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    • 5. 发明申请
    • POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
    • 正极性组合物和使用其的图案形成方法
    • US20090111053A1
    • 2009-04-30
    • US12257646
    • 2008-10-24
    • Katsuhiro YAMASHITA
    • Katsuhiro YAMASHITA
    • G03F7/004G03F7/20
    • G03F7/0392G03F7/0395G03F7/0397Y10S430/106Y10S430/111
    • A positive resist composition for electron beam, X-ray or EUV exposure, including (A) a resin capable of decomposing by the action of an acid to increase the solubility in an alkali developer; and (B) a compound capable of generating a sulfonic acid upon irradiation with an actinic ray or radiation, wherein the resin (A) is a resin having a phenolic hydroxyl group and having a weight average molecular weight of 1,500 to 3,500, the positive resist composition has a property of decomposing by the action of an acid and causing the dissolution rate in an aqueous 2.38 wt % tetramethylammonium hydroxide solution at 23° C. under normal pressure to increase in a range of 200 to 5,000 times, and the positive resist composition has a solid content concentration of from 2.5 to 4.5 mass %.
    • 一种用于电子束,X射线或EUV曝光的正型抗蚀剂组合物,包括(A)能够通过酸的作用分解以提高在碱性显影剂中的溶解度的树脂; 和(B)能够在用光化射线或辐射照射时能够产生磺酸的化合物,其中树脂(A)是具有酚羟基并且重均分子量为1,500至3,500的树脂,正性抗蚀剂 组合物具有通过酸的作用分解的性质,并且在常压下在23℃下使2.38重量%四甲基氢氧化铵水溶液中的溶解速率增加到200-5000倍的范围,并且正性抗蚀剂组合物 固体成分浓度为2.5〜4.5质量%。