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    • 32. 发明授权
    • Control method of nonvolatile memory device
    • 非易失性存储器件的控制方法
    • US09147492B2
    • 2015-09-29
    • US14546477
    • 2014-11-18
    • Sunil ShimJin-Man HanSang-Wan NamWon-Taeck Jung
    • Sunil ShimJin-Man HanSang-Wan NamWon-Taeck Jung
    • G11C16/00G11C16/34G11C16/10G11C16/16H01L27/115H01L29/792G11C16/14
    • G11C16/3418G11C16/10G11C16/14G11C16/16G11C16/349H01L27/11578H01L27/11582H01L29/7926
    • According to example embodiments, a control method of a nonvolatile memory device, which includes a plurality of memory blocks on a substrate, each memory block including a plurality of sub blocks stacked in a direction perpendicular to the substrate and being configured to be erased independently and each sub block including a plurality of memory cells stacked in the direction perpendicular to the substrate. The control method includes comparing a count value of a first memory block with a reference value, the count value determined according to the number of program, read, or erase operations executed at the first memory block after data is programmed in the first memory block; and if the count value is greater than or equal to the reference value, performing a reprogram operation in which data programmed in first the memory block is read and the read data is programmed in a second memory block.
    • 根据示例性实施例,一种非易失性存储器件的控制方法,其包括在衬底上的多个存储块,每个存储块包括沿垂直于衬底的方向堆叠的多个子块,并且被配置为独立擦除, 每个子块包括在垂直于衬底的方向上堆叠的多个存储单元。 控制方法包括将第一存储块的计数值与参考值进行比较,所述计数值根据在第一存储器块中的数据被编程之后在第一存储器块执行的程序,读取或擦除操作的数量确定; 并且如果所述计数值大于或等于所述参考值,则执行重新编程操作,其中在第一存储器块中编程的数据被读取并且所读取的数据被编程在第二存储器块中。
    • 35. 发明授权
    • Operating method of nonvolatile memory device
    • 非易失性存储器件的操作方法
    • US08576629B2
    • 2013-11-05
    • US13315523
    • 2011-12-09
    • Byeong-In ChoeSunil ShimWoonkyung LeeJaehoon Jang
    • Byeong-In ChoeSunil ShimWoonkyung LeeJaehoon Jang
    • G11C11/34
    • G11C16/10G11C16/0483G11C16/3459H01L27/11582
    • Disclosed is an operating method of a nonvolatile memory device, which includes programming the first selection transistors of the plurality of cell strings and programming the plurality of memory cells of the plurality of cell strings. The programming the first selection transistors comprises supplying a first voltage to a first bit line connected with a first selection transistor to be programmed and a different second voltage to a second bit line connected to a first selection transistor to be program inhibited; turning on the second selection transistors of the plurality of cell strings, and supplying a first program voltage to a selected first selection line among a plurality of first selection lines connected with the first selection transistors and a third voltage to an unselected first selection line among the plurality of first selection lines.
    • 公开了一种非易失性存储器件的操作方法,其包括编程多个单元串中的第一选择晶体管并对多个单元串中的多个存储单元进行编程。 对第一选择晶体管进行编程包括将第一电压提供给与待编程的第一选择晶体管连接的第一位线,以及将不同的第二电压提供给连接到第一选择晶体管的第二位线以被禁止编程; 接通多个单元串中的第二选择晶体管,并将第一编程电压提供给与第一选择晶体管连接的多个第一选择线中的所选择的第一选择线,以及将第三电压提供给未选择的第一选择线 多个第一选择线。
    • 36. 发明申请
    • Operating Methods of Nonvolatile Memory Devices
    • 非易失性存储器件的操作方法
    • US20130182502A1
    • 2013-07-18
    • US13784969
    • 2013-03-05
    • Byeong-in CheoJaehoon JangKihyun KimSunil ShimWoonkyung Lee
    • Byeong-in CheoJaehoon JangKihyun KimSunil ShimWoonkyung Lee
    • G11C16/14G11C7/14
    • G11C16/14G11C7/14G11C16/0483G11C16/10G11C16/16G11C16/30H01L27/11582H01L29/7926
    • Disclosed are methods of operating a nonvolatile memory device which includes a substrate and a plurality of cell strings provided on the substrate, each cell string including a plurality of memory cells stacked in a direction perpendicular to the substrate. The methods may include applying a word line erase voltage to word lines connected to memory cells of the plurality of cell strings; floating ground selection lines connected to ground selection transistors of the plurality of cell strings and string selection lines connected to string selection transistors of the plurality of cell strings; applying a ground voltage to at least one lower dummy word line connected to at least one lower dummy memory cell between memory cells and a ground selection transistor in each of the plurality of cell strings; applying an erase voltage to the substrate; and floating the at least one lower dummy word line after applying of the erase voltage.
    • 公开了一种非易失性存储器件的操作方法,其包括衬底和设置在衬底上的多个单元串,每个单元串包括沿垂直于衬底的方向堆叠的多个存储单元。 所述方法可以包括将字线擦除电压施加到连接到所述多个单元串的存储单元的字线; 连接到多个单元串的接地选择晶体管的浮动接地选择线和连接到多个单元串的串选择晶体管的串选择线; 将至少一个连接到所述多个单元串中的每一个的存储单元之间的至少一个下部虚设存储单元和所述多个单元串中的接地选择晶体管的下虚拟字线施加接地电压; 向基板施加擦除电压; 并且在施加擦除电压之后浮置所述至少一个下部虚拟字线。