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    • 11. 发明授权
    • Single terahertz wave time-waveform measuring device
    • 单一太赫兹波时间波形测量装置
    • US08742353B2
    • 2014-06-03
    • US12444209
    • 2007-09-13
    • Yoichi KawadaTakashi YasudaHironori TakahashiShinichiro Aoshima
    • Yoichi KawadaTakashi YasudaHironori TakahashiShinichiro Aoshima
    • G01N21/35
    • G01N21/35G01N21/23G01N21/3581
    • A single terahertz wave time-waveform measuring device 1 acquires information on an object to be measured 9 by using a terahertz wave, and includes a light source 11, a beam diameter adjuster 12, a separator 13, a terahertz wave generator 21, a light path length difference adjuster 31, a pulse front tilting unit 32, a polarizer 33, a wave synthesizer 41, an electro-optic crystal 42, an analyzer 43, and a photodetector 44. The terahertz wave generator 21 generates a pulse terahertz wave in response to an input of pump light and outputs the pulse terahertz wave. The pulse front tilting unit 32 makes pulse fronts of the terahertz wave and the probe light when being input into the electro-optic crystal 42 nonparallel to each other by tilting the pulse front of the probe light.
    • 单个太赫兹波时间波形测量装置1通过使用太赫兹波获取关于被测量物体9的信息,并且包括光源11,光束直径调节器12,隔膜13,太赫兹波发生器21,光 路径长度差调节器31,脉冲前倾斜单元32,偏振器33,波合成器41,电光晶体42,分析器43和光电检测器44.太赫兹波发生器21响应地产生脉冲太赫兹波 到泵浦光的输入并输出脉冲太赫兹波。 当脉冲前倾斜单元32通过倾斜探测光的脉冲前沿而彼此不平行地输入到电光晶体42中时,使太赫兹波和探测光的脉冲前沿。
    • 12. 发明授权
    • Total reflection tera hertz wave measuring apparatus
    • 全反射赫兹波测量仪
    • US08354644B2
    • 2013-01-15
    • US12530897
    • 2008-02-13
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro AoshimaAtsuko Aoshima
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro Aoshima
    • G01J5/02
    • G01N21/3581G01N21/552
    • A total reflection terahertz wave measuring apparatus 1 is configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a separator 17, a terahertz wave generating element 20, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53A, a photodetector 53B, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance plane 31a, an exit plane 31b, and a reflection plane 31c. The terahertz wave generating element 20 is provided to be integrated with the entrance plane 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit plane 31b of the internal total reflection prism 31.
    • 全反射太赫波测量装置1被配置为通过使用太赫兹波的全反射测量方法获取关于被摄体S的信息,并且包括光源11,分支部12,斩波器13,光程长度 差分调整部14,偏振片15,隔膜17,太赫波生成元件20,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53A, 光检测器53B,差分放大器54和锁定放大器55.内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫波发生元件20设置成与内部全反射棱镜31的入射面31a一体化,并且太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化。
    • 13. 发明申请
    • TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS
    • 总反射TERA HERTZ波形测量装置
    • US20100091266A1
    • 2010-04-15
    • US12530897
    • 2008-02-13
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro Aoshima
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro Aoshima
    • G01N21/35G01J5/00G01N21/55
    • G01N21/3581G01N21/552
    • A total reflection terahertz wave measuring apparatus 1 is configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a separator 17, a terahertz wave generating element 20, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53A, a photodetector 53B, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance plane 31a, an exit plane 31b, and a reflection plane 31c. The terahertz wave generating element 20 is provided to be integrated with the entrance plane 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit plane 31b of the internal total reflection prism 31.
    • 全反射太赫波测量装置1被配置为通过使用太赫兹波的全反射测量方法获取关于被摄体S的信息,并且包括光源11,分支部12,斩波器13,光程长度 差分调整部14,偏振片15,隔膜17,太赫波生成元件20,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53A, 光检测器53B,差分放大器54和锁定放大器55.内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫波发生元件20设置成与内部全反射棱镜31的入射面31a一体化,并且太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化。
    • 14. 发明授权
    • Electromagnetic wave detection device
    • 电磁波检测装置
    • US08993967B2
    • 2015-03-31
    • US13583675
    • 2011-02-01
    • Yoichi KawadaTakashi YasudaHironori TakahashiToru Matsumoto
    • Yoichi KawadaTakashi YasudaHironori TakahashiToru Matsumoto
    • G01N21/35G01N21/3581G01N21/21
    • G01N21/3581G01N21/21G01N21/636
    • Probe light pulses output from a light source are input to an optical effect unit after the beam diameter is changed by a beam diameter changing optical system, the pulse front is tilted by a pulse front tilting unit, and the beam diameter is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector.
    • 在光束直径由光束直径变化光学系统改变后,从光源输出的探测光脉冲输入到光学效果单元,脉冲前端由脉冲前倾斜单元倾斜,光束直径由光束 直径调整光学系统。 输入光束直径调整光学系统输出的探测光脉冲到光学效果单元,并且还输入作为被检测物体的电磁波。 从光学效果单元输出由于电磁波的传播引起的光学效应单元的光学特性,以及受光学特性变化影响的探测光脉冲。 从光学效果单元输出的探测光脉冲由光电检测器检测。
    • 15. 发明申请
    • ELECTROMAGNETIC WAVE DETECTION DEVICE
    • 电磁波检测装置
    • US20120326041A1
    • 2012-12-27
    • US13583675
    • 2011-02-01
    • Yoichi KawadaTakashi YasudaHironori TakahashiToru Matsumoto
    • Yoichi KawadaTakashi YasudaHironori TakahashiToru Matsumoto
    • G01J5/28
    • G01N21/3581G01N21/21G01N21/636
    • Probe light pulses output from a light source are input to an optical effect unit after the beam diameter is changed by a beam diameter changing optical system, the pulse front is tilted by a pulse front tilting unit, and the beam diameter is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector.
    • 在光束直径由光束直径变化光学系统改变后,从光源输出的探测光脉冲输入到光学效果单元,脉冲前端由脉冲前倾斜单元倾斜,光束直径由光束 直径调整光学系统。 输入光束直径调整光学系统输出的探测光脉冲到光学效果单元,并且还输入作为被检测物体的电磁波。 从光学效果单元输出由于电磁波的传播引起的光学效应单元的光学特性,以及受光学特性变化影响的探测光脉冲。 从光学效果单元输出的探测光脉冲由光电检测器检测。
    • 19. 发明授权
    • Flexible and scalable operating system achieving a fast boot and reliable operation
    • 灵活可扩展的操作系统实现了快速启动和可靠运行
    • US08887159B2
    • 2014-11-11
    • US12243843
    • 2008-10-01
    • Hironori TakahashiMotoki HiranoPeirong LiuYoichi Sato
    • Hironori TakahashiMotoki HiranoPeirong LiuYoichi Sato
    • G06F9/46G06F9/48G06F9/54
    • G06F9/4843G06F9/545
    • Systems and methods are provided for a flexible and scalable operating system achieving a fast boot. A computing system is described that includes a reserved static object memory configured to store predefined static threads, and a secure kernel configured to be executed in a fast boot mode. The secure kernel further may be configured to chain the static threads to a secure kernel thread queue stored in a secure kernel work memory, and to create temporary threads in the secure kernel work memory during the fast boot mode. The computing system may include a main kernel configured to be initialized by creating dynamic threads in a main kernel work memory during the fast boot mode. The main kernel may be configured to chain the static threads to a main kernel thread queue, and to assume control of the static threads from the secure kernel.
    • 提供了系统和方法,用于实现快速启动的灵活且可扩展的操作系统。 描述了一种计算系统,其包括被配置为存储预定义的静态线程的保留静态对象存储器,以及配置为以快速启动模式执行的安全内核。 安全内核还可以被配置为将静态线程链接到存储在安全内核工作存储器中的安全内核线程队列,并且在快速引导模式期间在安全内核工作存储器中创建临时线程。 计算系统可以包括被配置为通过在快速启动模式期间在主内核工作存储器中创建动态线程来初始化的主内核。 可以将主内核配置为将静态线程链接到主内核线程队列,并承担来自安全内核的静态线程的控制。
    • 20. 发明授权
    • Die for forming honeycomb structure
    • 用于形成蜂窝结构的模具
    • US08353695B2
    • 2013-01-15
    • US12562382
    • 2009-09-18
    • Hironori Takahashi
    • Hironori Takahashi
    • B29C47/20
    • B23P15/243B28B3/269C22C38/18C22C38/40
    • A joined article in which a first metal member made of a tungsten carbide base cemented carbide and a second metal member made of a martensitic stainless steel having a carbon equivalent of 2.5 to 3.5 and containing 0.030 mass % or less of sulfur are joined. The martensitic stainless steel having the carbon equivalent of 2.5 to 3.5 is preferably at least one selected from the group consisting of SUS431, SUS420J1, SUS420J2, SUS410, SUS410J1, S-STAR, PROVA-400, HPM38, STAVAX ESR, and SUS403 in the joined article. There is disclosed a joined article in which the lowering of the strength of a second metal member around a joining interface thereof is prevented.
    • 将由碳化钨基底硬质合金构成的第一金属构件和碳当量为2.5〜3.5,含有0.030质量%以下的硫的马氏体系不锈钢的第二金属构件接合在一起的接合体。 碳当量为2.5〜3.5的马氏体系不锈钢优选为选自SUS431,SUS420J1,SUS420J2,SUS410,SUS410J1,S-STAR,PROVA-400,HPM38,STAVAX ESR和SUS403中的至少一种。 加入文章。 公开了一种接合制品,其中防止第二金属构件围绕其接合界面的强度降低。