专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20090316157A1 DIRECT DETECTION OF LOCALIZED MODULATION OF ION CONCENTRATION ON AN ELECTRODE-ELECTROLYTE INTERFACE 有权
标题翻译：直接检测离子浓度在电极电解质界面上的局部化调节
公开(公告)号：US20090316157A1
公开(公告)日：2009-12-24
申请号：US12131647
申请日：2008-06-02
申请人： Ravi Saraf , Gaurav Singh
发明人： Ravi Saraf , Gaurav Singh
IPC分类号： G01B9/02 , C25B9/00
CPC分类号： G01N21/45 , C25D21/12 , G01N21/21
摘要： The present invention directly measures localized electrochemical processes on a planar electrode using differential interferometry. The ionic charge accumulation at the electrode-electrolyte interface may be directly measured by using differential interferometry as a function of magnitude and frequency (for example, 2-50 kHz) of an external potential applied on an electrode. Methods in accordance with the present invention probe the ion dynamics confined to the electrical double layer. An electric field is applied using a pure AC potential and a superposition of AC and DC-ramp potential to measure ion concentration and detect redox processes.
摘要翻译：本发明使用差分干涉法直接测量平面电极上的局部电化学过程。可以通过使用差分干涉测量作为施加在电极上的外部电位的幅度和频率（例如2-50kHz）的函数来直接测量电极 - 电解质界面处的离子电荷累积。根据本发明的方法探测限于电双层的离子动力学。使用纯AC电位和AC和DC-ramp电位的叠加来施加电场以测量离子浓度并检测氧化还原过程。

2. 发明授权

US07585431B1 Electrically conductive polymeric materials and use thereof 失效
标题翻译：导电聚合材料及其用途
公开(公告)号：US07585431B1
公开(公告)日：2009-09-08
申请号：US08118475
申请日：1993-09-07
申请人： Ali Afzali-Ardakani , Marie Angelopoulos , Vincent Albert Bourgault , Liam David Comerford , Michael Wayne Mirre , Steven Earle Molis , Ravi Saraf , Jane Margaret Shaw , Peter Joseph Spellane , Niranjan Mohanlal Patel
发明人： Ali Afzali-Ardakani , Marie Angelopoulos , Vincent Albert Bourgault , Liam David Comerford , Michael Wayne Mirre , Steven Earle Molis , Ravi Saraf , Jane Margaret Shaw , Peter Joseph Spellane , Niranjan Mohanlal Patel
IPC分类号： H01B1/24
CPC分类号： H01B1/128 , C08G61/02 , C08G61/123 , C08G75/0209 , C08G75/0295 , C08L53/02 , C08L65/00 , C08L69/00 , C08L79/02 , C08L79/04 , C08L81/02 , C08L81/04 , C08L101/12 , H01B1/00 , H01B1/124 , C08L2666/04 , C08L2666/02 , C08L2666/14
摘要： This invention is concerned with an electrically conductive polymer blend composition which is a liquid compatible blend, comprising a doped product formed form blending a first solution comprising a Lewis base electrically conductive polymer in undoped form in a first organic solvent with a second solution comprising a Lewis acid polymer dopant in a second organic solvent, wherein said Lewis acid polymer dopant dopes said Lewis base electrically conductive polymer in undoped form to obtain said electrically conductive polymer blend, the resulting doped conductive product being soluble in the combination of said first and said second organic solvents and mixable at the molecular level.
摘要翻译：本发明涉及一种导电聚合物共混组合物，其是液体相容的共混物，其包含形成的掺杂产物，其形成为在第一有机溶剂中将包含未掺杂形式的路易斯碱导电聚合物的第一溶液与包含路易斯酸性聚合物掺杂剂，其中所述路易斯酸聚合物掺杂剂以未掺杂形式掺杂所述路易斯碱导电聚合物以获得所述导电聚合物共混物，所得掺杂导电产物可溶于所述第一和所述第二有机溶剂的组合溶剂和分子水平混合。

3. 发明授权

US06552339B1 Micro goniometer for scanning probe microscopy 失效
标题翻译：用于扫描探针显微镜的微测角仪
公开(公告)号：US06552339B1
公开(公告)日：2003-04-22
申请号：US09572209
申请日：2000-05-17
申请人： Arunava Gupta , Ravi Saraf
发明人： Arunava Gupta , Ravi Saraf
IPC分类号： G01N2300
CPC分类号： G01Q70/06 , G01B7/30 , G01Q20/04 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B2005/0002 , Y10S977/852 , Y10S977/872
摘要： A goniometer for performing scanning probe microscopy on a substrate surface is disclosed. The goniometer has a cantilever, having a cantilevered end and a supported end and a tip disposed at the cantilevered end of the cantilever. The goniometer also has a block disposed at the supported end of the cantilever. The block has at least one pair of piezoelectric layers, a pair of electrodes disposed about each individual piezoelectric layer such that varying a potential difference applied between the individual electrodes of a pair of electrodes causes the corresponding piezoelectric layer to deform, and a first insulating material disposed between the individual electrodes for insulating the individual electrodes from each other. The individual piezoelectric layers are deformed at different rates resulting in a deformity of the block and tilting of the cantilever and tip connected therewith. Also disclosed are methods of using the goniometer of the present invention to measure the interactive forces between two molecular structures using a scanning probe microscope equipped with a goniometer of the present invention.
摘要翻译：公开了一种用于在衬底表面上执行扫描探针显微镜的测角器。测角器具有悬臂，具有悬臂端和支撑端，以及设置在悬臂悬臂端的尖端。测角器还具有设置在悬臂的支撑端处的块。该块具有至少一对压电层，围绕每个单独的压电层设置的一对电极，使得改变施加在一对电极的各个电极之间的电势差导致相应的压电层变形，并且第一绝缘材料设置在各个电极之间，用于使各个电极彼此绝缘。单个压电层以不同的速率变形，导致块的变形和与其连接的悬臂和尖端的倾斜。还公开了使用本发明的测角器的方法，使用配备有本发明的测角器的扫描探针显微镜来测量两个分子结构之间的相互作用力。

4. 发明授权

US5062896A Solder/polymer composite paste and method 失效
标题翻译：焊剂/聚合物复合材料和方法
公开(公告)号：US5062896A
公开(公告)日：1991-11-05
申请号：US502090
申请日：1990-03-30
申请人： Wu-Song Huang , Igor Y. Khandros , Ravi Saraf , Leathen Shi
发明人： Wu-Song Huang , Igor Y. Khandros , Ravi Saraf , Leathen Shi
IPC分类号： B23K35/22 , B23K35/26 , B23K35/36 , B23K35/363 , B23K101/36 , C08K3/08 , H05K3/32 , H05K3/34
CPC分类号： H05K3/3484 , B23K35/26 , B23K35/36 , C08K3/08 , H05K2201/0129 , H05K3/321
摘要： An improved solder/polymer fluxless composite paste interconnection material having a low reflow temperature to form electrical contacts having good bonding strength and low contact resistance. The present pastes comprise a major proportion of a meltable metal alloy powder filler, free of noble metals and preferably free of lead, a minor proportion of a solution of a temperature-stable thermoplastic polymer having a softening temperature above the melting temperature of the metal powder filler in a volatile solvent which evaporates during reflow, and a minor proportion of a fluxing agent having a boiling point lower than the reflow temperature of the composition and higher than the melting point of the eutectic alloy powder filler. An oxide-free, partially coalesced metal alloy connection is obtained, which is polymer strengthened and reworkable at a low reflow temperature, per se, or in the presence of polymer solvent.
摘要翻译：具有低回流温度的改进的焊料/聚合物无焊剂复合糊剂互连材料，以形成具有良好的接合强度和低接触电阻的电触点。本发明的糊料主要包括不含贵金属，优选不含铅的可熔融金属合金粉末填料的主要部分，较小比例的软化温度高于金属粉末的熔融温度的温度稳定的热塑性聚合物溶液在回流时蒸发的挥发性溶剂中的填料，以及沸点低于组合物的回流温度并且高于共晶合金粉末填料的熔点的助熔剂的一小部分。获得无氧化物，部分聚结的金属合金连接，其在低回流温度下或在聚合物溶剂的存在下聚合物增强并可再加工。

5. 发明授权

US10962470B1 Measurement of local electrochemical process by differential reflectometery 有权
公开(公告)号：US10962470B1
公开(公告)日：2021-03-30
申请号：US15914474
申请日：2018-03-07
申请人： Ravi Saraf , Abhijeet Prasad
发明人： Ravi Saraf , Abhijeet Prasad
IPC分类号： G01N21/21 , G01N21/552
摘要： Apparatus and methodology to measure the amplitude of oscillation of differential reflectivity from an electrode surface in contact with liquid with dissolved ions upon applying an oscillatory potential between the said electrode and the said liquid, where the differential reflectivity is a set of optical properties comprised of a change in intensity and phase of the oscillation of reflected light intensity relative to the incident light and a change in polarization of the reflected light. Analysis of the reflected beam may be used to determine various parameters of the electrochemical processes.

6. 发明授权

US07826060B2 Direct detection of localized modulation of ion concentration on an electrode-electrolyte interface 有权
标题翻译：直接检测电极 - 电解质界面上离子浓度的局部调制
公开(公告)号：US07826060B2
公开(公告)日：2010-11-02
申请号：US12131647
申请日：2008-06-02
申请人： Ravi Saraf , Gaurav Singh
发明人： Ravi Saraf , Gaurav Singh
IPC分类号： G01B9/02
CPC分类号： G01N21/45 , C25D21/12 , G01N21/21
摘要： The present invention directly measures localized electrochemical processes on a planar electrode using differential interferometry. The ionic charge accumulation at the electrode-electrolyte interface may be directly measured by using differential interferometry as a function of magnitude and frequency (for example, 2-50 kHz) of an external potential applied on an electrode. Methods in accordance with the present invention probe the ion dynamics confined to the electrical double layer. An electric field is applied using a pure AC potential and a superposition of AC and DC-ramp potential to measure ion concentration and detect redox processes.
摘要翻译：本发明使用差分干涉法直接测量平面电极上的局部电化学过程。可以通过使用差分干涉测量作为施加在电极上的外部电位的幅度和频率（例如2-50kHz）的函数来直接测量电极 - 电解质界面处的离子电荷积聚。根据本发明的方法探测限于电双层的离子动力学。使用纯AC电位和AC和DC-ramp电位的叠加来施加电场以测量离子浓度并检测氧化还原过程。

7. 发明授权

US06236589B1 Ultra high density storage media and method thereof 失效
标题翻译：超高密度存储介质及其方法
公开(公告)号：US06236589B1
公开(公告)日：2001-05-22
申请号：US09320611
申请日：1999-05-26
申请人： Arunava Gupta , Ravi Saraf
发明人： Arunava Gupta , Ravi Saraf
IPC分类号： G11C1100
CPC分类号： B82Y10/00 , G11B3/00 , G11B7/245 , G11B9/14 , G11B9/1463 , G11B9/149 , Y10S977/788 , Y10T428/21 , Y10T428/239 , Y10T428/249995 , Y10T428/31837
摘要： A storage media for storing information having a substrate. The substrate has an upper surface and a molecular weight greater than 5,000. Preferably the material is a polymer. The material has a plurality of piles of molecular chains in selected areas formed by pushing the molecular chains of the material on its upper surface to the selected area mechanically with a mechanical tool. The piles represent written information. The mechanical tool is preferably an atomic force microscope. Another aspect of the present invention is a method for storing information having the steps of selecting a material substrate having an upper surface and pushing molecules on the upper surface into a molecular pile at selected locations.
摘要翻译：一种用于存储具有基板的信息的存储介质。基材的上表面和分子量大于5,000。优选地，该材料是聚合物。该材料在选定区域中具有多个分子链堆，其通过用机械工具机械地将其上表面上的材料的分子链推向所选区域而形成。桩代表书面资料。机械工具优选为原子力显微镜。本发明的另一方面是一种用于存储信息的方法，其具有如下步骤：选择具有上表面的材料基板，并将上表面上的分子推入选定位置的分子堆中。

8. 发明授权

US5747101A Direct chip attachment (DCA) with electrically conductive adhesives 失效
公开(公告)号：US5747101A
公开(公告)日：1998-05-05
申请号：US630033
申请日：1996-04-09
申请人： Richard B. Booth , Michael A. Gaynes , Robert M. Murcko , Viswanadham Puligandla , Judith M. Roldan , Ravi Saraf , Jerzy M. Zalesinski
发明人： Richard B. Booth , Michael A. Gaynes , Robert M. Murcko , Viswanadham Puligandla , Judith M. Roldan , Ravi Saraf , Jerzy M. Zalesinski
IPC分类号： H01L21/56 , H01L21/60 , H01L23/485 , H01R4/04 , B05D5/12
CPC分类号： H01L24/10 , H01L21/563 , H01L24/13 , H01L24/27 , H01L24/28 , H01L24/83 , H01L2224/13 , H01L2224/13099 , H01L2224/1319 , H01L2224/16 , H01L2224/274 , H01L2224/73104 , H01L2224/73203 , H01L2224/8319 , H01L2224/838 , H01L2224/90 , H01L24/90 , H01L2924/01006 , H01L2924/01013 , H01L2924/01033 , H01L2924/01046 , H01L2924/01047 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01087 , H01L2924/014 , H01L2924/07802 , H01L2924/0781 , H01L2924/09701 , H01L2924/12042 , H01L2924/14 , Y10T29/49204 , Y10T29/49222
摘要： A simple process for card assembly by Direct Chip Attachment (DCA) uses electrically conductive adhesives. Two methods create the same intermediate wafer product with a layer of insulative thermoplastic and conductive thermoplastic bumps. After sawing or dicing the wafer to form the chips, the chips are adhered to chip carriers with conductive pads which match the conductive thermoplastic bumps, using heat and pressure. Chips may be easily removed and replaced using heat.

9. 发明授权

US5545429A Fabrication of double side fully metallized plated thru-holes, in polymer structures, without seeding or photoprocess 失效
标题翻译：在聚合物结构中制造双面全金属镀层通孔，无接种或光刻处理
公开(公告)号：US5545429A
公开(公告)日：1996-08-13
申请号：US270086
申请日：1994-07-01
申请人： Richard B. Booth , Emanuel I. Cooper , Edward A. Giess , Mark R. Kordus , Sol Krongelb , Steven P. Ostrander , Judith M. Roldan , Carlos J. Sambucetti , Ravi Saraf
发明人： Richard B. Booth , Emanuel I. Cooper , Edward A. Giess , Mark R. Kordus , Sol Krongelb , Steven P. Ostrander , Judith M. Roldan , Carlos J. Sambucetti , Ravi Saraf
IPC分类号： H05K3/20 , H05K3/32 , H05K3/42 , B05D5/12 , C25D5/02
CPC分类号： H05K3/423 , H05K2203/0152 , H05K2203/0733 , H05K2203/1509 , H05K3/205 , H05K3/321
摘要： The present invention is directed to a process of a method for the full metallization of thru-holes in a polymer structure comprising the steps of applying a film-forming amount of a conductive polymer-metal composite paste to a metal cathode; bonding a patterned polymer structure to said paste; subjecting said polymer structure to an electrolytic plating bath for a time sufficient to fully metallize thru-hole surfaces in said patterned polymer structure and removing the structure from the cathode assembly. The fully metallized thru-hole polymer structure can then be cleaned and polished to produce a finished product.
摘要翻译：本发明涉及一种在聚合物结构中贯穿孔的全金属化方法的方法，包括以下步骤：向金属阴极施加成膜量的导电聚合物 - 金属复合浆料; 将图案化的聚合物结构键合到所述糊料; 使所述聚合物结构经受电解电镀浴足够的时间以完全金属化所述图案化的聚合物结构中的通孔表面，并从阴极组件中去除结构。完全金属化的通孔聚合物结构然后可以被清洁和抛光以产生成品。

10. 发明授权

US6100523A Micro goniometer for scanning microscopy 失效
标题翻译：用于扫描显微镜的微测角仪
公开(公告)号：US6100523A
公开(公告)日：2000-08-08
申请号：US960692
申请日：1997-10-29
申请人： Arunava Gupta , Ravi Saraf
发明人： Arunava Gupta , Ravi Saraf
IPC分类号： G01B7/30 , G01Q10/00 , G01Q20/04 , G01Q60/38 , G01Q80/00 , G01Q90/00 , G11B5/00 , G11B9/00 , G01N13/12
CPC分类号： G01Q70/06 , B82Y35/00 , G01B7/30 , G01Q20/04 , B82Y10/00 , G11B2005/0002 , G11B9/14 , G11B9/1409 , G11B9/1418 , Y10S977/852 , Y10S977/872
摘要： A goniometer for performing scanning probe microscopy on a substrate surface is disclosed. The goniometer has a cantilever, having a cantilevered end and a supported end and a tip disposed at the cantilevered end of the cantilever. The goniometer also has a block disposed at the supported end of the cantilever. The block has at least one pair of piezoelectric layers, a pair of electrodes disposed about each individual piezoelectric layer such that varying a potential difference applied between the individual electrodes of a pair of electrodes causes the corresponding piezoelectric layer to deform, and a first insulating material disposed between the individual electrodes for insulating the individual electrodes from each other. The individual piezoelectric layers are deformed at different rates resulting in a deformity of the block and tilting of the cantilever and tip connected therewith. Also disclosed are methods of using the goniometer of the present invention to measure the interactive forces between two molecular structures using a scanning probe microscope equipped with a goniometer of the present invention.
摘要翻译：公开了一种用于在衬底表面上执行扫描探针显微镜的测角器。测角器具有悬臂，具有悬臂端和支撑端，以及设置在悬臂悬臂端的尖端。测角器还具有设置在悬臂的支撑端处的块。该块具有至少一对压电层，围绕每个单独的压电层设置的一对电极，使得改变施加在一对电极的各个电极之间的电势差导致相应的压电层变形，并且第一绝缘材料设置在各个电极之间，用于使各个电极彼此绝缘。单个压电层以不同的速率变形，导致块的变形和与其连接的悬臂和尖端的倾斜。还公开了使用本发明的测角器的方法，使用配备有本发明的测角器的扫描探针显微镜来测量两个分子结构之间的相互作用力。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式