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    • 7. 发明授权
    • Thermally controlled refractory metal resistor
    • 耐热耐火金属电阻
    • US08592947B2
    • 2013-11-26
    • US12962722
    • 2010-12-08
    • Joseph M. LukaitisDeborah M. MasseyTimothy D. SullivanPing-Chuan WangKimball M. Watson
    • Joseph M. LukaitisDeborah M. MasseyTimothy D. SullivanPing-Chuan WangKimball M. Watson
    • H01L23/36
    • H01L28/20H01L23/3677H01L23/5228H01L27/0211H01L28/24H01L2924/0002H01L2924/00
    • A structure and method of fabricating the structure includes a semiconductor substrate having a top surface defining a horizontal direction and a plurality of interconnect levels stacked from a lowermost level proximate the top surface of the semiconductor substrate to an uppermost level furthest from the top surface. Each of the interconnect levels include vertical metal conductors physically connected to one another in a vertical direction perpendicular to the horizontal direction. The vertical conductors in the lowermost level being physically connected to the top surface of the substrate, and the vertical conductors forming a heat sink connected to the semiconductor substrate. A resistor is included in a layer immediately above the uppermost level. The vertical conductors being aligned under a downward vertical resistor footprint of the resistor, and each interconnect level further include horizontal metal conductors positioned in the horizontal direction and being connected to the vertical conductors.
    • 制造该结构的结构和方法包括:半导体衬底,其具有限定水平方向的顶表面和从最接近半导体衬底的顶表面的最底层到距离顶表面最远的最高水平层叠的多个互连层。 每个互连层包括在垂直于水平方向的垂直方向上彼此物理连接的垂直金属导体。 最底层的垂直导体物理地连接到衬底的顶表面,垂直导体形成连接到半导体衬底的散热片。 一个电阻器被包含在最上层的上方的层中。 垂直导体在电阻器的向下垂直电阻器占位面下对准,并且每个互连级别还包括位于水平方向上并且连接到垂直导体的水平金属导体。