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    • 2. 发明申请
    • DETERMINING PLASMA PROCESSING SYSTEM READINESS WITHOUT GENERATING PLASMA
    • 在不产生等离子体的情况下确定等离子体处理系统的准备情况
    • WO2011008376A3
    • 2011-03-10
    • PCT/US2010037936
    • 2010-06-09
    • LAM RES CORPCHOI BRIANYUN GUNSUVENUGOPAL VIJAYAKUMAR CWILLIAMS NORMAN
    • CHOI BRIANYUN GUNSUVENUGOPAL VIJAYAKUMAR CWILLIAMS NORMAN
    • H01L21/66H01L21/00H01L21/02
    • H01J37/32935
    • A test system for facilitating determining whether a plasma processing system (which includes a plasma processing chamber) is ready for processing wafers. The test system may include a computer-readable medium storing at least a test program. The test program may include code for receiving electric parameter values derived from signals detected by at least one sensor when no plasma is present in the plasma processing chamber. The test program may also include code for generating electric model parameter values using the electric parameter values and a mathematical model. The test program may also include code for comparing the electric model parameter values with baseline model parameter value information. The test program may also include code for determining readiness of the plasma processing system based on the comparison. The test system may also include circuit hardware for performing one or more tasks associated with the test program.
    • 一种便于确定等离子体处理系统(包括等离子体处理室)是否准备好处理晶片的测试系统。 测试系统可以包括存储至少一个测试程序的计算机可读介质。 测试程序可以包括用于当在等离子体处理室中不存在等离子体时接收由至少一个传感器检测到的信号导出的电参数值的代码。 测试程序还可以包括用于使用电参数值和数学模型来生成电模型参数值的代码。 测试程序还可以包括用于将电模型参数值与基线模型参数值信息进行比较的代码。 测试程序还可以包括用于基于比较确定等离子体处理系统的准备状态的代码。 测试系统还可以包括用于执行与测试程序相关联的一个或多个任务的电路硬件。
    • 5. 发明申请
    • DETERMINING PLASMA PROCESSING SYSTEM READINESS WITHOUT GENERATING PLASMA
    • 确定等离子体处理系统无需生成等离子体
    • WO2011008376A2
    • 2011-01-20
    • PCT/US2010/037936
    • 2010-06-09
    • LAM RESEARCH CORPORATIONCHOI, BrianYUN, GunsuVENUGOPAL, Vijayakumar C.WILLIAMS, Norman
    • CHOI, BrianYUN, GunsuVENUGOPAL, Vijayakumar C.WILLIAMS, Norman
    • H01L21/66H01L21/02H01L21/00
    • H01J37/32935
    • A test system for facilitating determining whether a plasma processing system (which includes a plasma processing chamber) is ready for processing wafers. The test system may include a computer-readable medium storing at least a test program. The test program may include code for receiving electric parameter values derived from signals detected by at least one sensor when no plasma is present in the plasma processing chamber. The test program may also include code for generating electric model parameter values using the electric parameter values and a mathematical model. The test program may also include code for comparing the electric model parameter values with baseline model parameter value information. The test program may also include code for determining readiness of the plasma processing system based on the comparison. The test system may also include circuit hardware for performing one or more tasks associated with the test program.
    • 用于有助于确定等离子体处理系统(其包括等离子体处理室)是否准备好用于处理晶片的测试系统。 测试系统可以包括至少存储测试程序的计算机可读介质。 测试程序可以包括用于接收由等离子体处理室中没有等离子体时由至少一个传感器检测的信号导出的电参数值的代码。 测试程序还可以包括使用电参数值和数学模型产生电模型参数值的代码。 测试程序还可以包括用于将电模型参数值与基准模型参数值信息进行比较的代码。 测试程序还可以包括用于基于比较来确定等离子体处理系统的准备状态的代码。 测试系统还可以包括用于执行与测试程序相关联的一个或多个任务的电路硬件。
    • 8. 发明申请
    • METHOD AND APPARATUS FOR FORMING STOMA TREPHINES AND ANASTOMOSES
    • 用于形成STOMA TREPHINES和ANASTOMOSES的方法和装置
    • WO2012032302A1
    • 2012-03-15
    • PCT/GB2011001326
    • 2011-09-09
    • QUEEN MARY & WESTFILED COLLEGEFRANKENMAN INTERNAT LTDWILLIAMS NORMAN STANLEYWENG ZHIQIANG
    • WILLIAMS NORMAN STANLEYWENG ZHIQIANG
    • A61B17/115A61B17/00A61B17/072A61B19/00
    • A61B17/115A61B17/02A61B17/07292A61B17/1155A61B2017/0023A61B2017/00818A61B2017/0287A61B2017/1142A61B2090/0808A61B2090/0811
    • The present invention relates to a stapler apparatus, comprising a stapler having a proximal end, a distal end and a longitudinal axis, the stapler further comprising a trigger, an anvil docking pin aligned substantially parallel with the longitudinal axis of the stapler, and a stapling means, the anvil docking pin and stapling means being at the distal end of the stapler, and a detachable anvil, comprising an anvil head and an anvil shaft, wherein the anvil shaft is adapted to receive the anvil docking pin and operation of the trigger causes the stapling means to be actuated, characterised in that the length of the anvil shaft is at least 4 cm. The present invention also relates to a method of forming an anastomosis between two surfaces using the stapler apparatus of the invention and a method of forming a stoma trephine in a subject using the stapler apparatus of the invention. The present invention further relates to the use of the stapler apparatus or anvil for a stapler apparatus in such methods and a kit of parts comprising the stapler apparatus of the invention and additional components.
    • 本发明涉及一种吻合器装置,其包括具有近端,远端和纵向轴线的吻合器,所述吻合器还包括触发器,基本上与缝合器的纵向轴线平行排列的砧座对接针,以及缝合 装置,砧座对接销和装订装置位于订书机的远端,以及可拆卸的砧座,其包括砧头和砧座轴,其中砧座轴适于接收砧对接销和触发器的操作 所述装订装置被致动,其特征在于,所述砧座轴的长度至少为4cm。 本发明还涉及使用本发明的吻合器装置在两个表面之间形成吻合的方法以及使用本发明的吻合器装置在受试者中形成造口环蒂的方法。 本发明还涉及在这种方法中使用用于吻合器装置的吻合器装置或砧座,以及包括本发明的缝合器装置和附加部件的部件套件。