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1. 发明申请

US20150035087A1 Method for Manufacturing Dummy Gate in Gate-Last Process and Dummy Gate in Gate-Last Process 有权
标题翻译：闸门最后过程中虚拟门制造方法及闸门最后过程中虚拟门的制作方法
公开(公告)号：US20150035087A1
公开(公告)日：2015-02-05
申请号：US14119864
申请日：2012-12-12
申请人： Chunlong Li , Junfeng Li , Jiang Yan , Chao Zhao
发明人： Chunlong Li , Junfeng Li , Jiang Yan , Chao Zhao
IPC分类号： H01L29/66 , H01L29/51 , H01L29/423
CPC分类号： H01L29/66545 , H01L21/28123 , H01L29/42364 , H01L29/513 , H01L29/518
摘要： A method for manufacturing a dummy gate in a gate-last process and a dummy gate in a gate-last process are provided. The method includes: providing a semiconductor substrate; growing a gate oxide layer on the semiconductor substrate; depositing bottom-layer amorphous silicon on the gate oxide layer; depositing an ONO structured hard mask on the bottom-layer amorphous silicon; depositing top-layer amorphous silicon on the ONO structured hard mask; depositing a hard mask layer on the top-layer amorphous silicon; forming photoresist lines on the hard mask layer, and trimming the formed photoresist lines so that the trimmed photoresist lines a width less than or equal to 22 nm; and etching the hard mask layer, the top-layer amorphous silicon, the ONO structured hard mask and the bottom-layer amorphous silicon in accordance with the trimmed photoresist lines, and removing the photoresist lines, the hard mask layer and the top-layer amorphous silicon.
摘要翻译：提供了一种在门最后处理中制造伪栅极的方法和在栅极最后工艺中的伪栅极。该方法包括：提供半导体衬底; 在半导体衬底上生长栅极氧化层; 在栅极氧化物层上沉积底层非晶硅; 在底层非晶硅上沉积ONO结构的硬掩模; 在ONO结构化的硬掩模上沉积顶层非晶硅; 在顶层非晶硅上沉积硬掩模层; 在硬掩模层上形成光致抗蚀剂线，并修整所形成的光致抗蚀剂线，使得修整的光致抗蚀剂线的宽度小于或等于22nm; 并根据修整的光致抗蚀剂线蚀刻硬掩模层，顶层非晶硅，ONO结构的硬掩模和底层非晶硅，并除去光致抗蚀剂线，硬掩模层和顶层无定形硅。

2. 发明申请

US20140332958A1 Method for Manufacturing Dummy Gate in Gate-Last Process and Dummy Gate in Gate-Last Process 有权
标题翻译：闸门最后过程中虚拟门制造方法及闸门最后过程中虚拟门的制作方法
公开(公告)号：US20140332958A1
公开(公告)日：2014-11-13
申请号：US14119862
申请日：2012-12-12
申请人： Chunlong Li , Junfeng Li , Jiang Yan , Chao Zhao
发明人： Chunlong Li , Junfeng Li , Jiang Yan , Chao Zhao
IPC分类号： H01L29/66 , H01L29/423 , H01L29/78 , H01L21/28
CPC分类号： H01L29/66545 , H01L21/2807 , H01L21/28123 , H01L29/4232 , H01L29/78
摘要： A method for manufacturing a dummy gate in a gate-last process is provided. The method includes: providing a semiconductor substrate; growing a gate oxide layer on the semiconductor substrate; depositing bottom-layer amorphous silicon on the gate oxide layer; depositing an ONO structured hard mask on the bottom-layer amorphous silicon; depositing top-layer amorphous silicon on the ONO structured hard mask; depositing a hard mask layer on the top-layer amorphous silicon; forming photoresist lines having a width ranging from 32 nm to 45 nm on the hard mask layer; and etching the hard mask layer, the top-layer amorphous silicon, the ONO structured hard mask and the bottom-layer amorphous silicon in accordance with the photoresist lines, and removing the photoresist lines, the hard mask layer and the top-layer α-Si. Correspondingly, a dummy gate in a gate-last process is also provided.
摘要翻译：提供了一种在门最后工艺中制造虚拟栅极的方法。该方法包括：提供半导体衬底; 在半导体衬底上生长栅极氧化层; 在栅极氧化物层上沉积底层非晶硅; 在底层非晶硅上沉积ONO结构的硬掩模; 在ONO结构化的硬掩模上沉积顶层非晶硅; 在顶层非晶硅上沉积硬掩模层; 在硬掩模层上形成宽度范围为32nm至45nm的光致抗蚀剂线; 根据光致抗蚀剂线蚀刻硬掩模层，顶层非晶硅，ONO结构的硬掩模和底层非晶硅，并除去光致抗蚀剂线，硬掩模层和顶层α- Si。相应地，还提供了最后进程中的虚拟门。

3. 发明授权

US08703567B2 Method for manufacturing a semiconductor device 有权
标题翻译：半导体器件的制造方法
公开(公告)号：US08703567B2
公开(公告)日：2014-04-22
申请号：US13497744
申请日：2011-11-29
申请人： Guilei Wang , Chunlong Li , Chao Zhao
发明人： Guilei Wang , Chunlong Li , Chao Zhao
IPC分类号： H01L21/336
CPC分类号： H01L29/1054 , H01L29/66651 , H01L29/7833
摘要： The present invention discloses a method for manufacturing a semiconductor device, comprising: forming an insulating isolation layer on a substrate; forming an insulating isolation layer trench in the insulating isolation layer; forming an active region layer in the insulating isolation layer trench; forming a semiconductor device structure in and above the active region layer; characterized in that the carrier mobility of the active region layer is higher than that of the substrate. Said active region is formed of a material different from that of the substrate, the carrier mobility in the channel region is enhanced, thereby the device response speed is improved and the device performance is enhanced. Unlike the existing STI manufacturing process, for the present invention, an STI is formed first, and then filling is performed to form an active region, thus avoiding the problem of generation of holes in STI, and improving the device reliability.
摘要翻译：本发明公开了一种制造半导体器件的方法，包括：在衬底上形成绝缘隔离层; 在绝缘隔离层中形成绝缘隔离层沟槽; 在绝缘隔离层沟槽中形成有源区; 在有源区域层中形成半导体器件结构; 其特征在于，有源区层的载流子迁移率高于基板的载流子迁移率。所述有源区由不同于衬底的材料形成，通道区域中的载流子迁移率增强，从而提高了器件响应速度并提高了器件性能。与现有的STI制造方法不同，对于本发明，首先形成STI，然后进行填充以形成有源区，从而避免STI中产生孔的问题，并提高器件的可靠性。

4. 发明申请

US20120270165A1 HEATING METHOD FOR MAINTAINING A STABLE THERMAL BUDGET 有权
标题翻译：维持稳定的热预算的加热方法
公开(公告)号：US20120270165A1
公开(公告)日：2012-10-25
申请号：US13379242
申请日：2011-08-09
申请人： Chunlong Li
发明人： Chunlong Li
IPC分类号： F27D9/00
CPC分类号： H01L21/28211 , H01L21/324
摘要： The present invention discloses a heating method for maintaining a stable thermal budget. By following the primary procedure with a virtual procedure in such a manner that the total duration of the whole heating process remains constant, it is beneficial to maintain a stable thermal budget and further to maintain a stable device performance.
摘要翻译：本发明公开了一种用于保持稳定的热预算的加热方法。通过遵循具有虚拟过程的主要过程，使得整个加热过程的总持续时间保持恒定，维持稳定的热预算以及进一步维持稳定的设备性能是有益的。

5. 发明申请

US20080314418A1 Method and System for Furnace Cleaning 审中-公开
标题翻译：炉清洗方法与系统
公开(公告)号：US20080314418A1
公开(公告)日：2008-12-25
申请号：US12134441
申请日：2008-06-06
申请人： Xing Zhao , Hai Song , Chunlong Li , Xiaoli Chen
发明人： Xing Zhao , Hai Song , Chunlong Li , Xiaoli Chen
IPC分类号： B08B3/04
CPC分类号： B08B9/08 , B08B3/04 , B08B9/00 , C23C16/4405 , F27B17/0025 , F27D7/02 , F27D17/004
摘要： The present invention provides a method and a system for cleaning furnace, including the steps of introducing a nitrogen gas flow into a cleaning agent tank to carry the cleaning agent, introducing the nitrogen gas carrying the cleaning agent into the furnace via a pipeline to clean the furnace; and generating a steam by mixing and igniting a hydrogen gas flow and an oxygen gas flow, and then introducing the steam into the furnace to clean the furnace. The method for cleaning furnace according to the invention can effectively remove metal and non-metal impurities deposits in a furnace of semiconductor oxidation furnace equipment.
摘要翻译：本发明提供了一种清洗炉的方法和系统，其特征在于包括以下步骤：将氮气流引入清洗剂罐中以携带清洗剂，通过管道将携带清洁剂的氮气引入炉中以清洁炉; 并通过混合和点燃氢气流和氧气流产生蒸汽，然后将蒸汽引入炉中以清洁炉。根据本发明的清洗炉的方法可以有效地去除半导体氧化炉设备炉中的金属和非金属杂质沉积物。

6. 发明申请

US20130105859A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
标题翻译：半导体器件及其制造方法
公开(公告)号：US20130105859A1
公开(公告)日：2013-05-02
申请号：US13582432
申请日：2011-11-28
申请人： Guilei Wang , Chunlong Li , Chao Zhao
发明人： Guilei Wang , Chunlong Li , Chao Zhao
IPC分类号： H01L29/78 , H01L29/16 , H01L29/20 , H01L21/02
CPC分类号： H01L29/78 , H01L21/02532 , H01L21/28264 , H01L21/823807 , H01L21/8258 , H01L29/16 , H01L29/2003 , H01L29/51 , H01L29/7833
摘要： The present invention discloses a semiconductor device, comprising: a substrate, an insulating isolation layer formed on the substrate, a first active region layer and a second active region layer formed in the insulating isolation layer, characterized in that the carrier mobility of the first active region layer and/or second active region layer is higher than that of the substrate. In accordance with the semiconductor device and the manufacturing method thereof in the present invention, an active region formed of a material different from that of the substrate is used, the carrier mobility in the channel region is enhanced, thereby the device response speed is substantially improved and the device performance is enhanced greatly. Furthermore, unlike the existing STI manufacturing process, for the present invention, an STI is formed first, and then filling is performed to form an active region, thus avoiding the problem of generation of holes in STI, and improving the device reliability.
摘要翻译：本发明公开了一种半导体器件，包括：衬底，形成在衬底上的绝缘隔离层，形成在绝缘隔离层中的第一有源区和第二有源区，其特征在于，第一有源区区域层和/或第二有源区层比衬底高。根据本发明的半导体器件及其制造方法，使用由与衬底不同的材料形成的有源区，增加沟道区中的载流子迁移率，从而显着改善器件响应速度设备性能大大提升。此外，与现有的STI制造方法不同，对于本发明，首先形成STI，然后进行填充以形成有源区，从而避免STI中产生孔的问题，并提高器件的可靠性。

7. 发明授权

US09419095B2 Method for manufacturing dummy gate in gate-last process and dummy gate in gate-last process 有权
标题翻译：最后一个进程中的伪栅极的制造方法和栅极最后工艺中的虚拟栅极的制造方法
公开(公告)号：US09419095B2
公开(公告)日：2016-08-16
申请号：US14119864
申请日：2012-12-12
申请人： Chunlong Li , Junfeng Li , Jiang Yan , Chao Zhao
发明人： Chunlong Li , Junfeng Li , Jiang Yan , Chao Zhao
IPC分类号： H01L21/338 , H01L29/66 , H01L29/423 , H01L29/51 , H01L21/28
CPC分类号： H01L29/66545 , H01L21/28123 , H01L29/42364 , H01L29/513 , H01L29/518
摘要： A method for manufacturing a dummy gate in a gate-last process and a dummy gate in a gate-last process are provided. The method includes: providing a semiconductor substrate; growing a gate oxide layer on the semiconductor substrate; depositing bottom-layer amorphous silicon on the gate oxide layer; depositing an ONO structured hard mask on the bottom-layer amorphous silicon; depositing top-layer amorphous silicon on the ONO structured hard mask; depositing a hard mask layer on the top-layer amorphous silicon; forming photoresist lines on the hard mask layer, and trimming the formed photoresist lines so that the trimmed photoresist lines a width less than or equal to 22 nm; and etching the hard mask layer, the top-layer amorphous silicon, the ONO structured hard mask and the bottom-layer amorphous silicon in accordance with the trimmed photoresist lines, and removing the photoresist lines, the hard mask layer and the top-layer amorphous silicon.
摘要翻译：提供了一种在门最后处理中制造伪栅极的方法和在栅极最后工艺中的伪栅极。该方法包括：提供半导体衬底; 在半导体衬底上生长栅极氧化层; 在栅极氧化物层上沉积底层非晶硅; 在底层非晶硅上沉积ONO结构的硬掩模; 在ONO结构化的硬掩模上沉积顶层非晶硅; 在顶层非晶硅上沉积硬掩模层; 在硬掩模层上形成光致抗蚀剂线，并修整所形成的光致抗蚀剂线，使得修整的光致抗蚀剂线的宽度小于或等于22nm; 并根据修整的光致抗蚀剂线蚀刻硬掩模层，顶层非晶硅，ONO结构的硬掩模和底层非晶硅，并除去光致抗蚀剂线，硬掩模层和顶层无定形硅。

8. 发明申请

US20120319215A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
标题翻译：半导体器件及其制造方法
公开(公告)号：US20120319215A1
公开(公告)日：2012-12-20
申请号：US13497744
申请日：2011-11-29
申请人： Guilei Wang , Chunlong Li , Chao Zhao
发明人： Guilei Wang , Chunlong Li , Chao Zhao
IPC分类号： H01L29/78 , H01L21/336
CPC分类号： H01L29/1054 , H01L29/66651 , H01L29/7833
摘要： The present invention discloses a semiconductor device and method of manufacturing the same, comprising: forming an insulating isolation layer on a substrate; forming an insulating isolation layer trench in the insulating isolation layer; forming an active region layer in the insulating isolation layer trench; and forming a semiconductor device structure in and above the active region layer, wherein the carrier mobility of the active region layer is higher than that of the substrate. In accordance with the semiconductor device and the manufacturing method thereof in the present invention, an active region formed of a material different from that of the substrate is used, the carrier mobility in the channel region is enhanced, thereby the device response speed is substantially improved and the device performance is enhanced greatly. Furthermore, unlike the existing STI manufacturing process, in the present invention a STI is formed first, and then filling is performed to form an active region, to avoid the problem of generation of holes in the STI and improve the device reliability.
摘要翻译：本发明公开了一种半导体器件及其制造方法，包括：在衬底上形成绝缘隔离层; 在绝缘隔离层中形成绝缘隔离层沟槽; 在绝缘隔离层沟槽中形成有源区; 以及在所述有源区域层中和之上形成半导体器件结构，其中所述有源区域层的载流子迁移率高于所述衬底的载流子迁移率。根据本发明的半导体器件及其制造方法，使用由与衬底不同的材料形成的有源区域，增加沟道区域中的载流子迁移率，从而显着提高器件响应速度设备性能大大提升。此外，与现有的STI制造方法不同，在本发明中，首先形成STI，然后进行填充以形成有源区，以避免在STI中产生孔的问题，并提高器件的可靠性。

9. 发明申请

US20120252225A1 SEMICONDUCTOR FABRICATION METHOD 审中-公开
标题翻译：半导体制造方法
公开(公告)号：US20120252225A1
公开(公告)日：2012-10-04
申请号：US13140549
申请日：2011-04-11
申请人： Chunlong Li , Junfeng Li
发明人： Chunlong Li , Junfeng Li
IPC分类号： H01L21/316 , B82Y40/00
CPC分类号： H01L21/02238
摘要： A semiconductor fabrication method is provided, in which a protective layer is deposited on the dummy wafer such that the protective layer fully encases the dummy wafer. Therefore, the dummy wafer will not be oxidized during thermal oxidation, thereby reducing dummy wafer consumption, decreasing production cost, avoiding particulate matter produced due to oxidation of the dummy wafer, and preventing the wafer to be oxidized from contamination.
摘要翻译：提供一种半导体制造方法，其中保护层沉积在伪晶片上，使得保护层完全包住虚设晶片。因此，在热氧化期间，伪晶片不会被氧化，从而减少了虚设晶片消耗，降低了生产成本，避免了由于虚设晶片的氧化而产生的颗粒物质，并且防止晶片被污染而被氧化。

10. 发明授权

US08926321B2 Heating method for maintaining a stable thermal budget 有权
标题翻译：用于维持稳定的热预算的加热方法
公开(公告)号：US08926321B2
公开(公告)日：2015-01-06
申请号：US13379242
申请日：2011-08-09
申请人： Chunlong Li
发明人： Chunlong Li
IPC分类号： H01L21/30 , H01L21/28 , H01L21/324
CPC分类号： H01L21/28211 , H01L21/324
摘要： The present invention discloses a heating method for maintaining a stable thermal budget. By following the primary procedure with a virtual procedure in such a manner that the total duration of the whole heating process remains constant, it is beneficial to maintain a stable thermal budget and further to maintain a stable device performance.
摘要翻译：本发明公开了一种用于保持稳定的热预算的加热方法。通过遵循具有虚拟过程的主要过程，使得整个加热过程的总持续时间保持恒定，维持稳定的热预算以及进一步维持稳定的设备性能是有益的。

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