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    • 8. 发明授权
    • Bare chip test carrier with an improved holding structure for a
semiconductor chip
    • 具有改进的用于半导体芯片的保持结构的裸芯片测试载体
    • US5767689A
    • 1998-06-16
    • US575480
    • 1995-12-20
    • Kenichi TokunoAkihiro Dohya
    • Kenichi TokunoAkihiro Dohya
    • H01L21/66G01R1/04G01R31/26G01R31/02
    • G01R1/0408
    • A chip tester for holding a semiconductor chip bonded via convex electrodes to a flexible substrate. The tester has a carrier body with a flat surface in contact with the flexible board. The carrier body overlies the flexible substrate so as to press down the flexible substrate. The tester also has a chip plate that underlies and contacts the semiconductor chip so as to urge the semiconductor chip toward the flexible substrate. At least a flat contact surface of the chip plate is made of an elastic material with a high elastic coefficient to obtain an adhesion with the semiconductor chip to prevent lateral displacement of the semiconductor chip. The tester also has a chip plate holder that underlies the flexible substrate and is positioned around both the semiconductor chip and the chip plate. The chip plate holder is spaced apart from the semiconductor chip so that the chip plate holder sandwiches the flexible substrate in cooperation with the carrier body.
    • 用于将通过凸电极粘合的半导体芯片保持在柔性基板上的芯片测试器。 测试仪具有与柔性板接触的平坦表面的承载体。 承载体覆盖柔性基板,以便将柔性基板压下。 测试仪还具有底板并接触半导体芯片,以将半导体芯片推向柔性基板。 芯片板的至少平坦的接触表面由具有高弹性系数的弹性材料制成,以获得与半导体芯片的粘附性,以防止半导体芯片的横向位移。 该测试仪还具有一个位于柔性基片下方并位于半导体芯片和芯片板周围的芯片板支架。 芯片板保持件与半导体芯片间隔开,使得芯片板保持器与载体主体协作地夹持柔性基板。