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    • 84. 发明授权
    • Exposure apparatus, exposure method, and method for producing device
    • 曝光装置,曝光方法和制造装置的方法
    • US08130361B2
    • 2012-03-06
    • US11399537
    • 2006-04-07
    • Masahiko YasudaTakahiro MasadaYuho KanayaTadashi NagayamaKenichi Shiraishi
    • Masahiko YasudaTakahiro MasadaYuho KanayaTadashi NagayamaKenichi Shiraishi
    • G03B27/42G03B27/52
    • G03F7/70341G03F7/70141G03F7/70716G03F9/7088
    • An exposure apparatus includes a substrate stage movable while holding a substrate, a substrate alignment system which detects an alignment mark (1) on the substrate held by the substrate stage and detects a reference mark (PFM) provided on the substrate stage, and a mask alignment system which detects, via a projection optical system, a reference mark (MFM) provided on the substrate stage. The reference mark (PFM) on the substrate stage is detected without a liquid by using the substrate alignment system, and the reference mark (MFM) on the substrate stage is detected using the mask alignment system via the projection optical system and the liquid. Then, a positional relationship between a detection reference position of the substrate alignment system and a projection position of an image of a pattern is obtained, thereby accurately performing alignment processing in the liquid immersion exposure.
    • 一种曝光装置,包括:在保持基板的同时可移动的基板台;基板对准系统,其检测由基板台保持的基板上的对准标记(1),并检测设置在基板台上的基准标记(PFM);以及掩模 对准系统,其经由投影光学系统检测设置在基板台上的参考标记(MFM)。 通过使用衬底对准系统,无需液体检测衬底台上的参考标记(PFM),并且通过投影光学系统和液体使用掩模对准系统检测衬底台上的参考标记(MFM)。 然后,获得基板对准系统的检测基准位置与图案的图像的投影位置之间的位置关系,从而在液浸曝光中精确地进行取向处理。