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    • 44. 发明授权
    • Three device BICMOS gain cell
    • 三器件BICMOS增益单元
    • US5909400A
    • 1999-06-01
    • US917630
    • 1997-08-22
    • Claude Louis BertinJohn Atkinson FifieldRussell J. HoughtonChristopher P. MillerWilliam R. Tonti
    • Claude Louis BertinJohn Atkinson FifieldRussell J. HoughtonChristopher P. MillerWilliam R. Tonti
    • G11C11/405G11C11/406G11C11/34
    • G11C11/406G11C11/405
    • A nondestructive read, three device BICMOS gain cell for a DRAM memory having two FETs and one bipolar device. The gain cell has an improved access time (less latency), can operate for longer periods of time before a refresh operation is required, requires a smaller storage capacitance than a traditional DRAM cell, and can be produced commercially at lower costs than are presently available. In a preferred embodiment, the gain cell comprises an n channel metal oxide semiconductor field effect write transistor having its gate connected to a write word line WLw. Its drain is connected to a storage node Vs having a storage capacitance Cs associated therewith, and its source is connected to a write bit line BLw. An n channel metal oxide semiconductor field effect read transistor has its gate connected to the storage node Vs and its source connected to a read word line WLr. A PNP transistor has its base connected to the drain of the read transistor and its emitter connected to a read bit line BLr. A second embodiment is constructed with p channel FETs and an NPN transistor.
    • 具有两个FET和一个双极器件的DRAM存储器的非破坏性读取,三器件BICMOS增益单元。 增益单元具有改进的访问时间(更低的延迟),可以在需要刷新操作之前更长时间地操作,需要比传统DRAM单元更小的存储电容,并且可以以比目前可用的更低的成本在商业上生产 。 在优选实施例中,增益单元包括其栅极连接到写入字线WLw的n沟道金属氧化物半导体场效应写入晶体管。 其漏极连接到具有与其相关联的存储电容Cs的存储节点Vs,并且其源极连接到写入位线BLw。 n沟道金属氧化物半导体场效应读取晶体管的栅极连接到存储节点Vs,其源极连接到读取字线WLr。 PNP晶体管的基极连接到读晶体管的漏极,其发射极连接到读位线BLr。 第二实施例由p沟道FET和NPN晶体管构成。