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    • 8. 发明申请
    • MICROMECHANICAL COMPONENT AND BALANCING METHOD
    • 微机械结构和平衡法
    • WO0170625A3
    • 2002-10-24
    • PCT/DE0100992
    • 2001-03-15
    • BOSCH GMBH ROBERTMUCHOW JOERGFRANZ JOCHENLIPPHARDT UWEDUELL ANDREASROMES WOLFGANG
    • MUCHOW JOERGFRANZ JOCHENLIPPHARDT UWEDUELL ANDREASROMES WOLFGANG
    • B81B3/00G01L9/00H01L29/84H01L41/08G01L9/06
    • G01L9/0054
    • The invention relates to a micromechanical component, especially a pressure sensor, comprising a substrate (2) which is provided with a membrane region (10) and a surrounding area of the membrane region (10). Said component also comprises at least one precision resistor (4a, 4b; 41, 42) that is provided in the membrane region (10) and can be changed by forming said membrane region (10). The inventive component further comprises a corresponding evaluation circuit (50) that is provided in the surrounding area. Parasitic induction onto the precision resistor (4a, 4b; 41, 42) can be generated by forming components, especially strip conductors, of the evaluating circuit (50) in relation to the substrate (2). Said component comprises at least one spot (60; 70, 70') that is provided in the surrounding area and/or the membrane region (10) and consists of such a material that analogous parasitic induction can be produced by forming the spot/s (60) in relation to the substrate (2), in such a way that the parasitic induction acting upon the precision resistor (4a, 4b; 41, 42) can be compensated. The invention also relates to a corresponding balancing method for a test chip or for single end balancing.
    • 本发明提供一种微机械部件,特别是压力传感器,包括具有膜片部分(10)和所述膜片区域(10)的周围区域的衬底(2); 的至少一个在由所述膜部分的变量(10)测量电阻器(4A,4B,41,42)的变形设置了膜片部(10); (50)相对于所述基板在所述周边区域中设置的开口,相应的评价电路(50),whichin部分的变形,特别是导体轨迹,所述评估电路(2)上的测量电阻器(4A,4B; 41,42)一个干扰影响,产生; 这样的材料的,通过的变形或斑点(60)相对于这样产生的(2)类似的干扰影响的基板;以及在周围区域和/或在膜中的区域(10)焊盘(70,70“60)至少设置有一个 的是,测量电阻(4A,4B; 41,42)作用的干扰影响可以被补偿。 本发明还提供一个测试芯片或作为Einzelendabgleich相应的调整方法。