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    • 3. 发明申请
    • METHOD AND APPARATUS FOR AUTOMATED VALIDATION OF SEMICONDUCTOR PROCESS RECIPES
    • 自动验证半导体工艺步骤的方法和装置
    • US20120053719A1
    • 2012-03-01
    • US13044747
    • 2011-03-10
    • CHARLES HARDYROGER ALAN LINDLEY
    • CHARLES HARDYROGER ALAN LINDLEY
    • G06N5/02G06F19/00
    • G06N5/025
    • Methods and apparatus for automated validation of semiconductor process steps are provided herein. In some examples, a method for validating a semiconductor process recipe includes: selecting a rule set describing an operating window for a semiconductor process tool; checking parameter values defined by steps in the semiconductor process recipe against limit-checking rules of the rule set to produce first results; determining step types from the steps in the semiconductor process recipe using step definition rules of the rule set to produce second results; checking transitions between the step types against step transition rules of the rule set to produce third results; and generating, using the computer, validation data for use of the semiconductor process recipe with the semiconductor process tool based on the first, the second, and the third results.
    • 本文提供了半导体工艺步骤的自动验证的方法和装置。 在一些示例中,用于验证半导体处理配方的方法包括:选择描述半导体处理工具的操作窗口的规则集; 检查由半导体工艺配方中的步骤定义的参数值,以反映规则集的限制检查规则以产生第一个结果; 使用规则集的步骤定义规则从半导体工艺配方中的步骤确定步骤类型以产生第二结果; 检查步骤类型与规则集的步骤转换规则之间的转换,以产生第三个结果; 以及基于第一,第二和第三结果,使用计算机产生使用半导体处理工具的半导体工艺配方的验证数据。
    • 8. 发明授权
    • Method and apparatus for automated validation of semiconductor process recipes
    • 用于半导体工艺配方自动验证的方法和装置
    • US08527081B2
    • 2013-09-03
    • US13044747
    • 2011-03-10
    • Charles HardyRoger Alan Lindley
    • Charles HardyRoger Alan Lindley
    • G06F19/00
    • G06N5/025
    • Methods and apparatus for automated validation of semiconductor process steps are provided herein. In some examples, a method for validating a semiconductor process recipe includes: selecting a rule set describing an operating window for a semiconductor process tool; checking parameter values defined by steps in the semiconductor process recipe against limit-checking rules of the rule set to produce first results; determining step types from the steps in the semiconductor process recipe using step definition rules of the rule set to produce second results; checking transitions between the step types against step transition rules of the rule set to produce third results; and generating, using the computer, validation data for use of the semiconductor process recipe with the semiconductor process tool based on the first, the second, and the third results.
    • 本文提供了半导体工艺步骤的自动验证的方法和装置。 在一些示例中,用于验证半导体处理配方的方法包括:选择描述半导体处理工具的操作窗口的规则集; 检查由半导体工艺配方中的步骤定义的参数值,以反映规则集的限制检查规则以产生第一个结果; 使用规则集的步骤定义规则从半导体工艺配方中的步骤确定步骤类型以产生第二结果; 检查步骤类型与规则集的步骤转换规则之间的转换,以产生第三个结果; 以及基于第一,第二和第三结果,使用计算机产生使用半导体处理工具的半导体工艺配方的验证数据。