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1. 发明授权

US07119559B2 Vacuum-actuated test fixture for testing printed circuit boards 有权
标题翻译：用于测试印刷电路板的真空驱动测试夹具
公开(公告)号：US07119559B2
公开(公告)日：2006-10-10
申请号：US10869845
申请日：2004-06-18
申请人： Serge Beaucage , Marco Deblois , Kim Mailhot
发明人： Serge Beaucage , Marco Deblois , Kim Mailhot
IPC分类号： G01R31/02
CPC分类号： G01R31/2808 , G01R1/07328
摘要： A test fixture for testing a circuit board, comprising a top plate defining a board-bearing surface for receiving the circuit board to be tested thereon. The test fixture comprises a lid having a lid frame defining a peripheral rim, and a lid diaphragm movably mounted to the frame opposite the peripheral rim; the lid diaphragm defines an inner surface to which is mounted a circuit board securing member. The lid is movable between a first position where the frame rim engages the top plate to define a test chamber about the board-bearing surface and between the top plate, the frame and the diaphragm, and a second position where the lid is moved away from the top plate to allow access to the test chamber. The lid diaphragm is movable relative to the frame at least when the lid is in the first position between a rest position where the securing member is moved away from the board-bearing surface and an operative position where the securing member is moved towards the board-bearing surface for engaging and securely holding the circuit board thereon. The test fixture further comprises a diaphragm biasing member continuously biasing the diaphragm towards the rest position, and an actuator, for selectively forcibly moving the diaphragm towards the operative position against the bias of the diaphragm biasing member. Moreover, the test fixture comprises at least one test probe projecting from either one of the lid and the top plate towards the board-bearing surface when the lid is in the first position and the diaphragm is in the operative position for allowing the at least one test probe to engage the circuit board. The test fixture also comprises a circuit interface for connecting the probes to a computer.
摘要翻译：一种用于测试电路板的测试夹具，包括限定用于接收待测电路板的板承载表面的顶板。测试夹具包括具有限定外围边缘的盖框架的盖子和可移动地安装到框架与外围边缘相对的盖子隔膜; 盖膜片限定了内表面，其中安装有电路板固定构件。所述盖可以在第一位置和第二位置之间移动，在第一位置，框架边缘与顶板接合以限定围绕板承载表面以及顶板，框架和隔膜之间的测试室，以及第二位置，顶板允许进入测试室。至少当盖处于第一位置时，盖隔膜可以相对于框架移动，该静止位置在固定构件从板承载表面移开的静止位置和固定构件朝向板 - 板移动的操作位置之间，承载表面用于接合并牢固地将电路板固定在其上。测试夹具还包括隔膜偏置构件，其将隔膜朝向静止位置连续地偏置;以及致动器，用于克服该隔膜偏置构件的偏压选择性地将隔膜朝向操作位置移动。此外，测试夹具包括当盖处于第一位置时从盖和顶板中的任一个突出到板承载表面的至少一个测试探针，并且隔膜处于操作位置以允许至少一个测试探头接合电路板。测试夹具还包括用于将探针连接到计算机的电路接口。

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