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1. 发明授权

US08294089B2 Time of flight mass spectrometer and charged particle detector therefor 有权
标题翻译：飞行时间质谱仪和带电粒子检测器
公开(公告)号：US08294089B2
公开(公告)日：2012-10-23
申请号：US12407451
申请日：2009-03-19
申请人： Akio Suzuki , Etsuo Iizuka , Katsutoshi Nonaka , Masahiro Hayashi , Yuuya Washiyama
发明人： Akio Suzuki , Etsuo Iizuka , Katsutoshi Nonaka , Masahiro Hayashi , Yuuya Washiyama
IPC分类号： H01J49/40
CPC分类号： H01J49/025
摘要： In a charged particle detecting apparatus 100 for which an MCP is sandwiched with an IN electrode 1 and an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrode 1 are arranged further inside than the IN electrode 1 when viewed from an MCP incident surface, and the charged particle detecting apparatus 100 is fixed by screwing and the like to a cabinet wall surface 330 of a TOF-MS by using a flange portion provided at a part of IN electrode 1 projected further outside than the rear component members.
摘要翻译：在其中MCP被夹在IN电极1和OUT电极以及阳极电极和后盖之间的带电粒子检测装置100中，IN电极1的后部的部件被布置在从MCP入射表面观察IN电极1，并且带电粒子检测装置100通过使用设置在IN电极1的一部分的凸缘部分通过螺钉固定到TOF-MS的柜壁表面330 远远超过后部部件。

2. 发明授权

US07982172B2 Micro channel plate assembly 有权
标题翻译：微通道板组装
公开(公告)号：US07982172B2
公开(公告)日：2011-07-19
申请号：US12398770
申请日：2009-03-05
申请人： Akio Suzuki , Etsuo Iizuka , Katsutoshi Nonaka , Masahiro Hayashi , Yuuya Washiyama
发明人： Akio Suzuki , Etsuo Iizuka , Katsutoshi Nonaka , Masahiro Hayashi , Yuuya Washiyama
IPC分类号： H01J40/14 , H01J43/00
CPC分类号： H01J43/246
摘要： In an MCP assembly 10 having one or a plurality of MCPs 5, 6 sandwiched with an input-side electrode 4 and an output-side electrode 7, there provided at the surface facing the MCP 5, 6 of at least either (preferably, both) of the input-side electrode 4 and the output-side electrode 7, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.
摘要翻译：在具有被输入侧电极4和输出侧电极7夹持的一个或多个MCP5,6的MCP组件10中，在面向MCP5,6的表面处设置有至少两者（优选地，两者都是输入侧电极4和输出侧电极7之间的接触面是与MCP表面接触以固定的大致环形的接触面，并且设置在接触面的周围的是沿方向缩回的分离面与MCP表面分离。因此，提供了具有能够防止在制造和处理中损坏MCP的结构的MCP组件。

3. 发明授权

US07655891B2 Charged-particle detecting apparatus 有权
标题翻译：带电粒子检测装置
公开(公告)号：US07655891B2
公开(公告)日：2010-02-02
申请号：US11723951
申请日：2007-03-22
申请人： Akio Suzuki , Masahiro Hayashi , Katsutoshi Nonaka , Yuuya Washiyama
发明人： Akio Suzuki , Masahiro Hayashi , Katsutoshi Nonaka , Yuuya Washiyama
IPC分类号： H01J49/06 , G01T1/28 , G01T1/29 , H01J43/24
CPC分类号： H01J49/025
摘要： The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor. In particular, the first electrode is arranged so as to become a part of the outer surface of the charged-particle detecting apparatus, and components positioned between the first electrode and the rear cover have contours with section sizes equal to or smaller than that of the contour of the first electrode when viewed from the first electrode side toward the rear cover.
摘要翻译：本发明涉及具有能够调整电位分布的结构的带电粒子检测装置，以便不依赖于施加电压的状态的变化来稳定地保持带电粒子的飞行轨迹。带电粒子检测装置包括第一电极，MCP，第二电极，用作阳极的第三电极和沿着预定参考轴依次排列的后盖。第三电极相对于第二电极布置在MCP的相对侧上，并且经由电容器电连接到输出信号部分。特别地，第一电极被布置成成为带电粒子检测装置的外表面的一部分，并且位于第一电极和后盖之间的部件具有等于或小于当从第一电极侧朝向后盖观察时，第一电极的轮廓。

4. 发明申请

US20080230686A1 Charged-particle detecting apparatus 有权
标题翻译：带电粒子检测装置
公开(公告)号：US20080230686A1
公开(公告)日：2008-09-25
申请号：US11723951
申请日：2007-03-22
申请人： Akio Suzuki , Masahiro Hayashi , Katsutoshi Nonaka , Yuuya Washiyama
发明人： Akio Suzuki , Masahiro Hayashi , Katsutoshi Nonaka , Yuuya Washiyama
IPC分类号： H01J49/02
CPC分类号： H01J49/025
摘要： The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor. In particular, the first electrode is arranged so as to become a part of the outer surface of the charged-particle detecting apparatus, and components positioned between the first electrode and the rear cover have contours with section sizes equal to or smaller than that of the contour of the first electrode when viewed from the first electrode side toward the rear cover.
摘要翻译：本发明涉及具有能够调整电位分布的结构的带电粒子检测装置，以便不依赖于施加电压的状态的变化来稳定地保持带电粒子的飞行轨迹。带电粒子检测装置包括第一电极，MCP，第二电极，用作阳极的第三电极和沿着预定参考轴依次排列的后盖。第三电极相对于第二电极布置在MCP的相对侧上，并且经由电容器电连接到输出信号部分。特别地，第一电极被布置成成为带电粒子检测装置的外表面的一部分，并且位于第一电极和后盖之间的部件具有等于或小于当从第一电极侧朝向后盖观察时，第一电极的轮廓。

5. 发明授权

US07564043B2 MCP unit, MCP detector and time of flight mass spectrometer 有权
标题翻译： MCP单元，MCP检测器和飞行时间质谱仪
公开(公告)号：US07564043B2
公开(公告)日：2009-07-21
申请号：US11802771
申请日：2007-05-24
申请人： Masahiro Hayashi , Yuuya Washiyama , Akio Suzuki , Masahiko Iguchi
发明人： Masahiro Hayashi , Yuuya Washiyama , Akio Suzuki , Masahiko Iguchi
IPC分类号： H01J37/252
CPC分类号： H01J43/246 , H01J49/025
摘要： The present invention relates to an MCP unit or the like having a structure intended to achieve a desired time response characteristic, without depending on a limitation imposed by a channel diameter of MCP. The MCP unit comprises the MCP for releasing secondary electrons internally multiplied in response to incidence of charged particles, an anode arranged in a position where the secondary electrons reach, and an acceleration electrode arranged between the MCP and the anode. In particular, the acceleration electrode includes a plurality of openings which permit passing of the secondary electrons migrating from the MCP toward the anode. Further, the acceleration electrode is arranged such that the shortest distance B between the acceleration electrode and the anode is longer than the shortest distance A between the MCP and the acceleration electrode. Thus, an FWHM of a detected peak appearing in response to the incidence of the charged particles is remarkably shortened.
摘要翻译：本发明涉及具有旨在实现所需时间响应特性的结构的MCP单元等，而不依赖于MCP的通道直径所施加的限制。 MCP单元包括MCP，用于响应于带电粒子的入射而布置二次电子的内部倍增的电子，设置在二次电子到达的位置的阳极以及布置在MCP和阳极之间的加速电极。特别地，加速电极包括允许二次电子从MCP向阳极迁移的多个开口。此外，加速电极被布置成使得加速电极和阳极之间的最短距离B比MCP和加速电极之间的最短距离A长。因此，响应于带电粒子的入射出现的检测峰的FWHM显着缩短。

6. 发明申请

US20080290267A1 MCP unit, MCP detector and time of flight mass spectrometer 有权
标题翻译： MCP单元，MCP检测器和飞行时间质谱仪
公开(公告)号：US20080290267A1
公开(公告)日：2008-11-27
申请号：US11802771
申请日：2007-05-24
申请人： Masahiro Hayashi , Yuuya Washiyama , Akio Suzuki , Masahiko Iguchi
发明人： Masahiro Hayashi , Yuuya Washiyama , Akio Suzuki , Masahiko Iguchi
IPC分类号： H01J43/02 , H01J49/40
CPC分类号： H01J43/246 , H01J49/025
摘要： The present invention relates to an MCP unit or the like having a structure intended to achieve a desired time response characteristic, without depending on a limitation imposed by a channel diameter of MCP. The MCP unit comprises the MCP for releasing secondary electrons internally multiplied in response to incidence of charged particles, an anode arranged in a position where the secondary electrons reach, and an acceleration electrode arranged between the MCP and the anode. In particular, the acceleration electrode includes a plurality of openings which permit passing of the secondary electrons migrating from the MCP toward the anode. Further, the acceleration electrode is arranged such that the shortest distance B between the acceleration electrode and the anode is longer than the shortest distance A between the MCP and the acceleration electrode. Thus, an FWHM of a detected peak appearing in response to the incidence of the charged particles is remarkably shortened.
摘要翻译：本发明涉及具有旨在实现所需时间响应特性的结构的MCP单元等，而不依赖于MCP的通道直径所施加的限制。 MCP单元包括MCP，用于响应于带电粒子的入射而布置二次电子的内部倍增的电子，设置在二次电子到达的位置的阳极以及布置在MCP和阳极之间的加速电极。特别地，加速电极包括允许二次电子从MCP向阳极迁移的多个开口。此外，加速电极被布置成使得加速电极和阳极之间的最短距离B比MCP和加速电极之间的最短距离A长。因此，响应于带电粒子的入射出现的检测峰的FWHM显着缩短。

7. 发明申请

US20100243887A1 MASS SPECTROMETER 有权
标题翻译：质谱仪
公开(公告)号：US20100243887A1
公开(公告)日：2010-09-30
申请号：US12730475
申请日：2010-03-24
申请人： Motohiro SUYAMA , Etsuo Iizuka , Akio Suzuki , Hiroshi Kobayashi
发明人： Motohiro SUYAMA , Etsuo Iizuka , Akio Suzuki , Hiroshi Kobayashi
IPC分类号： H01J49/40 , H01J49/24 , H01J49/08
CPC分类号： H01J49/40 , H01J49/025
摘要： A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.
摘要翻译：提供了一种允许容易地更换MCP（微通道板）并且能够以高精度确保MCP的入射表面和离子轨道之间的正交性的质谱仪。离子飞行的飞行管2布置在由真空法兰6和主体1组成的真空容器中，并且MCP组4经由MCP-IN电极3附接到飞行管2的尾端。真空凸缘6可附接和可拆卸地附接到主体1，并且MCP组4通过设置在连接到真空凸缘6上的用于检测的电路板7上的弹簧710朝向飞行管2的端部被推动，使得其相对于离子飞行轨道的正交性得到保证。

8. 发明授权

US08357892B2 Mass spectrometer 有权
标题翻译：质谱仪
公开(公告)号：US08357892B2
公开(公告)日：2013-01-22
申请号：US12730475
申请日：2010-03-24
申请人： Motohiro Suyama , Etsuo Iizuka , Akio Suzuki , Hiroshi Kobayashi
发明人： Motohiro Suyama , Etsuo Iizuka , Akio Suzuki , Hiroshi Kobayashi
IPC分类号： H01J49/40
CPC分类号： H01J49/40 , H01J49/025
摘要： A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.
摘要翻译：提供了一种允许容易地更换MCP（微通道板）并且能够以高精度确保MCP的入射表面和离子轨道之间的正交性的质谱仪。离子飞行的飞行管2布置在由真空法兰6和主体1组成的真空容器中，并且MCP组4经由MCP-IN电极3附接到飞行管2的尾端。真空凸缘6可附接和可拆卸地附接到主体1，并且MCP组4通过设置在连接到真空凸缘6上的用于检测的电路板7上的弹簧710朝向飞行管2的端部被推动，使得其相对于离子飞行轨道的正交性得到保证。

9. 发明授权

US08508110B2 Micro channel plate 有权
标题翻译：微通道板
公开(公告)号：US08508110B2
公开(公告)日：2013-08-13
申请号：US12835924
申请日：2010-07-14
申请人： Akio Suzuki , Etsuo Iizuka , Toshiyuki Uchiyama , Motohiro Suyama
发明人： Akio Suzuki , Etsuo Iizuka , Toshiyuki Uchiyama , Motohiro Suyama
IPC分类号： H01J43/04 , H01J43/06
CPC分类号： H01J43/246
摘要： An MCP has a rectangular plate shape and has a porous part, to which a plurality of pores (channels) penetrating in the thickness direction are disposed, and a poreless part including a solid glass or the like to which the channels are not provided on the both sides of the porous part. Then, on both surfaces of the MCP, an input side electrode and an output side electrode are respectively formed so as to cover the poreless parts on the both surfaces while sandwiching the porous part.
摘要翻译： MCP具有矩形板形状，并且具有多孔部分，多个孔（厚度方向上贯穿的孔）设置在该多孔部分上，以及包括固体玻璃等的无孔部分，其中不形成通道双面多孔部分。然后，在MCP的两个表面上分别形成输入侧电极和输出侧电极，以便在夹持多孔部分的同时覆盖两个表面上的无孔部分。

10. 发明授权

US08022606B2 Electron multipler and electron detector 有权
标题翻译：电子倍增器和电子探测器
公开(公告)号：US08022606B2
公开(公告)日：2011-09-20
申请号：US12715570
申请日：2010-03-02
申请人： Akio Suzuki , Etsuo Iizuka , Akihiro Kageyama , Motohiro Suyama
发明人： Akio Suzuki , Etsuo Iizuka , Akihiro Kageyama , Motohiro Suyama
IPC分类号： H01J43/06
CPC分类号： H01J43/246
摘要： An electron multiplier that can easily obtain characteristics according to a purpose is provided. By bonding a marginal portion 23 of an MCP 2 and a marginal portion 33 of an MCP 3 to each other via a conductive spacer layer 7, a gap 12 is formed between channel portions 22, 32. Therefore, when the electron multiplier is used for a purpose that requires a particularly high gain, by adjusting the thickness of the spacer layer 7, the gain can be increased by increasing the gap 12. In addition, when the electron multiplier is used for a purpose that requires an increase in gain as well as time characteristics, by adjusting the thickness of the spacer layer 7, the size of the gap 12 can be adjusted so that desired characteristics are obtained. Consequently, by only adjusting the thickness of the spacer layer 7, characteristics according to the purpose can be easily obtained.
摘要翻译：提供了可以容易地根据目的获得特性的电子倍增器。通过经由导电间隔层7将MCP2的边缘部分23和MCP 3的边缘部分33彼此结合，在通道部分22,32之间形成间隙12.因此，当电子倍增器用于通过调整间隔层7的厚度，需要特别高的增益的目的可以通过增加间隙12来增加增益。此外，当电子倍增器用于增加增益的目的时作为时间特性，通过调整间隔层7的厚度，可以调节间隙12的尺寸，从而获得期望的特性。因此，通过仅调整间隔层7的厚度，可以容易地获得根据目的的特性。

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