmented with active area photosensitive regions
    • 光电二极管结构增加了有源区光敏区
    • US5982011A
    • 1999-11-09
    • US977468
    • 1997-11-24
    • Alexander KalnitskyMarco Sabatini
    • Alexander KalnitskyMarco Sabatini
    • H01L27/144H01L27/14
    • H01L27/144
    • A photodiode structure augmented with active area photosensitive regions is used for detecting impinging radiation. The photodiode includes a semiconductor base layer doped with impurities of a first carrier type, a field oxide layer disposed upon the base layer with an opening formed therethrough, a plurality of auxiliary oxide layers wherein each is separately disposed upon the base layer, and a semiconductor diffusion layer doped with impurities of a second carrier type arranged upon the base layer and in contact with the oxide layers. When the photodiode is electrically energized, a plurality of integral photosensitive regions is created within the depletion region to facilitate the detection of impinging radiation at an increased quantum efficiency.
    • 增加了有源区光敏区域的光电二极管结构用于检测入射辐射。 光电二极管包括掺杂有第一载流子类型的杂质的半导体基底层,设置在其上形成有开口的基底层上的场氧化物层,其中分别设置在基底层上的多个辅助氧化物层,以及半导体 扩散层,掺杂有布置在基底层上并与氧化物层接触的第二载体类型的杂质。 当光电二极管被通电时,在耗尽区内产生多个整体感光区域,以便以增加的量子效率检测入射辐射。
    • 8. 发明申请
    • FLASH MEMORY ARRAY OF FLOATING GATE-BASED NON-VOLATILE MEMORY CELLS
    • 基于盖板的非易失性记忆体的闪存存储阵列
    • US20100149879A1
    • 2010-06-17
    • US12711520
    • 2010-02-24
    • Hosam HaggagAlexander KalnitskyEdgardo LaberPrabhjot SinghMichael D. Church
    • Hosam HaggagAlexander KalnitskyEdgardo LaberPrabhjot SinghMichael D. Church
    • G11C16/04
    • G11C16/0416
    • A flash memory array comprises a plurality of memory cells organized in a matrix of rows and columns. Each of the memory cells includes a floating gate memory transistor having a source region and a drain region, and a coupling capacitor electrically connected to the memory transistor. A plurality of word lines are each electrically connected to the capacitor in each of the memory cells in a respective row. A first set of bit lines are each electrically connected to the drain region of the memory transistor in each of the memory cells in a respective column. A plurality of high voltage access transistors are each electrically connected to a bit line in the first set of bit lines. A second set of bit lines are each electrically connected to the source region of the memory transistor in each of the memory cells in a respective column. Various combinations of voltages can be applied to the word lines and the first and second sets of bit lines in operations to erase, program, inhibit, or read the logic state stored by the memory transistor in one or more of the memory cells.
    • 闪存阵列包括以行和列的矩阵组织的多个存储单元。 每个存储单元包括具有源极区和漏极区的浮动栅极存储晶体管,以及电连接到存储晶体管的耦合电容。 多个字线各自电连接到相应行中的每个存储器单元中的电容器。 第一组位线分别电连接到相应列中的每个存储单元中的存储晶体管的漏极区。 多个高压存取晶体管分别电连接到第一组位线中的位线。 第二组位线分别电连接到相应列中的每个存储器单元中的存储晶体管的源极区域。 在操作中可以对字线和第一和第二组位线施加电压的各种组合,以擦除,编程,禁止或读取存储器晶体管存储在一个或多个存储器单元中的逻辑状态。
    • 9. 发明授权
    • Flash memory array of floating gate-based non-volatile memory cells
    • 基于浮动栅极的非易失性存储单元的闪存阵列
    • US07688627B2
    • 2010-03-30
    • US11861102
    • 2007-09-25
    • Hosam HaggagAlexander KalnitskyEdgardo LaberPrabhjot SinghMichael D. Church
    • Hosam HaggagAlexander KalnitskyEdgardo LaberPrabhjot SinghMichael D. Church
    • G11C14/00G11C16/04
    • G11C16/0416
    • A flash memory array comprises a plurality of memory cells organized in a matrix of rows and columns. Each of the memory cells includes a floating gate memory transistor having a source region and a drain region, and a coupling capacitor electrically connected to the memory transistor. A plurality of word lines are each electrically connected to the capacitor in each of the memory cells in a respective row. A first set of bit lines are each electrically connected to the drain region of the memory transistor in each of the memory cells in a respective column. A plurality of high voltage access transistors are each electrically connected to a bit line in the first set of bit lines. A second set of bit lines are each electrically connected to the source region of the memory transistor in each of the memory cells in a respective column. Various combinations of voltages can be applied to the word lines and the first and second sets of bit lines in operations to erase, program, inhibit, or read the logic state stored by the memory transistor in one or more of the memory cells.
    • 闪存阵列包括以行和列的矩阵组织的多个存储单元。 每个存储单元包括具有源极区和漏极区的浮动栅极存储晶体管,以及电连接到存储晶体管的耦合电容。 多个字线各自电连接到相应行中的每个存储器单元中的电容器。 第一组位线分别电连接到相应列中的每个存储单元中的存储晶体管的漏极区。 多个高压存取晶体管分别电连接到第一组位线中的位线。 第二组位线分别电连接到相应列中的每个存储器单元中的存储晶体管的源极区域。 在操作中可以对字线和第一和第二组位线施加电压的各种组合,以擦除,编程,禁止或读取存储器晶体管存储在一个或多个存储器单元中的逻辑状态。