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    • 52. 发明专利
    • System and method for euv light source measurement
    • 用于EUV光源测量的系统和方法
    • JP2012054580A
    • 2012-03-15
    • JP2011228554
    • 2011-10-18
    • Cymer Incサイマー インコーポレイテッド
    • FOMENKOV IGOR VBOWERING NORBERT LHOFFMAN JERZY R
    • H01L21/027G01J1/02G01J1/42
    • G03F7/7085B82Y10/00G21K2201/061
    • PROBLEM TO BE SOLVED: To provide a measurement apparatus for an extreme ultraviolet (EUV) light source.SOLUTION: A system and method for "EUV light source" measurement are provided. In a first mode, a system for measuring an EUV light source power output includes a photoelectron raw material arranged along an EUV path, and the material is caused to be exposed for generating photoelectron in a curtain amount. The system, further, may include a detector which detects the photoelectron for generating an output representing EUV power. In another mode, the system for measuring EUV light intensity includes a multilayer mirror, for example Mo/Si, which can be arranged along the EUV light path, and can cause the mirror to be exposed for generating an optical current at the mirror. A current monitor can be connected to the mirror to measure the optical current to generate an output representing the EUV power. Further, in other mode, an off-line EUV measurement system can include an instrument for measuring an optical characteristic as well as an MoSi/Si multilayer mirror.
    • 要解决的问题:提供一种用于极紫外(EUV)光源的测量装置。 解决方案:提供了“EUV光源”测量的系统和方法。 在第一模式中,用于测量EUV光源功率输出的系统包括沿着EUV路径布置的光电子原料,并且使该材料暴露以产生帘光量的光电子。 该系统还可以包括检测器,其检测光电子以产生表示EUV功率的输出。 在另一种模式中,用于测量EUV光强度的系统包括多层反射镜,例如可沿着EUV光路布置的Mo / Si,并且可以使反射镜暴露以在反射镜处产生光电流。 可以将电流监视器连接到反射镜以测量光电流以产生表示EUV功率的输出。 此外,在其他模式中,离线EUV测量系统可以包括用于测量光学特性的仪器以及MoSi 2 / SB / Si多层反射镜。 版权所有(C)2012,JPO&INPIT
    • 53. 发明专利
    • Collector for euv light source
    • EUV光源收集器
    • JP2011181935A
    • 2011-09-15
    • JP2011062167
    • 2011-03-22
    • Cymer Incサイマー インコーポレイテッド
    • PARTLO WILLIAM NALGOTS J MARTINBLUMENSTOCK GERRY MBOWERING NORBERTERSHOV ALEXANDER IFOMENKOV IGOR VPAN XIAOJIANG J
    • H01L21/027G02B5/10G03F7/20G21K1/06H01L21/304H05G2/00
    • PROBLEM TO BE SOLVED: To provide a method and an apparatus for removing debris from a reflecting surface of an EUV (Extreme ultraviolet) collector in an EUV light source. SOLUTION: A current source (DC voltage source) 220 may be connected to a collector mirror 150, a metallic backing material (aluminum or nickel) for the mirror 150. The mirror 150 may be heated to a temperature higher than the temperature of ambient gas (helium gas) filling the inside of a chamber 26. In another aspect of debris cleaning, introduction of RF from an antenna schematically shown by an RF frequency voltage 230 and 232 in the chamber 26 may be incorporated. The RF may be connected to the mirror 150 or the metallic backing material, and in this case, a dark shield made of an appropriate conductive material and connected to the earth potential may be formed by covering the back face of the collector mirror 150, and is separated from the mirror by an insulator (air gap) and a voltage (DC from the DC power source 220 connected to the mirror 150 as well). COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种在EUV光源中从EUV(极紫外)捕集器的反射表面去除碎屑的方法和装置。 解决方案:电流源(DC电压源)220可以连接到收集器反射镜150,用于反射镜150的金属背衬材料(铝或镍)。反射镜150可以被加热到高于温度 环境气体(氦气)填充在室26的内部。在碎片清洁的另一方面,可以并入从RF 26电压230和232中示意性地示出的天线引入RF。 RF可以连接到反射镜150或金属背衬材料,并且在这种情况下,可以通过覆盖收集镜150的背面形成由适当的导电材料制成并连接到地电位的暗屏蔽, 通过绝缘体(气隙)和电压(也连接到反射镜150的直流电源220的DC)与反射镜分离。 版权所有(C)2011,JPO&INPIT
    • 54. 发明专利
    • Laser system
    • 激光系统
    • JP2011176358A
    • 2011-09-08
    • JP2011106816
    • 2011-05-12
    • Cymer Incサイマー インコーポレイテッド
    • ERSHOV ALEXANDER IPARTLO WILLIAM NBROWN DANIEL J WFOMENKOV IGOR VBERGSTEDT ROBERT ASANDSTROM RICHARD LLALOVIC IVAN
    • H01S3/23H01S3/225
    • H01S3/225G03F7/70583H01S3/005H01S3/0057H01S3/03H01S3/034H01S3/08036H01S3/08059H01S3/10092H01S3/105H01S3/2251H01S3/2333
    • PROBLEM TO BE SOLVED: To provide a high electric power gas discharge laser system for a DUV light source. SOLUTION: A method and apparatus may include a line narrowed pulsed excimer or molecular fluorine gas discharge laser system which may include a seed laser oscillator producing an output including a pulsed laser output light beam and which may include a first gas discharge excimer or a molecular fluorine laser chamber and a line narrowing module within a first oscillator cavity; and a laser amplification stage which contains an amplifying gain medium in a second gas discharge excimer or molecular fluorine laser chamber receiving the output of the seed laser oscillator and amplifying the output of the seed laser oscillator to form a laser system output including a pulsed laser output light beam, and which may include a ring power amplification stage wherein the output of the seed laser oscillator passes through the amplifying gain medium of the ring power amplification stage at least two times per loop. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:为DUV光源提供高功率气体放电激光系统。 解决方案:方法和装置可以包括线变窄的脉冲准分子或分子氟气体放电激光系统,其可以包括产生包括脉冲激光输出光束的输出的种子激光振荡器,并且可以包括第一气体放电准分子或 分子氟激光室和第一振荡器腔内的线窄模块; 以及激光放大级,其在第二气体放电准分子或分子氟激光室中含有放大增益介质,其接收种子激光振荡器的输出并放大种子激光振荡器的输出,以形成包括脉冲激光输出的激光系统输出 光束,并且其可以包括环形功率放大级,其中种子激光振荡器的输出通过环形功率放大级的放大增益介质每循环至少两次。 版权所有(C)2011,JPO&INPIT
    • 60. 发明专利
    • Laser output beam wavefront splitter for bandwidth spectrum control
    • 激光输出波束分波器用于带宽频谱控制
    • JP2013214772A
    • 2013-10-17
    • JP2013145759
    • 2013-07-11
    • Cymer Incサイマー インコーポレイテッド
    • RICHARD L SANDSTROMDANIEL J W BROWNERSHOV ALEXANDER IFOMENKOV IGOR VPARTLO WILLIAM N
    • H01S3/136G03F7/20H01S3/08H01S3/097H01S3/10H01S3/1055H01S3/13H01S3/139H01S3/22
    • H01S3/0812G03F7/70025G03F7/70575H01S3/08059H01S3/097H01S3/1055H01S3/1305
    • PROBLEM TO BE SOLVED: To provide light sources for integrated circuit lithography illumination sources requiring spectrum processing within a pulse or from pulse to pulse within a burst.SOLUTION: An embodiment comprises: a dispersive bandwidth selection optic selecting at least one center wavelength for each pulse determined at least in part by the angle of incidence of the laser light pulse beam containing the corresponding pulse on a dispersive wavelength selection optic; and a tuning mechanism operative to select at least one angle of incidence of the laser light pulse beam containing the corresponding pulse on the dispersive center wavelength selection optic, the tuning mechanism comprising a plurality of incidence angle selection elements each defining an angle of incidence for a different spatially separated but not temporally separated portion of the laser light pulse to return from the dispersive center wavelength selection optic a laser light pulse comprising a plurality of spatially separated but not temporally separated portions, each portion having one of at least two different selected center wavelengths.
    • 要解决的问题:为集成电路光刻照明源提供光源,其需要脉冲内的频谱处理或在脉冲内的脉冲或脉冲之间。解决方案:实施例包括:色散带宽选择光学器件,用于为每个脉冲选择至少一个中心波长 至少部分地由分散波长选择光学器件上包含相应脉冲的激光束的入射角确定; 以及调谐机构,用于选择在分散中心波长选择光学器件上包含相应脉冲的激光束的至少一个入射角,所述调谐机构包括多个入射角选择元件,每个入射角选择元件限定入射角 激光光脉冲的不同的空间分离但不是时间上分离的部分从分散中心波长选择光学器件返回包括多个空间上分离但不时间分离的部分的激光脉冲,每个部分具有至少两个不同的选定中心波长中的一个 。