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    • 1. 发明授权
    • Semiconductor apparatus configured to reduce data processing performance
    • 被配置为降低数据处理性能的半导体装置
    • US09202541B2
    • 2015-12-01
    • US13607306
    • 2012-09-07
    • Shuuichi SenouKenjyu ShimogawaSusumu TakanoToshihiko FunakiHideaki Arima
    • Shuuichi SenouKenjyu ShimogawaSusumu TakanoToshihiko FunakiHideaki Arima
    • G06F13/36G11C7/22G06F13/40G06F3/06
    • G11C7/22G06F3/0635G06F13/4022
    • A semiconductor apparatus according to an aspect of the present invention includes first and second bus-interface circuits, a mode information storage unit that stores first and second mode information, the first and second mode information being able to be set through the first bus-interface circuit, a first memory core that operates based on the first mode information, the first memory core being connected to the first bus-interface circuit and supplied with a first clock signal, a second memory core, the second memory core being supplied with a second clock signal and a select circuit that selectively connects the second memory core to the first or second bus-interface circuit based on predetermined switching information, in which the second memory core operates based on the second mode information when the second memory core is connected to the second bus-interface circuit.
    • 根据本发明的一个方面的半导体装置包括第一和第二总线接口电路,存储第一和第二模式信息的模式信息存储单元,能够通过第一总线接口设置的第一和第二模式信息 电路,基于第一模式信息操作的第一存储器核心,第一存储器核心连接到第一总线接口电路并被提供有第一时钟信号,第二存​​储器内核,第二存储器核心被提供有第二存储器核心 时钟信号和选择电路,其基于预定的切换信息选择性地将第二存储器核心连接到第一或第二总线接口电路,其中当第二存储器核心连接到第二存储器核心时,第二存储器核心基于第二模式信息操作 第二总线接口电路。
    • 2. 发明申请
    • SEMICONDUCTOR APPARATUS
    • US20130058173A1
    • 2013-03-07
    • US13607306
    • 2012-09-07
    • Shuuichi SENOUKenjyu ShimogawaSusumu TakanoToshihiko FunakiHideaki Arima
    • Shuuichi SENOUKenjyu ShimogawaSusumu TakanoToshihiko FunakiHideaki Arima
    • G11C7/22
    • G11C7/22G06F3/0635G06F13/4022
    • A semiconductor apparatus according to an aspect of the present invention includes first and second bus-interface circuits, a mode information storage unit that stores first and second mode information, the first and second mode information being able to be set through the first bus-interface circuit, a first memory core that operates based on the first mode information, the first memory core being connected to the first bus-interface circuit and supplied with a first clock signal, a second memory core, the second memory core being supplied with a second clock signal and a select circuit that selectively connects the second memory core to the first or second bus-interface circuit based on predetermined switching information, in which the second memory core operates based on the second mode information when the second memory core is connected to the second bus-interface circuit.
    • 根据本发明的一个方面的半导体装置包括第一和第二总线接口电路,存储第一和第二模式信息的模式信息存储单元,能够通过第一总线接口设置的第一和第二模式信息 电路,基于第一模式信息操作的第一存储器核心,第一存储器核心连接到第一总线接口电路并被提供有第一时钟信号,第二存​​储器内核,第二存储器核心被提供有第二存储器核心 时钟信号和选择电路,其基于预定的切换信息选择性地将第二存储器核心连接到第一或第二总线接口电路,其中当第二存储器核心连接到第二存储器核心时,第二存储器核心基于第二模式信息操作 第二总线接口电路。
    • 6. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US06937522B2
    • 2005-08-30
    • US10773909
    • 2004-02-05
    • Toshihiko Funaki
    • Toshihiko Funaki
    • G11C16/02G11C11/56G11C16/04G11C16/06G11C16/34
    • G11C11/5628G11C11/5642G11C16/3454G11C2211/5621
    • In writing N level of multilevel data to nonvolatile semiconductor memory by repeating a verification process, a verification result of a memory cell where the Nth threshold level which is the highest level is to be written as an expected level is invalidated until completion of writing to a memory cell where the (N−1)th and lower level is to be written. The verification result of the memory cell where the Nth level is to be written is validated after reaching the (N−1)th write level. A reference current supplied to a sense amplifier corresponding to the Nth level is set at at least a level allowing no indeterminate sensing of a sense amplifier. In verification of the Nth level data, a word line voltage supplied for verify-reading is raised from VW 1 to VW 2.
    • 通过重复验证处理将N级多电平数据写入非易失性半导体存储器,将要写入最高级别的第N阈值水平作为预期级别的存储单元的验证结果无效,直到写入完成为止 要写入(N-1)和下一级的存储单元。 在达到第(N-1)个写入电平之后验证要写入第N个电平的存储单元的验证结果。 提供给对应于第N级的读出放大器的参考电流至少被设置为允许不确定感测读出放大器的电平。 在验证第N级数据时,提供用于验证读取的字线电压从V W 1升高到V W 2。