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1. 发明申请

US20140164858A1 TESTING APPARATUS AND TESTING METHOD OF ELECTRONIC DEVICE 有权
标题翻译：电子设备的测试装置和测试方法
公开(公告)号：US20140164858A1
公开(公告)日：2014-06-12
申请号：US14017317
申请日：2013-09-04
申请人： Wistron Corporation
发明人： Wen-Hwa Luo , Kuan-Han Chen , Chih-Sheng Liao
IPC分类号： G01R31/3185
CPC分类号： G01R31/318536 , G01R1/07328 , G01R31/02 , G01R31/026 , G01R31/046 , G01R31/2806 , G01R31/2886
摘要： A testing apparatus and a testing method of an electronic device are provided. The testing apparatus includes at least two device transfer plates and a testing circuit. The device transfer plates are electrically and respectively connected to corresponding electronic devices and at least two sockets corresponding to the electronic devices. The testing circuit is electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs. According to types of the electronic devices, the testing circuit provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to a bus between the electronic devices respectively corresponding to the device transfer plates.
摘要翻译：提供了电子设备的测试设备和测试方法。测试装置包括至少两个装置传递板和测试电路。器件传输板电连接到相应的电子器件和对应于电子器件的至少两个插座。测试电路分别通过至少两组串行信号线对电连接到器件传输板。根据电子设备的类型，测试电路通过相应的串行信号线对向设备传输板之一提供串行信号，并通过相应的串行信号线对接收另一个设备传输板的响应，因此以测试分别对应于设备传送板的电子设备之间的总线是否发生开路。

2. 发明授权

US09285427B2 Testing apparatus and testing method of electronic device 有权
标题翻译：电子设备试验装置及试验方法
公开(公告)号：US09285427B2
公开(公告)日：2016-03-15
申请号：US14017317
申请日：2013-09-04
申请人： Wistron Corporation
发明人： Wen-Hwa Luo , Kuan-Han Chen , Chih-Sheng Liao
IPC分类号： G01R31/28 , G01R31/00 , G01R31/3185 , G01R31/02 , G01R31/04 , G01R1/073
CPC分类号： G01R31/318536 , G01R1/07328 , G01R31/02 , G01R31/026 , G01R31/046 , G01R31/2806 , G01R31/2886
摘要： A testing apparatus and a testing method of an electronic device are provided. The testing apparatus includes at least two device transfer plates and a testing circuit. The device transfer plates are electrically and respectively connected to corresponding electronic devices and at least two sockets corresponding to the electronic devices. The testing circuit is electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs. According to types of the electronic devices, the testing circuit provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to a bus between the electronic devices respectively corresponding to the device transfer plates.
摘要翻译：提供了电子设备的测试设备和测试方法。测试装置包括至少两个装置传递板和测试电路。器件传输板电连接到相应的电子器件和对应于电子器件的至少两个插座。测试电路分别通过至少两组串行信号线对电连接到器件传输板。根据电子设备的类型，测试电路通过相应的串行信号线对向设备传输板之一提供串行信号，并通过相应的串行信号线对接收另一个设备传输板的响应，因此以测试分别对应于设备传送板的电子设备之间的总线是否发生开路。

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