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    • 1. 发明授权
    • Surface acoustic wave oscillator
    • 表面声波振荡器
    • US08368474B2
    • 2013-02-05
    • US13110990
    • 2011-05-19
    • Kazuki ArakawaKazuhiko Kano
    • Kazuki ArakawaKazuhiko Kano
    • H03B9/12
    • H03B5/326
    • In a SAW oscillator, each of a first SAW element and a second SAW element includes interdigital electrodes and a reflector formed on a piezoelectric material. A first oscillating circuit part forms an oscillating loop including the first SAW element. A second oscillating circuit part forms an oscillating loop including the second SAW element. The first and second oscillating circuit parts have an identical admittance property. The first and second SAW elements are configured that an electrode pitch is identical and an admittance property indicating a relation between a frequency and an admittance value is different therebetween. Further, a first intersection point between the admittance property of the first SAW element and the admittance property of the first oscillating circuit part and a second intersection point between the admittance property of the second SAW element and the admittance property of the second oscillating circuit part are at different frequencies.
    • 在SAW振荡器中,第一SAW元件和第二SAW元件中的每一个包括叉指电极和形成在压电材料上的反射器。 第一振荡电路部分形成包括第一SAW元件的振荡回路。 第二振荡电路部分形成包括第二SAW元件的振荡回路。 第一和第二振荡电路部件具有相同的导纳特性。 第一和第二SAW元件被构造成电极间距相同,并且指示频率和导纳值之间的关系的导纳特性在它们之间是不同的。 此外,第一SAW元件的导纳特性和第一振荡电路部分的导纳特性与第二SAW元件的导纳特性与第二振荡电路部分的导纳特性之间的第二交点之间的第一交点是 在不同的频率。
    • 2. 发明申请
    • SURFACE ACOUSTIC WAVE SENSOR
    • 表面声波传感器
    • US20130026882A1
    • 2013-01-31
    • US13557378
    • 2012-07-25
    • Hideaki YAMADAKazuhiko Kano
    • Hideaki YAMADAKazuhiko Kano
    • H01L41/04
    • H01L41/1132G01N29/2462G01N29/38G01N29/42G01N2291/0423H03H9/02622H03H9/058H03H9/0585
    • In a SAW device, a first area placed at a surface of a measurement subject directly under a propagation portion is fixed to the measurement subject, and a second area placed at the surface of the measurement subject directly under both a drive electrode and a reflector is not fixed to the measurement subject. When a strain is generated in the measurement subject, a strain is generated only in the propagation portion, and a phase change is generated in a surface acoustic wave reflected by the reflector. Because the phase change is hardly affected by a temperature change, the strain of the measurement subject can be measured based on the phase change. Because a resonant frequency of the SAW device is changed by the temperature change, but is not affected by the strain of the measurement subject, a temperature can be measured based on a resonant frequency change.
    • 在SAW器件中,将直接位于传播部分的测量对象的表面的第一区域固定在测定对象上,在测量对象的表面直接位于驱动电极和反射体的下方的第二区域是 没有固定在测量对象上。 当在测量对象中产生应变时,仅在传播部分中产生应变,并且在由反射器反射的表面声波中产生相变。 由于相变几乎不受温度变化的影响,所以测量对象的应变可以基于相位变化来测量。 由于SAW器件的谐振频率由于温度变化而变化,而是不受测量对象的应变的影响,所以可以基于谐振频率变化来测量温度。
    • 4. 发明申请
    • SURFACE ACOUSTIC WAVE OSCILLATOR
    • 表面声波振荡器
    • US20110285470A1
    • 2011-11-24
    • US13110990
    • 2011-05-19
    • Kazuki ARAKAWAKazuhiko KANO
    • Kazuki ARAKAWAKazuhiko KANO
    • H03B1/00
    • H03B5/326
    • In a SAW oscillator, each of a first SAW element and a second SAW element includes interdigital electrodes and a reflector formed on a piezoelectric material. A first oscillating circuit part forms an oscillating loop including the first SAW element. A second oscillating circuit part forms an oscillating loop including the second SAW element. The first and second oscillating circuit parts have an identical admittance property. The first and second SAW elements are configured that an electrode pitch is identical and an admittance property indicating a relation between a frequency and an admittance value is different therebetween. Further, a first intersection point between the admittance property of the first SAW element and the admittance property of the first oscillating circuit part and a second intersection point between the admittance property of the second SAW element and the admittance property of the second oscillating circuit part are at different frequencies.
    • 在SAW振荡器中,第一SAW元件和第二SAW元件中的每一个包括叉指电极和形成在压电材料上的反射器。 第一振荡电路部分形成包括第一SAW元件的振荡回路。 第二振荡电路部分形成包括第二SAW元件的振荡回路。 第一和第二振荡电路部件具有相同的导纳特性。 第一和第二SAW元件被构造成电极间距相同,并且指示频率和导纳值之间的关系的导纳特性在它们之间是不同的。 此外,第一SAW元件的导纳特性和第一振荡电路部分的导纳特性与第二SAW元件的导纳特性与第二振荡电路部分的导纳特性之间的第二交点之间的第一交点是 在不同的频率。
    • 7. 发明授权
    • Method for manufacturing semiconductor device
    • 制造半导体器件的方法
    • US06277756B1
    • 2001-08-21
    • US09501762
    • 2000-02-10
    • Junji OharaShinji YoshiharaKazuhiko KanoNobuyuki Ohya
    • Junji OharaShinji YoshiharaKazuhiko KanoNobuyuki Ohya
    • H01L21311
    • G01P15/0802B81B2203/033B81C1/00619B81C2201/0112H01L21/30655H01L21/762
    • A method of manufacturing a semiconductor device, which can effectively form a trench having a high aspect ratio with relatively simple steps. An initial trench is formed in a silicon substrate by a reactive ion etching using an oxide film mask as an etching mask. After forming a protection oxide film on an inside surface of the trench, a part of the protection oxide film at which positions at a bottom surface of the trench is removed by a reactive ion etching, so that an etching of the silicon substrate is advanced through the bottom surface of the trench. Furthermore, the step for forming the protection oxide film and the step for re-etching the bottom surface of the trench are repeatedly performed, so that a depth of the trench becomes a predetermined depth. These steps are performed in a common chamber by using plasma processed with switching gases to be introduced to the chamber.
    • 一种制造半导体器件的方法,其可以通过相对简单的步骤有效地形成具有高纵横比的沟槽。 通过使用氧化物膜掩模作为蚀刻掩模的反应离子蚀刻在硅衬底中形成初始沟槽。 在沟槽的内表面上形成保护氧化膜之后,通过反应离子蚀刻去除沟槽底面的位置的保护氧化膜的一部分,使得硅衬底的蚀刻通过 沟槽的底面。 此外,重复执行用于形成保护氧化膜的步骤和重新蚀刻沟槽的底表面的步骤,使得沟槽的深度变为预定深度。 这些步骤通过使用等离子体处理的切换气体被引入腔室在公共室中进行。