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    • 2. 发明授权
    • Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture
    • 非扩散结分离栅极非易失性存储器单元和阵列,其编程,擦除和读取方法以及制造方法
    • US07723774B2
    • 2010-05-25
    • US11775851
    • 2007-07-10
    • Changyuan ChenYa-Fen LinDana Lee
    • Changyuan ChenYa-Fen LinDana Lee
    • H01L29/788
    • G11C16/0458G11C16/10H01L27/115H01L27/11521H01L29/42328H01L29/42336H01L29/7887
    • Nonvolatile flash memory systems and methods are disclosed having a semiconductor substrate of a first conductivity type, including non-diffused channel regions through which electron flow is induced by application of voltage to associated gate elements. A plurality of floating gates are spaced apart from one another and each insulated from the channel region. A plurality of control gates are spaced apart from one another and insulated from the channel region, with each control gate being located between a first floating gate and a second floating gate and capacitively coupled thereto to form a subcell. A plurality of spaced-apart assist gates are insulated from the channel region, with each assist gate being located between and insulated from adjacent subcells. The channel is formed of three regions, two beneath adjacent control gate elements as well as a third region between the first two and beneath an associated assist gate.
    • 公开了非挥发性闪速存储器系统和方法,其具有第一导电类型的半导体衬底,包括非扩散沟道区,通过向相关联的栅极元件施加电压而引起电子流。 多个浮动栅极彼此间隔开并且与沟道区域绝缘。 多个控制栅极彼此间隔开并且与沟道区域绝缘,每个控制栅极位于第一浮动栅极和第二浮动栅极之间,并电容耦合到其上以形成子电池。 多个间隔开的辅助栅极与沟道区域绝缘,每个辅助栅极位于相邻子电池之间并且与相邻的子电池绝缘。 通道由三个区域组成,两个位于相邻的控制栅极元件下方,以及位于相关联的辅助栅极之间的第一个两个和第二区域之间。
    • 3. 发明申请
    • Wireless communication device having a telephone number-limited back calling function
    • 具有电话号码限制回呼功能的无线通信装置
    • US20060166661A1
    • 2006-07-27
    • US11041965
    • 2005-01-26
    • Ya-Fen Lin
    • Ya-Fen Lin
    • H04M3/00
    • H04M1/67H04M1/677
    • A wireless communication device having a number-limited back calling function is disclosed, comprising a receiving module receiving a telephone number corresponding to an in-coming call, a memory storing at least a limited telephone number, a comparison module comparing if the telephone number of the in-coming call is the same as the limited telephone number stored in the memory, a limiting module limiting a back call from being sent to a communication device corresponding to the in-coming call with the limited telephone number if the comparison result is true, and a back calling interface calling back to the telephone number corresponding to the in-coming call if the comparison result is different.
    • 公开了一种具有数量有限的返回呼叫功能的无线通信装置,包括:接收模块,其接收与进入呼叫相对应的电话号码;至少存储有限电话号码的存储器;比较模块, 来电呼叫与存储在存储器中的有限电话号码相同,如果比较结果为真,则限制模块将拒绝呼叫限制为与具有有限电话号码的呼入呼叫相对应的通信设备 如果比较结果不同,则返回呼叫接口回呼对应于来电呼叫的电话号码。
    • 4. 发明授权
    • Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture
    • 非扩散结分离栅极非易失性存储器单元和阵列,其编程,擦除和读取方法以及制造方法
    • US08164135B2
    • 2012-04-24
    • US12773811
    • 2010-05-04
    • Changyuan ChenYa-Fen LinDana Lee
    • Changyuan ChenYa-Fen LinDana Lee
    • H01L29/788
    • G11C16/0458G11C16/10H01L27/115H01L27/11521H01L29/42328H01L29/42336H01L29/7887
    • Nonvolatile flash memory systems and methods are disclosed having a semiconductor substrate of a first conductivity type, including non-diffused channel regions through which electron flow is induced by application of voltage to associated gate elements. A plurality of floating gates are spaced apart from one another and each insulated from the channel region. A plurality of control gates are spaced apart from one another and insulated from the channel region, with each control gate being located between a first floating gate and a second floating gate and capacitively coupled thereto to form a subcell. A plurality of spaced-apart assist gates are insulated from the channel region, with each assist gate being located between and insulated from adjacent subcells. The channel is formed of three regions, two beneath adjacent control gate elements as well as a third region between the first two and beneath an associated assist gate.
    • 公开了非挥发性闪速存储器系统和方法,其具有第一导电类型的半导体衬底,包括非扩散沟道区,通过向相关联的栅极元件施加电压而引起电子流。 多个浮动栅极彼此间隔开并且与沟道区域绝缘。 多个控制栅极彼此间隔开并且与沟道区域绝缘,每个控制栅极位于第一浮动栅极和第二浮动栅极之间,并电容耦合到其上以形成子电池。 多个间隔开的辅助栅极与沟道区域绝缘,每个辅助栅极位于相邻子电池之间并且与相邻的子电池绝缘。 通道由三个区域组成,两个位于相邻的控制栅极元件下方,以及位于相关联的辅助栅极之间的第一个两个和第二区域之间。
    • 5. 发明授权
    • Partial local self-boosting of a memory cell channel
    • 部分局部自增强的存储单元通道
    • US07848146B2
    • 2010-12-07
    • US12407228
    • 2009-03-19
    • Youseok SuhYa-Fen LinColing Stewart BillTakao AkaogiYi-Ching Wu
    • Youseok SuhYa-Fen LinColing Stewart BillTakao AkaogiYi-Ching Wu
    • G11C16/04
    • G11C16/10G11C16/0483
    • A method for partial local self-boosting of a memory cell channel is disclosed. As a part of memory cell channel partial local self-boosting, an isolating memory cell located on a source side of a program inhibited memory cell is turned off and a gating memory cell located on a drain side of the program inhibited memory cell is used to pass a pre-charge voltage to the program inhibited memory cell to provide a pre-charge voltage to a channel of the program inhibited memory cell. Moreover, a pre-charge voltage is passed to a buffering memory cell located on the source side of the program inhibited memory cell to provide a pre-charge voltage to a channel of the buffering memory cell and the gating memory cell that is located on the drain side of the program inhibited memory cell is turned off. During programming, a program voltage is applied to the gate of the program inhibited memory cell where a channel voltage of the program inhibited memory cell is raised above a level raised by the pre-charge voltage.
    • 公开了一种用于存储器单元通道的局部局部自升压的方法。 作为存储单元通道部分局部自升压的一部分,位于程序禁止存储单元的源极侧的隔离存储单元被截止,并且位于程序禁止存储单元的漏极侧的门控存储单元被用于 将预充电电压传递到程序禁止的存储单元,以向编程禁止的存储单元的通道提供预充电电压。 此外,预充电电压被传递到位于程序禁止的存储单元的源极侧的缓冲存储单元,以向缓冲存储单元的通道和位于该存储单元上的选通存储单元提供预充电电压 程序的漏极侧禁止存储单元关闭。 在编程期间,将程序禁止存储单元的通道电压升高到由预充电电压升高的电平以上的程序禁止存储单元的栅极上施加编程电压。
    • 10. 发明申请
    • Word line voltage boosting circuit and a memory array incorporating same
    • US20070076489A1
    • 2007-04-05
    • US11241582
    • 2005-09-30
    • Ya-Fen LinElbert LinHieu TranJack FrayerBomy Chen
    • Ya-Fen LinElbert LinHieu TranJack FrayerBomy Chen
    • G11C11/34
    • G11C8/08G11C16/08
    • A first embodiment of a word line voltage boosting circuit for use with an array of non-volatile memory cells has a capacitor, having two ends, connected to the word line. One end of the capacitor is electrically connected to the word line. The other end of the capacitor is electrically connected to a first voltage source. The word line is also connected through a switch to a second source voltage source. A sequencing circuit activates the switch such that the word line is connected to the second voltage source, and the other end of the capacitor is not connected to the first voltage source. Then the sequencing circuit causes the switch to disconnect the word line from the second voltage source, and connect the second end of the capacitor to the first voltage source. The alternate switching of the connection boosts the voltage on the word line. In a second embodiment, a first word line is electrically connected to a first switch to a first voltage source. An adjacent word line, capacitively coupled to the first word line, is electrically connected to a second switch to a second voltage source. A sequencing circuit activates the first switch and the second switch such that the first word line is connected to the first voltage source, and the second word line is disconnected from the second voltage source. Then the sequencing circuit causes the first switch to disconnect the first word line from the first voltage source, and causes the second word line to be electrically connected to the second voltage source. The alternate switching of the connection boosts the voltage on the first word line, caused by its capacitive coupling to the second word line. A boosted voltage on the word line may be used to improve cycling and yield, where the memory cells of the array are of the floating gate type and erase through the mechanism of Fowler-Nordheim tunneling from the floating gate to a control gate which is connected to the word line.