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    • 4. 发明申请
    • Charged-particle detecting apparatus
    • 带电粒子检测装置
    • US20080230686A1
    • 2008-09-25
    • US11723951
    • 2007-03-22
    • Akio SuzukiMasahiro HayashiKatsutoshi NonakaYuuya Washiyama
    • Akio SuzukiMasahiro HayashiKatsutoshi NonakaYuuya Washiyama
    • H01J49/02
    • H01J49/025
    • The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor. In particular, the first electrode is arranged so as to become a part of the outer surface of the charged-particle detecting apparatus, and components positioned between the first electrode and the rear cover have contours with section sizes equal to or smaller than that of the contour of the first electrode when viewed from the first electrode side toward the rear cover.
    • 本发明涉及具有能够调整电位分布的结构的带电粒子检测装置,以便不依赖于施加电压的状态的变化来稳定地保持带电粒子的飞行轨迹。 带电粒子检测装置包括第一电极,MCP,第二电极,用作阳极的第三电极和沿着预定参考轴依次排列的后盖。 第三电极相对于第二电极布置在MCP的相对侧上,并且经由电容器电连接到输出信号部分。 特别地,第一电极被布置成成为带电粒子检测装置的外表面的一部分,并且位于第一电极和后盖之间的部件具有等于或小于 当从第一电极侧朝向后盖观察时,第一电极的轮廓。
    • 5. 发明授权
    • Charged-particle detecting apparatus
    • 带电粒子检测装置
    • US07655891B2
    • 2010-02-02
    • US11723951
    • 2007-03-22
    • Akio SuzukiMasahiro HayashiKatsutoshi NonakaYuuya Washiyama
    • Akio SuzukiMasahiro HayashiKatsutoshi NonakaYuuya Washiyama
    • H01J49/06G01T1/28G01T1/29H01J43/24
    • H01J49/025
    • The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor. In particular, the first electrode is arranged so as to become a part of the outer surface of the charged-particle detecting apparatus, and components positioned between the first electrode and the rear cover have contours with section sizes equal to or smaller than that of the contour of the first electrode when viewed from the first electrode side toward the rear cover.
    • 本发明涉及具有能够调整电位分布的结构的带电粒子检测装置,以便不依赖于施加电压的状态的变化来稳定地保持带电粒子的飞行轨迹。 带电粒子检测装置包括第一电极,MCP,第二电极,用作阳极的第三电极和沿着预定参考轴依次排列的后盖。 第三电极相对于第二电极布置在MCP的相对侧上,并且经由电容器电连接到输出信号部分。 特别地,第一电极被布置成成为带电粒子检测装置的外表面的一部分,并且位于第一电极和后盖之间的部件具有等于或小于 当从第一电极侧朝向后盖观察时,第一电极的轮廓。
    • 6. 发明授权
    • Curved surface shape inspection method, fiber optical block, and curved surface shape inspection device
    • 弯曲表面形状检查方法,光纤光学块和曲面形状检测装置
    • US07679734B2
    • 2010-03-16
    • US10586327
    • 2004-12-27
    • Katsutoshi NonakaTakeo Sugawara
    • Katsutoshi NonakaTakeo Sugawara
    • G01N21/00G02B6/04
    • G01B5/213
    • In a fiber optic block 10 formed by bundling and integrating a plurality of optical fibers 11 each composed of a core region 12 and a clad region 13, an at least partially curved input end face 14 composed of one end of each optical fiber and a measurement surface having a curved surface shape of a to-be-measured object are pressed against each other. Then, an optical image formed by bringing the input end face into contact with the measurement surface and output from an output end face 15 of the fiber optic block is used to inspect the curved surface shape of the to-be-measured object. This allows a curved surface shape inspection method capable of inspecting the shape of a curved surface easily, a fiber optic block, and a curved surface shape inspection apparatus to be achieved.
    • 在通过将由芯区域12和包层区域13构成的多个光纤11捆扎并整合而形成的光纤块10中,由各光纤的一端构成的至少部分弯曲的输入端面14和测量 具有被测量物体的弯曲表面形状的表面彼此挤压。 然后,使用通过使输入端面与测量表面接触并从光纤块的输出端面15输出而形成的光学图像来检查被测量物体的曲面形状。 这允许能够容易地检查弯曲表面的形状的曲面形状检查方法,光纤块和曲面形状检查装置。
    • 7. 发明授权
    • Scintillator panel, radiation image sensor, and method of making scintillator panel
    • 闪烁面板,辐射图像传感器,以及制作闪烁体面板的方法
    • US06635877B2
    • 2003-10-21
    • US09929490
    • 2001-08-15
    • Yutaka KusuyamaKatsutoshi Nonaka
    • Yutaka KusuyamaKatsutoshi Nonaka
    • G01T120
    • G01T1/2002G01T1/2018
    • A radiation image sensor 10 comprises two optical members 12, 14; a scintillator 18 deposited on entrance end faces 12a, 14a of the optical members 12, 14; a plurality of light-guiding optical components 22; and a plurality of CCDs 20. Each of the optical members 12, 14 is an optical member in which several millions/cm2 of optical fibers are disposed parallel to each other and integrally molded, whereas the optical fibers have an axis forming an acute angle with the entrance end face 12a, 14a. The two optical members 12, 14 are arranged such that the optical fibers respectively constituting each of the optical members 12, 14 have a gap therebetween widening from the entrance end face 12a, 14a side to the exit end face 12b, 14b side. Respective side faces 12c, 14c of optical members 12, 14 are formed with ground surfaces 12d, 14d in which the respective side faces 12c, 14c of optical members 12, 14 are ground against each other.
    • 辐射图像传感器10包括两个光学构件12,14; 沉积在光学部件12,14的入射端面12a,14a上的闪烁体18; 多个导光光学部件22; 以及多个CCD 20.光学构件12,14中的每一个是光学构件,其中数百万平方厘米的光纤彼此平行地设置并整体模制,而光纤具有形成 与入射端面12a,14a成锐角。 两个光学部件12,14被布置成使得分别构成每个光学部件12,14的光纤之间具有从入射端面12a,14a侧到出射端面12b,14b侧之间的间隙。 光学构件12,14的各个侧面12c,14c形成有接地表面12d,14d,其中光学构件12,14的相应侧面12c,14c彼此磨合。
    • 9. 发明授权
    • Method for preparing conjugated diene polymer
    • 共轭二烯聚合物的制备方法
    • US6130299A
    • 2000-10-10
    • US974922
    • 1997-11-20
    • Takuo SoneAkio TakashimaKatsutoshi NonakaIwakazu Hattori
    • Takuo SoneAkio TakashimaKatsutoshi NonakaIwakazu Hattori
    • C08F2/34C08F2/44C08F4/54C08F36/04C08F4/52
    • C08F36/04
    • A method for preparing a conjugated diene polymer characterized by polymerizing a conjugated diene in vapor phase in the presence of an inorganic filler used as a rubber reinforcement agent and a catalyst which comprises (a) a compound containing a rare earth element of an atomic number of from 57 to 71 in the Periodic Table or a compound obtained by the reaction of this rare earth element-containing compound and a Lewis base, (b) an organic aluminum compound of the formula AlR.sup.1 R.sup.2 R.sup.3 or an almoxane, and (c) a halogen-containing compound. The vapor phase polymerization ensures easy control of the molecular weight of the polymer better dispersion of a rubber enforcement agent, and provides a rubber composition with improved rupture characteristics and abrasion resistance.
    • 一种制备共轭二烯聚合物的方法,其特征在于在用作橡胶增强剂的无机填料和催化剂存在下,气相中共轭二烯的聚合,所述催化剂包含(a)含有原子序数的稀土元素的化合物 周期表中的57至71或通过该含稀土元素的化合物与路易斯碱的反应获得的化合物,(b)式AlR 1 R 2 R 3的有机铝化合物或阿莫氧烷,和(c) 含有化合物。 气相聚合确保了聚合物的分子量更容易控制橡胶强化剂的分散性,并提供了具有改进的断裂特性和耐磨性的橡胶组合物。
    • 10. 发明申请
    • Curved Surface Shape Inspection Method, Fiber Optical Block, and Curved Surface Shape Inspection Device
    • 弯曲表面形状检查方法,光纤光学块和曲面形状检测装置
    • US20070216911A1
    • 2007-09-20
    • US10586327
    • 2004-12-27
    • Katsutoshi NonakaTakeo Sugawara
    • Katsutoshi NonakaTakeo Sugawara
    • G01B11/24
    • G01B5/213
    • In a fiber optic block 10 formed by bundling and integrating a plurality of optical fibers 11 each composed of a core region 12 and a clad region 13, an at least partially curved input end face 14 composed of one end of each optical fiber and a measurement surface having a curved surface shape of a to-be-measured object are pressed against each other. Then, an optical image formed by bringing the input end face into contact with the measurement surface and output from an output end face 15 of the fiber optic block is used to inspect the curved surface shape of the to-be-measured object. This allows a curved surface shape inspection method capable of inspecting the shape of a curved surface easily, a fiber optic block, and a curved surface shape inspection apparatus to be achieved.
    • 在通过将由芯区域12和包层区域13构成的多个光纤11捆扎并整合而形成的光纤块10中,由各光纤的一端构成的至少部分弯曲的输入端面14和测量 具有被测量物体的弯曲表面形状的表面彼此挤压。 然后,使用通过使输入端面与测量表面接触并从光纤块的输出端面15输出而形成的光学图像来检查被测量物体的弯曲表面形状。 这允许能够容易地检查弯曲表面的形状的曲面形状检查方法,光纤块和曲面形状检查装置。