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    • 31. 发明授权
    • Scheme to optimize scan chain ordering in designs
    • 优化设计中扫描链排序的方案
    • US07721171B2
    • 2010-05-18
    • US11839648
    • 2007-08-16
    • Mark A. ErleBruce M. FleischerDaniel Lipetz
    • Mark A. ErleBruce M. FleischerDaniel Lipetz
    • G01R31/28
    • G01R31/318591G06F17/505G06F2217/14
    • A method for optimizing a scan chain ordering in circuit designs in an electronic computer-aided design system is provided. The method comprising: creating a schematic representative of a circuit design having a first cell and a second cell, the first cell and the second cell each having latches therein; creating a scan input pin and a scan output pin for each of the latches in the first cell and the second cell on the schematic; generating a first label on the schematic to provide a first wiring arrangement for the latches in the circuit design, the first wiring arrangement identifies a first order to which the scan input of each of the latches is wired to the scan output of another one of the latches; creating a layout representative of the circuit design; generating a first scan chain having a first length on the layout based on the first wiring arrangement; creating a second scan chain from the first scan chain on the layout, the second scan chain having a second length less than the first length of the first scan chain; and generating a second label on the schematic based on the second scan chain, the second label provides a second wiring arrangement for the latches in the circuit design, the second wiring arrangement identifies a second order to which the scan input of each of the latches is wired to the scan output of another one of the latches.
    • 提供了一种在电子计算机辅助设计系统中优化电路设计中的扫描链排序的方法。 该方法包括:创建具有第一单元和第二单元的电路设计的示意图,第一单元和第二单元各自在其中具有锁存器; 为第一个单元中的每个锁存器和原理图上的第二个单元创建扫描输入引脚和扫描输出引脚; 在原理图上产生第一标签以提供用于电路设计中的锁存器的第一布线布置,第一布线布置识别每个锁存器的扫描输入被连接到另一个的另一个的扫描输出的第一顺序 锁存器 创建一个代表电路设计的布局; 基于第一布线布置在布局上产生具有第一长度的第一扫描链; 在所述布局上从所述第一扫描链创建第二扫描链,所述第二扫描链具有小于所述第一扫描链的所述第一长度的第二长度; 并且基于所述第二扫描链在所述原理图上产生第二标签,所述第二标签为所述电路设计中的所述锁存器提供第二布线布置,所述第二布线布置识别每个所述闩锁的扫描输入的第二顺序 连接到另一个锁存器的扫描输出。
    • 33. 发明授权
    • Fast comparator circuit
    • 快速比较电路
    • US5471188A
    • 1995-11-28
    • US320477
    • 1994-10-07
    • Barbara A. ChappellTerry I. ChappellBruce M. FleischerStanley E. Schuster
    • Barbara A. ChappellTerry I. ChappellBruce M. FleischerStanley E. Schuster
    • G06F7/04G06F7/02
    • G06F7/02
    • A fast comparator circuit, including a plurality of first switches operating in parallel. A first data bit from a first data word is input into a first input of each first switch, and a corresponding second data bit from a second data word is respectively input into a second input of each first switch. Each first switch provides a first logic state output when the first data bit matches the corresponding second data bit or a second logic state output when the first data bit does not match the second data bit. A plurality of second switches receive the respective logic state outputs and produce a combined output, indicating an all match or a mismatch, to a third switch combination connected to a first branch node and a second branch node to create a first voltage difference between the first and second branch nodes when an all match output results and a second voltage difference between the first and second branch node when a mismatch output results. A sense amplifier operates to amplify the voltage differentials that develope due to an imbalance caused in the conductance at the two branch nodes.
    • 一种快速比较器电路,包括并行操作的多个第一开关。 来自第一数据字的第一数据位被输入到每个第一开关的第一输入端,并且来自第二数据字的对应的第二数据位分别输入到每个第一开关的第二输入端。 当第一数据位与第二数据位匹配时,每个第一开关提供第一逻辑状态输出,或者当第一数据位与第二数据位不匹配时提供第二逻辑状态输出。 多个第二开关接收相应的逻辑状态输出并产生指示全部匹配或不匹配的组合输出到连接到第一分支节点和第二分支节点的第三开关组合,以在第一和第二分支节点之间产生第一电压差 以及当匹配输出结果时,第二分支节点和第一和第二分支节点之间的第二电压差得到结果。 感测放大器用于放大由于在两个分支节点处的电导引起的不平衡而发展的电压差。
    • 36. 发明申请
    • Automated Critical Area Allocation in a Physical Synthesized Hierarchical Design
    • 物理综合分层设计中的自动关键区域分配
    • US20100218155A1
    • 2010-08-26
    • US12394035
    • 2009-02-26
    • Bruce M. FleischerDavid J. GeigerHung C. NgoRuchir PuriHoaxing Ren
    • Bruce M. FleischerDavid J. GeigerHung C. NgoRuchir PuriHoaxing Ren
    • G06F17/50
    • G06F17/5072G06F2217/84
    • A method, computer program product, and data processing system for efficiently performing automated placement of timing-critical unit-level cells in a hierarchical integrated circuit design is disclosed. In preparation for global optimization the entire unit at the cell level, macro-level cells are assigned a “placement force” that serves to limit the movement of the macro-level cells from their current position. Movement boundaries for each macro element are also defined, so as to keep the components in a given macro element in relative proximity to each other.Optimization/placement of the unit design is then performed, via a force-directed layout algorithm, on a “flattened” model of the design while respecting the movement boundaries. Following this “flattened” optimization, the placed “unit-level” cells are modeled as blockages and the macro elements are optimized individually, while respecting the location(s) of the blockages. This entire process is repeated until the optimization of the unit layout eventually converges.
    • 公开了一种用于在分级集成电路设计中有效执行时序关键单元级单元的自动布置的方法,计算机程序产品和数据处理系统。 为了准备全局优化,在单元级别的整个单元,宏级单元被分配一个“放置力”,其用于限制宏级单元从其当前位置的移动。 还定义每个宏元素的移动边界,以便将给定宏元素中的组件保持在彼此相对接近。 然后,通过力导向布局算法,在设计的“扁平化”模型上执行单元设计的优化/放置,同时遵循移动边界。 在这种“扁平化”优化之后,放置的“单位级”单元被建模为阻塞,并且宏元素被单独地优化,同时尊重阻塞的位置。 重复这个整个过程,直到单元布局的优化最终收敛。
    • 39. 发明申请
    • SCHEME TO OPTIMIZE SCAN CHAIN ORDERING IN DESIGNS
    • 计划优化设计中的链条订单
    • US20090049353A1
    • 2009-02-19
    • US11839648
    • 2007-08-16
    • Mark A. ErleBruce M. FleischerDaniel Lipetz
    • Mark A. ErleBruce M. FleischerDaniel Lipetz
    • G01R31/3177G06F11/25
    • G01R31/318591G06F17/505G06F2217/14
    • A method for optimizing a scan chain ordering in circuit designs in an electronic computer-aided design system is provided. The method comprising: creating a schematic representative of a circuit design having a first cell and a second cell, the first cell and the second cell each having latches therein; creating a scan input pin and a scan output pin for each of the latches in the first cell and the second cell on the schematic; generating a first label on the schematic to provide a first wiring arrangement for the latches in the circuit design, the first wiring arrangement identifies a first order to which the scan input of each of the latches is wired to the scan output of another one of the latches; creating a layout representative of the circuit design; generating a first scan chain having a first length on the layout based on the first wiring arrangement; creating a second scan chain from the first scan chain on the layout, the second scan chain having a second length less than the first length of the first scan chain; and generating a second label on the schematic based on the second scan chain, the second label provides a second wiring arrangement for the latches in the circuit design, the second wiring arrangement identifies a second order to which the scan input of each of the latches is wired to the scan output of another one of the latches.
    • 提供了一种在电子计算机辅助设计系统中优化电路设计中的扫描链排序的方法。 该方法包括:创建具有第一单元和第二单元的电路设计的示意图,第一单元和第二单元各自在其中具有锁存器; 为第一个单元中的每个锁存器和原理图上的第二个单元创建扫描输入引脚和扫描输出引脚; 在原理图上产生第一标签以提供用于电路设计中的锁存器的第一布线布置,第一布线布置识别每个锁存器的扫描输入被连接到另一个的另一个的扫描输出的第一顺序 锁存器 创建一个代表电路设计的布局; 基于第一布线布置在布局上产生具有第一长度的第一扫描链; 在所述布局上从所述第一扫描链创建第二扫描链,所述第二扫描链具有小于所述第一扫描链的所述第一长度的第二长度; 并且基于所述第二扫描链在所述原理图上产生第二标签,所述第二标签为所述电路设计中的所述锁存器提供第二布线布置,所述第二布线布置识别每个所述闩锁的扫描输入的第二顺序 连线到另一个锁存器的扫描输出。
    • 40. 发明授权
    • SIMD compare instruction using permute logic for distributed register files
    • SIMD比较指令使用分布式寄存器文件的置换逻辑
    • US09575753B2
    • 2017-02-21
    • US13420699
    • 2012-03-15
    • Alexandre E. EichenbergerBruce M. Fleischer
    • Alexandre E. EichenbergerBruce M. Fleischer
    • G06F9/30G06F9/38
    • G06F9/30032G06F9/30021G06F9/30036G06F9/3838
    • Mechanisms, in a data processing system comprising a single instruction multiple data (SIMD) processor, for performing a data dependency check operation on vector element values of at least two input vector registers are provided. Two calls to a simd-check instruction are performed, one with input vector registers having a first order and one with the input vector registers having a different order. The simd-check instruction performs comparisons to determine if any data dependencies are present. Results of the two calls to the simd-check instruction are obtained and used to determine if any data dependencies are present in the at least two input vector registers. Based on the results, the SIMD processor may perform various operations.
    • 提供了一种包括用于对至少两个输入向量寄存器的向量元素值进行数据相关性检查操作的单指令多数据(SIMD)处理器的数据处理系统中的机制。 执行对SIMD检查指令的两次调用,其中一个具有输入向量寄存器具有第一级,一个具有不同顺序的输入向量寄存器。 simd检查指令执行比较以确定是否存在任何数据依赖性。 获得对simd检查指令的两次调用的结果,并用于确定至少两个输入向量寄存器中是否存在任何数据依赖性。 基于该结果,SIMD处理器可以执行各种操作。