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151. 发明申请

US20170192046A1 FORCE DEFLECTION AND RESISTANCE TESTING SYSTEM AND METHOD OF USE 审中-公开
公开(公告)号：US20170192046A1
公开(公告)日：2017-07-06
申请号：US15462383
申请日：2017-03-17
申请人： Modus Test Automation, LLC
发明人： Lynwood Adams , Jack Lewis
IPC分类号： G01R31/04
CPC分类号： G01R1/07328 , G01R1/0466 , G01R1/07314 , G01R31/2879 , G01R31/2886 , G01R31/2889 , G01R31/2896
摘要： A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.

152. 发明申请

US20160209443A1 QUICK CHANGE SMALL FOOTPRINT TESTING SYSTEM AND METHOD OF USE 有权
标题翻译：快速更换小型测试系统及其使用方法
公开(公告)号：US20160209443A1
公开(公告)日：2016-07-21
申请号：US14996045
申请日：2016-01-14
申请人： Modus Test Automation, LLC
发明人： Lynwood Adams , Jack Lewis
IPC分类号： G01R1/04 , G01R31/26
CPC分类号： G01R1/07328 , G01R1/0466 , G01R1/07314 , G01R31/2879 , G01R31/2886 , G01R31/2889 , G01R31/2896
摘要： A testing system for semiconductor chips having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. The DUT PCB is quickly and easily removed and replaced by moving the locking posts between an engaged position and a disengaged position. In this way, a single testing system can be used to test a great variety of semiconductor chips thereby reducing capital equipment costs and space needed in cleanrooms.
摘要翻译：一种用于半导体芯片的测试系统，其具有与该系统的电气测试部件电连接的可测试的印刷电路板（DUT PCB）。可拆卸的顶板被放置在DUT PCB的顶部上，并且被多个锁定杆锁定在适当位置，多个锁定杆选择性地连接到顶板中的凸轮表面，该顶板将顶板向下拉，将DUT PCB夹在顶板和电气测试系统的组件。通过在锁定位置和脱离位置之间移动锁定位置，可快速方便地拆下DUT PCB并进行更换。以这种方式，可以使用单个测试系统来测试各种各样的半导体芯片，从而降低洁净室所需的资本设备成本和空间。

153. 发明授权

US09285427B2 Testing apparatus and testing method of electronic device 有权
标题翻译：电子设备试验装置及试验方法
公开(公告)号：US09285427B2
公开(公告)日：2016-03-15
申请号：US14017317
申请日：2013-09-04
申请人： Wistron Corporation
发明人： Wen-Hwa Luo , Kuan-Han Chen , Chih-Sheng Liao
IPC分类号： G01R31/28 , G01R31/00 , G01R31/3185 , G01R31/02 , G01R31/04 , G01R1/073
CPC分类号： G01R31/318536 , G01R1/07328 , G01R31/02 , G01R31/026 , G01R31/046 , G01R31/2806 , G01R31/2886
摘要： A testing apparatus and a testing method of an electronic device are provided. The testing apparatus includes at least two device transfer plates and a testing circuit. The device transfer plates are electrically and respectively connected to corresponding electronic devices and at least two sockets corresponding to the electronic devices. The testing circuit is electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs. According to types of the electronic devices, the testing circuit provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to a bus between the electronic devices respectively corresponding to the device transfer plates.
摘要翻译：提供了电子设备的测试设备和测试方法。测试装置包括至少两个装置传递板和测试电路。器件传输板电连接到相应的电子器件和对应于电子器件的至少两个插座。测试电路分别通过至少两组串行信号线对电连接到器件传输板。根据电子设备的类型，测试电路通过相应的串行信号线对向设备传输板之一提供串行信号，并通过相应的串行信号线对接收另一个设备传输板的响应，因此以测试分别对应于设备传送板的电子设备之间的总线是否发生开路。

154. 发明申请

US20110148448A1 LOADED PRINTED CIRCUIT BOARD TEST FIXTURE AND METHOD FOR MANUFACTURING THE SAME 有权
标题翻译：负载印刷电路板测试装置及其制造方法
公开(公告)号：US20110148448A1
公开(公告)日：2011-06-23
申请号：US12963322
申请日：2010-12-08
申请人： Gary F. St. Onge , Scott F. Gold , Matthew T. Miczek
发明人： Gary F. St. Onge , Scott F. Gold , Matthew T. Miczek
IPC分类号： G01R1/067 , G06F19/00
CPC分类号： G01R1/07328 , G01R1/07378 , G01R31/31905
摘要： A test fixture for testing loaded printed circuit boards having a plurality of test points having a probe plate including an array of widely spaced high force spring test probes in compliant contact with solid translator pins located in a translator fixture removably positioned over the probe plate. The test fixture includes optimization software wherein translation of the test signals are optimized by providing the shortest interconnect distance in the x-y plane between the test points on the printed circuit board and the test probes in the probe plate. The fixture further includes an unpowered opens device for testing components on the loaded printed circuit board.
摘要翻译：一种用于测试装载的印刷电路板的测试夹具，其具有多个测试点，所述测试点具有探针板，所述探针板包括广泛间隔开的大力弹簧测试探针的阵列，所述多个测试点与位于所述探针板上的可移动地定位的转换器固定器中的固体平移器销接触。测试夹具包括优化软件，其中通过在印刷电路板上的测试点和探针板中的测试点之间的x-y平面中提供最短的互连距离来优化测试信号的平移。夹具还包括用于测试装载的印刷电路板上的部件的无动力打开装置。

155. 发明申请

US20100102841A1 DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE 审中-公开
标题翻译：用于检查基板的装置，方法和探针
公开(公告)号：US20100102841A1
公开(公告)日：2010-04-29
申请号：US12605859
申请日：2009-10-26
申请人： Hideya Kawada , Koji Takahashi
发明人： Hideya Kawada , Koji Takahashi
IPC分类号： G01R31/02 , G01R1/06
CPC分类号： G01R1/06733 , G01R1/06722 , G01R1/07328 , G01R31/2805 , G01R31/2808
摘要： A device for inspecting a substrate, including a probe and a support member configured to hold the probe is disclosed. The probe comprises a compression spring and includes a conductive material to measure an electric property of a substrate under inspection.
摘要翻译：公开了一种用于检查包括探针和被配置为保持探针的支撑构件的基板的装置。探针包括压缩弹簧，并且包括用于测量被检查的基底的电特性的导电材料。

156. 发明授权

US07336087B2 Circuit board test device comprising contact needles which are driven in diagonally protruding manner 失效
标题翻译：电路板测试装置包括以对角突出的方式驱动的接触针
公开(公告)号：US07336087B2
公开(公告)日：2008-02-26
申请号：US10555514
申请日：2004-05-03
申请人： Torsten Körting , Clayton Depue , Thomas Lück
发明人： Torsten Körting , Clayton Depue , Thomas Lück
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R1/07328 , G01R1/06705 , G01R1/07392
摘要： The invention relates to printed circuit board test devices (1) comprising a support (4) receiving a circuit board (5) by said board's edges, said board being designed to be fitted as needed with electrical or electronic components (20), said devices further comprising at least one needle (15) which is connected to an electrical test device (17) and which shall electrically contact contact areas (21) on the board (5), the needle (15) being obliquely displaceable by a needle drive (13) in the needle direction, the needle drive being adjustable—by at least one holding-fixture drive (8)—in a adjustment plane (7) which is parallel to the circuit board (5), the drives (8, 13) being actuated by a needle control (10) to spatially position the needle tip (18) at a predetermined spatial coordinate, said devices (1) being characterized in that it includes a distance measuring device (25, 13′) designed to measure the distance between the adjustment plane (7) and the circuit board (5, 5′) at least at one site and to transmit the measured values to the drive control (10), this drive control in turn being designed that, prior to the contacting time at the contact areas (21; 21′), appropriate correction based on the measured distance values, of the spatial coordinates of the contact areas (21, 21′) shall be carried out.
摘要翻译：本发明涉及印刷电路板测试装置（1），其包括通过所述板的边缘接收电路板（5）的支撑件（4），所述板被设计成根据需要与电气或电子部件（20）配合，所述装置还包括至少一个针（15），其连接到电测试装置（17），并且其应与所述板（5）上的接触区域（21）电接触，所述针头（15）可被针驱动器在针方向上，针驱动器通过至少一个夹具驱动器（8）可调，在平行于电路板（5）的调节平面（7）上，驱动器（8,13）通过针控制器（10）致动以将针尖（18）空间定位在预定的空间坐标，所述装置（1）的特征在于其包括设计成测量距离的距离测量装置（25,13'）调整平面（7）和所述电路板（5,5'），并且将所述测量值传输到所述驱动控制器（10），所述驱动控制依次被设计为在所述接触区域（21; 21）的接触时间之前， 21'），应进行接触区域（21,21'）的空间坐标的基于测量的距离值的适当的校正。

157. 发明申请

US20070224869A1 Testing device 失效
标题翻译：测试装置
公开(公告)号：US20070224869A1
公开(公告)日：2007-09-27
申请号：US11723940
申请日：2007-03-22
申请人： Yasuo Mori
发明人： Yasuo Mori
IPC分类号： H01R13/62
CPC分类号： G01R31/2808 , G01R1/07328 , G01R31/2891
摘要： A printed-circuit-board testing device that tests an electronic component disposed on a printed circuit board includes printed-circuit-board-tilt measuring means for measuring tilting of the printed circuit board, measuring means for measuring tilting of an arm having a probe that comes into contact with and tests the electronic component, correcting means for correcting the tilting of the arm on the basis of the tilting of the printed circuit board and the tilting of the arm, inputting means for inputting positional information of the electronic component, arm disposing means for disposing the arm to a predetermined position in accordance with the positional information, and printed-circuit-board testing means for performing testing as a result of protruding the probe from the disposed arm.
摘要翻译：测试布置在印刷电路板上的电子部件的印刷电路板测试装置包括用于测量印刷电路板的倾斜的印刷电路板倾斜测量装置，用于测量具有探针的臂的倾斜的测量装置，与电子部件接触并测试，根据印刷电路板的倾斜和臂的倾斜来校正臂的倾斜的校正装置，用于输入电子部件的位置信息的输入装置，用于根据位置信息将臂布置到预定位置的装置，以及用于通过从设置的臂突出探针而进行测试的印刷电路板测试装置。

158. 发明授权

US07119559B2 Vacuum-actuated test fixture for testing printed circuit boards 有权
标题翻译：用于测试印刷电路板的真空驱动测试夹具
公开(公告)号：US07119559B2
公开(公告)日：2006-10-10
申请号：US10869845
申请日：2004-06-18
申请人： Serge Beaucage , Marco Deblois , Kim Mailhot
发明人： Serge Beaucage , Marco Deblois , Kim Mailhot
IPC分类号： G01R31/02
CPC分类号： G01R31/2808 , G01R1/07328
摘要： A test fixture for testing a circuit board, comprising a top plate defining a board-bearing surface for receiving the circuit board to be tested thereon. The test fixture comprises a lid having a lid frame defining a peripheral rim, and a lid diaphragm movably mounted to the frame opposite the peripheral rim; the lid diaphragm defines an inner surface to which is mounted a circuit board securing member. The lid is movable between a first position where the frame rim engages the top plate to define a test chamber about the board-bearing surface and between the top plate, the frame and the diaphragm, and a second position where the lid is moved away from the top plate to allow access to the test chamber. The lid diaphragm is movable relative to the frame at least when the lid is in the first position between a rest position where the securing member is moved away from the board-bearing surface and an operative position where the securing member is moved towards the board-bearing surface for engaging and securely holding the circuit board thereon. The test fixture further comprises a diaphragm biasing member continuously biasing the diaphragm towards the rest position, and an actuator, for selectively forcibly moving the diaphragm towards the operative position against the bias of the diaphragm biasing member. Moreover, the test fixture comprises at least one test probe projecting from either one of the lid and the top plate towards the board-bearing surface when the lid is in the first position and the diaphragm is in the operative position for allowing the at least one test probe to engage the circuit board. The test fixture also comprises a circuit interface for connecting the probes to a computer.
摘要翻译：一种用于测试电路板的测试夹具，包括限定用于接收待测电路板的板承载表面的顶板。测试夹具包括具有限定外围边缘的盖框架的盖子和可移动地安装到框架与外围边缘相对的盖子隔膜; 盖膜片限定了内表面，其中安装有电路板固定构件。所述盖可以在第一位置和第二位置之间移动，在第一位置，框架边缘与顶板接合以限定围绕板承载表面以及顶板，框架和隔膜之间的测试室，以及第二位置，顶板允许进入测试室。至少当盖处于第一位置时，盖隔膜可以相对于框架移动，该静止位置在固定构件从板承载表面移开的静止位置和固定构件朝向板 - 板移动的操作位置之间，承载表面用于接合并牢固地将电路板固定在其上。测试夹具还包括隔膜偏置构件，其将隔膜朝向静止位置连续地偏置;以及致动器，用于克服该隔膜偏置构件的偏压选择性地将隔膜朝向操作位置移动。此外，测试夹具包括当盖处于第一位置时从盖和顶板中的任一个突出到板承载表面的至少一个测试探针，并且隔膜处于操作位置以允许至少一个测试探头接合电路板。测试夹具还包括用于将探针连接到计算机的电路接口。

159. 发明授权

US07071717B2 Universal test fixture 失效
标题翻译：通用测试夹具
公开(公告)号：US07071717B2
公开(公告)日：2006-07-04
申请号：US10975140
申请日：2004-10-28
申请人： Charles D. Hoke , Ken A. Nishimura
发明人： Charles D. Hoke , Ken A. Nishimura
IPC分类号： G01R31/02
CPC分类号： G01R1/07385 , G01R1/07328 , G01R1/07335
摘要： A universal fixture for testing a device, such as a bare printed circuit board, includes a plurality of addressable contact points. Each of the contact points includes a switch connected to a conductor capable of creating an electrical connection to the device. To obtain a measurement of a target on the device, two of the contact points on the universal fixture are selected based on the position of the target on the device relative to the contact points.
摘要翻译：用于测试诸如裸印刷电路板的设备的通用夹具包括多个可寻址的接触点。每个接触点包括连接到能够产生与设备的电连接的导体的开关。为了获得设备上的目标的测量，通用夹具上的两个接触点是根据目标在设备上相对于接触点的位置来选择的。

160. 发明申请

US20060076968A1 Probe, printed circuit board testing device and printed circuit board testing method 有权
标题翻译：探头，印刷电路板测试装置和印刷电路板测试方法
公开(公告)号：US20060076968A1
公开(公告)日：2006-04-13
申请号：US11289452
申请日：2005-11-30
申请人： Susumu Miyazawa , Mikio Hara , Syuji Kagiyama , Yasuo Mori , Kyosuke Yoshizu , Shigenori Makita , Yoshino Miyazawa
发明人： Susumu Miyazawa , Mikio Hara , Syuji Kagiyama , Yasuo Mori , Kyosuke Yoshizu , Shigenori Makita , Yoshino Miyazawa
IPC分类号： G01R31/02
CPC分类号： G01R31/2808 , G01R1/07328
摘要： A probe is mountable to a printed circuit board testing device which performs a test on a predetermined land and/or a predetermined via hole of a printed circuit board. The probe includes a probe tip and a protrusion. The probe tip is contactable with the land and/or the via hole and projectable from the probe. The protrusion is disposed at a surface of the probe, the surface of the probe being disposed opposite to where the probe tip is projectable. The protrusion is grounded by a reaction pressure that is generated when the probe tip contacts the land and/or the via hole.
摘要翻译：探针可安装到印刷电路板测试装置上，该印刷电路板测试装置在印刷电路板的预定焊盘和/或预定通孔上进行测试。探头包括探针尖端和突起。探针尖端可与脊和/或通孔相接触，并可从探头投射。突起设置在探针的表面处，探针的表面设置成与探针尖端可投射的位置相对。突起通过当探针尖端接触平台和/或通孔时产生的反作用压力接地。

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