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    • 2. 发明申请
    • CLEANING HEAD
    • 清洁头
    • WO2003095145A1
    • 2003-11-20
    • PCT/IB2003/001559
    • 2003-04-11
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.NGUYEN HOANG, VietDAAMEN, Roel
    • NGUYEN HOANG, VietDAAMEN, Roel
    • B24B37/04
    • B24B53/017
    • A cleaning head (10) for cleaning a polishing surface (42) of a polishing tool (40) comprises a dispensing element (11) for dispensing a cleaning liquid (13) onto the polishing surface (42) and a removing element (21) having a removing plane (22), able to remove cleaning liquid (13) from the polishing surface (42) by a vacuum. The removing element (21) laterally circumferentially encloses a perpendicular projection of the dispensing element (11) onto the removing plane (22), thereby preventing the cleaning liquid (13) from substantially modifying the composition of the polishing liquid used in the polishing process. The cleaning head (10) may further comprise an agitator (31) for mechanically treating the polishing surface (42). A polishing tool (40) and a method of in-situ cleaning of the polishing surface (42) use this cleaning head (10). It is particularly suitable for fixed abrasive CMP and abrasive-free CMP. The yield and quality of semiconductor devices manufactured using this polishing method with in-situ cleaning is improved.
    • 用于清洁抛光工具(40)的抛光表面(42)的清洁头(10)包括用于将清洁液体(13)分配到抛光表面(42)上的分配元件(11)和去除元件(21) 具有能够通过真空从抛光表面(42)去除清洁液体(13)的去除平面(22)。 移除元件(21)横向周向地包围分配元件(11)到除去平面(22)上的垂直突起,从而防止清洁液体(13)基本上改变抛光过程中使用的抛光液的组成。 清洁头(10)还可以包括用于机械处理抛光表面(42)的搅拌器(31)。 抛光工具(40)和抛光表面(42)的原位清洁方法使用该清洁头(10)。 特别适用于固定磨料CMP和无磨料CMP。 提高使用这种具有原位清洗的抛光方法制造的半导体器件的产量和质量。
    • 3. 发明申请
    • MICROSCOPIC STRUCTURE PACKAGING METHOD AND DEVICE WITH PACKAGED MICROSCOPIC STRUCTURE
    • 具有包装微结构的微结构包装方法和装置
    • WO2009147556A3
    • 2010-06-24
    • PCT/IB2009052083
    • 2009-05-19
    • NXP BVVERHEIJDEN GREJA J A MDAAMEN ROELROOSEN HAROLD H
    • VERHEIJDEN GREJA J A MDAAMEN ROELROOSEN HAROLD H
    • B81C1/00
    • B81C1/00476B81C2201/0108B81C2203/0136
    • The present invention discloses a method of packaging a microscopic structure (12). The method comprises the steps of forming the microscopic structure (12) on a substrate (10); depositing a layer (14) of a thermally decomposable polymer over the substrate, thereby embedding the microscopic structure; patterning the deposited layer (14) such that the microscopic structure is embedded in a portion of the patterned layer, the side walls of said portion (14) forming a substantially right angle with the substrate (10); growing a capping layer (18) over the portion, wherein the substantially right angles cause the formation of at least one channel (20) from the portion (14) through the capping layer (18); and decomposing the polymer, whereby the decomposition products escape from the portion (14) through said channel (20). The present invention further discloses a device including a microscopic structure packaged in accordance with the above method.
    • 本发明公开了一种包装微结构(12)的方法。 该方法包括在基板(10)上形成微观结构(12)的步骤。 在衬底上沉积可热分解的聚合物层(14),从而嵌入微观结构; 图案化沉积层(14),使得微观结构嵌入图案化层的一部分中,所述部分(14)的侧壁与衬底(10)形成大致直角; 在所述部分上生长覆盖层(18),其中所述基本上直角导致从所述部分(14)穿过所述封盖层(18)形成至少一个通道(20)。 并分解聚合物,由此分解产物通过所述通道(20)从部分(14)逸出。 本发明还公开了一种根据上述方法包装的微观结构的装置。
    • 4. 发明申请
    • MICROSCOPIC STRUCTURE PACKAGING METHOD AND DEVICE WITH PACKAGED MICROSCOPIC STRUCTURE
    • 具有包装微结构的微结构包装方法和装置
    • WO2009147556A2
    • 2009-12-10
    • PCT/IB2009/052083
    • 2009-05-19
    • NXP B.V.VERHEIJDEN, Greja, J., A., M.DAAMEN, RoelROOSEN, Harold, H.
    • VERHEIJDEN, Greja, J., A., M.DAAMEN, RoelROOSEN, Harold, H.
    • B81C1/00
    • B81C1/00476B81C2201/0108B81C2203/0136
    • The present invention discloses a method of packaging a microscopic structure (12). The method comprises the steps of forming the microscopic structure (12) on a substrate (10); depositing a layer (14) of a thermally decomposable polymer over the substrate, thereby embedding the microscopic structure; patterning the deposited layer (14) such that the microscopic structure is embedded in a portion of the patterned layer, the side walls of said portion (14) forming a substantially right angle with the substrate (10); growing a capping layer (18) over the portion, wherein the substantially right angles cause the formation of at least one channel (20) from the portion (14) through the capping layer (18); and decomposing the polymer, whereby the decomposition products escape from the portion (14) through said channel (20). The present invention further discloses a device including a microscopic structure packaged in accordance with the above method.
    • 本发明公开了一种包装微结构(12)的方法。 该方法包括在基板(10)上形成微观结构(12)的步骤。 在衬底上沉积可热分解的聚合物层(14),从而嵌入微观结构; 图案化沉积层(14),使得微观结构嵌入图案化层的一部分中,所述部分(14)的侧壁与衬底(10)形成大致直角; 在所述部分上生长覆盖层(18),其中所述基本上直角导致从所述部分(14)穿过所述封盖层(18)形成至少一个通道(20)。 并分解聚合物,由此分解产物通过所述通道(20)从部分(14)逸出。 本发明还公开了一种根据上述方法包装的微观结构的装置。
    • 8. 发明申请
    • METHOD OF MANUFACTURING A SUBSTRATE, HAVING A POROUS DIELECTRIC LAYER AND AIR GAPS, AND A SUBSTRATE
    • 制造具有多孔介电层和空气GAPS的基板的方法,以及基板
    • WO2004105122A1
    • 2004-12-02
    • PCT/IB2004/050715
    • 2004-05-17
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.DAAMEN, RoelVERHEIJDEN, Greja, J., A., M.
    • DAAMEN, RoelVERHEIJDEN, Greja, J., A., M.
    • H01L21/768
    • H01L21/7682H01L23/5222H01L2924/0002H01L2924/00
    • A method to produce air gaps between metal lines (8(i)( and within dielectrics. The method consists of obtaining a dual damascene structure, applying a diffusion barrier layer (10) directly on the planarized surface and performing a lithography step, thus shielding the metal lines underneath the diffusion barrier layer. Optionally, some portions of large dielectric areas (6) between the metal lines (8(i)) are also shielded. The exposed diffusion barrier layer portions and underlying dielectric are etched. A layer of a material that can be decomposed in volatile components by heating to a temperature of typically between 150-450°C is applied and planarized by etching or CMP. A dielectric layer (20) that is permeable to the decomposition products is deposited and subsequently the substrate is heated. Then, the disposable layer decomposes and disappears through the permeable dielectric layer, leaving air gaps (22) behind in between the metal lines (8(i)) and the large dielectric areas.
    • 一种在金属线(8(i)(和电介质之间)之间产生空气间隙的方法,该方法包括获得双镶嵌结构,在平坦化表面上直接施加扩散阻挡层(10)并执行光刻步骤,从而屏蔽 可选地,金属线(8(i))之间的大电介质区域(6)的一些部分也被屏蔽,暴露的扩散阻挡层部分和下面的电介质被蚀刻, 通过加热到通常在150-450℃之间的温度可以在易挥发组分中分解的材料被施加并通过蚀刻或CMP平坦化,沉积可分解产物的电介质层(20),随后将衬底 然后,一次性层通过可渗透的介电层分解并消失,在金属线(8(i))和大介质区域之间留下空隙(22)。
    • 9. 发明申请
    • MANUFACTURING AN IC
    • 制造IC
    • WO2004025720A1
    • 2004-03-25
    • PCT/IB2003/003770
    • 2003-08-13
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.INTERUNIVERSITAIR MICRO-ELECTRONICA CENTRUM VZWNGUYEN HOANG, VietDAAMEN, Roel
    • NGUYEN HOANG, VietDAAMEN, Roel
    • H01L21/321
    • H01L21/3212H01L21/7684
    • The method for manufacturing an integrated circuit according to the invention starts with providing a pre-fabricated integrated circuit (10) having a surface (11) coated with a dielectric material (12), a barrier layer (14) and a metal (15). The dielectric material (12), which is separated from the metal (15) by the barrier layer (14), has an opening (13), which is filled with the metal (15). Portions of the metal (15) outside the opening (13) are removed by a first chemical mechanical polishing step, which preferentially removes the metal (15) to locally expose the barrier layer (14). Portions of the locally exposed barrier layer (14) are removed by a second chemical mechanical polishing step, which preferentially removes the barrier layer (14). According to the invention, the first chemical mechanical polishing step is repeated after the second chemical mechanical polishing step has been carried out. The apparatus is able to perform the method. The computer program is able to control the method.
    • 根据本发明的集成电路的制造方法开始于提供具有涂覆有电介质材料(12),阻挡层(14)和金属(15)的表面(11)的预制集成电路(10) 。 通过阻挡层(14)与金属(15)分离的电介质材料(12)具有填充有金属(15)的开口(13)。 通过第一化学机械抛光步骤去除开口(13)外部的金属(15)的部分,其优先移除金属(15)以局部暴露阻挡层(14)。 通过第二化学机械抛光步骤去除局部暴露的阻挡层(14)的部分,其优先去除阻挡层(14)。 根据本发明,在进行了第二化学机械抛光步骤之后,重复第一化学机械抛光步骤。 该装置能够执行该方法。 计算机程序能够控制方法。