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    • 4. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE
    • 用于制造半导体器件的半导体器件和方法
    • US20110241068A1
    • 2011-10-06
    • US13074333
    • 2011-03-29
    • Yuuji WATANABEMasanori FUKUIMichiaki MARUOKA
    • Yuuji WATANABEMasanori FUKUIMichiaki MARUOKA
    • H01L29/739H01L21/332
    • H01L29/7802H01L29/0634H01L29/0878H01L29/1095H01L29/47H01L29/66712H01L29/7395
    • A semiconductor device which can make the generation of gate parasitic oscillations more difficult than a semiconductor device of the related art is provided. The semiconductor device includes: a drift layer which is constituted of a reference concentration layer and a low concentration layer; a gate electrode structure; a pair of source regions, a pair of base regions, and depletion-layer extension regions which are formed in the reference concentration layer below the base regions, wherein the depletion-layer extension regions are formed such that a lower surface of the depletion-layer extension region is deeper than a boundary between the low concentration layer and the reference concentration layer and projects into the low concentration layers, and a dVDS/dt-decreasing diffusion layer which contains an n-type impurity at a concentration higher than the concentration of the impurity which the reference concentration layer contains and decreases dVDS/dt when the semiconductor device is turned off is formed on a surface of the reference concentration layer.
    • 提供了可以使栅极寄生振荡的产生比现有技术的半导体器件困难的半导体器件。 半导体器件包括:漂移层,其由参考浓度层和低浓度层构成; 栅电极结构; 一对源极区域,一对基极区域和耗尽层延伸区域,其形成在基极区域下方的参考浓度层中,其中形成耗尽层延伸区域,使得耗尽层的下表面 延伸区域比低浓度层和参考浓度层之间的边界深,并且投入到低浓度层中,并且含有浓度高于低浓度层的浓度的n型杂质的dVDS / dt减小扩散层 在参考浓度层的表面上形成半导体器件截止时参考浓度层包含并降低dVDS / dt的杂质。
    • 5. 发明授权
    • Reforming process of quartz glass crucible
    • 石英玻璃坩埚改造工艺
    • US07905112B2
    • 2011-03-15
    • US10628350
    • 2003-07-29
    • Masanori FukuiMasaru Satoh
    • Masanori FukuiMasaru Satoh
    • C03B19/00
    • C03B32/00C03B19/095C03B29/02C30B15/10
    • A reforming process of a quartz glass crucible in which the quartz glass crucible is reformed by an arc discharge generated by electrodes positioned around a rotational axis and configured to heat an inside surface of the crucible while the crucible is rotated. The process includes arranging electrodes in an electrode structure such that neighboring electrodes are positioned at regular intervals in a ring-like configuration; forming a stable ring-like arc between the neighboring electrodes, without generating a continuous arc between electrodes facing each other across a central portion of the ring-like configuration; heating the inside surface of the crucible; and removing a foreign substance located on the inside surface of the crucible or a bubble located under the inside surface of the crucible.
    • 一种石英玻璃坩埚的重整工艺,其中石英玻璃坩埚通过由位于旋转轴线周围的电极产生的电弧放电而重构,并且构造成在坩埚旋转的同时加热坩埚的内表面。 该方法包括在电极结构中布置电极,使得相邻的电极以规定的间隔以环状构造定位; 在相邻电极之间形成稳定的环状电弧,而不会在环状构造的中心部分彼此面对的电极之间产生连续的电弧; 加热坩埚的内表面; 并且去除位于坩埚内表面上的异物或位于坩埚内表面下方的气泡。
    • 6. 发明申请
    • METHOD OF MANUFACTURING SILICON SINGLE CRYSTAL, APPARATUS FOR PULLING SILICON SINGLE CRYSTAL AND VITREOUS SILICA CRUCIBLE
    • 制造硅单晶的方法,用于拉丝硅单晶和维生素二氧化硅的装置
    • US20100326349A1
    • 2010-12-30
    • US12786911
    • 2010-05-25
    • Masanori FUKUIHideki WATANABENobumitsu TAKASE
    • Masanori FUKUIHideki WATANABENobumitsu TAKASE
    • C30B15/20C30B15/16C30B15/10
    • C30B15/20C30B15/10C30B29/06
    • Leakage of silicon melt is monitored and touch of a seed crystal at the silicon melt is detected, and in addition, reinforcement of a vitreous silica crucible to be endurable during pulling for a long time and decrease of impurity concentration of a silicon single crystal can be expected. A method for manufacturing a silicon single crystal is provided. The method includes: detecting touching status of a seed crystal at silicon melt by supplying voltage V1 using a crucible side as a negative electrode and a wire side as a positive electrode and by monitoring change of the voltage, when the seed crystal provided at a front end of the wire touches the silicon melt inside a vitreous silica crucible; devitrifying an inner surface of the vitreous silica crucible as supplying voltage V2 using the crucible side as a positive electrode and the wire side as a negative electrode during a temperature control period; and growing a silicon single crystal by slowly pulling the seed crystal as supplying voltage V3 using the crucible side as a negative electrode and the wire side as a positive electrode after the temperature control period.
    • 监测硅熔体的泄漏,并检测硅熔体中的晶种的接触,此外,长时间拉伸和降低硅单晶的杂质浓度可以耐久的石英玻璃坩埚的增强可以是 预期。 提供了制造硅单晶的方法。 该方法包括:通过使用坩埚侧作为负极并且线侧作为正极​​来提供电压V1,并通过监视电压的变化来检测硅熔体处的晶种的触摸状态 导线的末端触及石英玻璃坩埚内的硅熔体; 在温度控制期间,使用坩埚侧作为正极​​而将作为负极的线侧作为供给电压V2而使玻璃状石英玻璃坩埚的内表面失透; 并且通过在坩埚侧作为负极并且在温度控制周期之后将线侧作为正极​​,通过缓慢地拉晶晶体作为供给电压V3来生长硅单晶。