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    • 1. 发明专利
    • Collector for euv light source
    • EUV光源收集器
    • JP2011181935A
    • 2011-09-15
    • JP2011062167
    • 2011-03-22
    • Cymer Incサイマー インコーポレイテッド
    • PARTLO WILLIAM NALGOTS J MARTINBLUMENSTOCK GERRY MBOWERING NORBERTERSHOV ALEXANDER IFOMENKOV IGOR VPAN XIAOJIANG J
    • H01L21/027G02B5/10G03F7/20G21K1/06H01L21/304H05G2/00
    • PROBLEM TO BE SOLVED: To provide a method and an apparatus for removing debris from a reflecting surface of an EUV (Extreme ultraviolet) collector in an EUV light source. SOLUTION: A current source (DC voltage source) 220 may be connected to a collector mirror 150, a metallic backing material (aluminum or nickel) for the mirror 150. The mirror 150 may be heated to a temperature higher than the temperature of ambient gas (helium gas) filling the inside of a chamber 26. In another aspect of debris cleaning, introduction of RF from an antenna schematically shown by an RF frequency voltage 230 and 232 in the chamber 26 may be incorporated. The RF may be connected to the mirror 150 or the metallic backing material, and in this case, a dark shield made of an appropriate conductive material and connected to the earth potential may be formed by covering the back face of the collector mirror 150, and is separated from the mirror by an insulator (air gap) and a voltage (DC from the DC power source 220 connected to the mirror 150 as well). COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种在EUV光源中从EUV(极紫外)捕集器的反射表面去除碎屑的方法和装置。 解决方案:电流源(DC电压源)220可以连接到收集器反射镜150,用于反射镜150的金属背衬材料(铝或镍)。反射镜150可以被加热到高于温度 环境气体(氦气)填充在室26的内部。在碎片清洁的另一方面,可以并入从RF 26电压230和232中示意性地示出的天线引入RF。 RF可以连接到反射镜150或金属背衬材料,并且在这种情况下,可以通过覆盖收集镜150的背面形成由适当的导电材料制成并连接到地电位的暗屏蔽, 通过绝缘体(气隙)和电压(也连接到反射镜150的直流电源220的DC)与反射镜分离。 版权所有(C)2011,JPO&INPIT
    • 3. 发明申请
    • HIGH POWER HIGH PULSE REPETITION RATE GAS DISCHARGE LASER SYSTEM BANDWIDTH MANAGEMENT
    • 高功率高脉冲重复率气体放电激光系统带宽管理
    • WO2006060359A3
    • 2009-04-16
    • PCT/US2005043055
    • 2005-11-28
    • CYMER INCSANDSTROM RICHARD LPARTLO WILLIAM NBROWN DANIEL J WALGOTS J MARTINTRINTCHOUK FEDOR
    • SANDSTROM RICHARD LPARTLO WILLIAM NBROWN DANIEL J WALGOTS J MARTINTRINTCHOUK FEDOR
    • G02B5/04H01S3/08
    • H01S3/08009H01S3/08031H01S3/08059H01S3/097H01S3/1055
    • A line narrowing apparatus and method for a narrow band DUV high power high repetition rate gas discharge laser producing output laser light pulse beam pulses in bursts of pulses is disclosed, which may comprise a dispersive center wavelength selection optic contained within a line narrowing module, selecting at least one center wavelength for each pulse determined at least in part by the angle of incidence of the laser light pulse beam containing the respective pulse on a dispersive wavelength selection optic dispersive surface; a first dispersive optic bending mechanism operatively connected to the dispersive center wavelength selection optic and operative to change the curvature of the dispersive surface in a first manner; and, a second dispersive optic bending mechanism operatively connected to the dispersive center wavelength selection optic and operative to change the curvature of the dispersive surface in a second manner. The first manner may modify a first measure of bandwidth and the second manner may modify a second measure of bandwidth such that the ratio of the first measure to the second measure substantially changes. The first measure may be a spectrum width at a selected percentage of the spectrum peak value (FWX%M) and the second measure may be width within which some selected percentage of the spectral intensity is contained (EX%). The first dispersive optic bending mechanism may change the curvature of the dispersive surface in a first dimension and the second in a second dimension generally orthogonal to the first dimension. The laser system may comprise a beam path insert comprising a material having an different index of refraction and an index of refraction thermal gradient opposite from that of a neighboring optical element. The first dispersive optic bending mechanism may change the curvature of the dispersive surface in a first dimension and the second a second dimension generally parallel to the first dimension. An optical beam twisting element in the lasing cavity may optically twist the laser light pulse beam to present a twisted wavefront to the dispersive center wavelength selection optic. Bending may change the curvature and wavelength selection, e.g., in a burst may create two center wavelength peaks to select FWX%M and EX% independently.
    • 公开了一种用于窄带DUV大功率高重复率气体放电激光器的脉冲串产生输出激光脉冲束脉冲的线窄化装置和方法,其可以包括包含在线窄模块内的分散中心波长选择光学器件,选择 用于每个脉冲的至少一个中心波长至少部分地由包含分散波长选择光学色散表面上的各个脉冲的激光束的入射角确定; 第一分散光学弯曲机构,其可操作地连接到所述分散中心波长选择光学器件并且以第一方式改变所述分散表面的曲率; 以及第二分散光学弯曲机构,其可操作地连接到所述分散中心波长选择光学器件并且以第二方式改变所述色散表面的曲率。 第一种方式可以修改第一带宽度量,并且第二种方式可以修改第二带宽度量,使得第一测量与第二测量的比率基本上改变。 第一测量可以是频谱峰值(FWX%M)的选定百分比处的频谱宽度,第二测量可以是包含光谱强度的某些选定百分比(EX%)的宽度。 第一分散光学弯曲机构可以在第一维度上改变分散表面的曲率,而第二维度可以大致垂直于第一维度改变。 激光系统可以包括光束路径插入件,其包括具有不同折射率的材料和与相邻光学元件的折射率相反的折射热梯度。 第一分散光学弯曲机构可以改变分散表面在第一尺寸中的曲率,而第二分散光学弯曲机构的第二尺寸大体上平行于第一尺寸。 激光腔中的光束加捻元件可以光学地扭转激光脉冲光束,以将扭曲的波前呈现到分散中心波长选择光学器件。 弯曲可以改变曲率和波长选择,例如,在脉冲串中可以产生两个中心波长峰值,以独立地选择FWX%M和EX%。