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    • 91. 发明申请
    • Non-volatile semiconductor memory device
    • 非易失性半导体存储器件
    • US20050237829A1
    • 2005-10-27
    • US11104599
    • 2005-04-13
    • Hiroshi NakamuraTomoharu Tanaka
    • Hiroshi NakamuraTomoharu Tanaka
    • G11C16/06G11C7/00G11C16/02G11C16/04G11C16/10G11C16/30
    • G11C16/0483G11C16/10G11C16/30
    • A non-volatile semiconductor memory device comprises a memory cell array of data-rewritable non-volatile memory cells or memory cell units containing the memory cells, and a plurality of word lines each commonly connected to the memory cells on the same row in the memory cell array. In write pulse applying during data writing, a high voltage for writing is applied to a selected word line, and an intermediate voltage for writing is applied to at least two of non-selected word lines. The beginning of charging a first word line located between the selected word line and a source line to a first intermediate voltage for writing is followed by the beginning of charging a second word line located between the selected word line and a bit line contact to a second intermediate voltage for writing.
    • 非易失性半导体存储器件包括数据可重写非易失性存储器单元的存储单元阵列或包含存储单元的存储单元单元,以及多个字线,每个字线共同连接到存储器中相同行上的存储器单元 单元格阵列。 在数据写入期间的写入脉冲施加中,写入用的高电压被施加到所选择的字线,并且用于写入的中间电压被施加到至少两个未选择的字线。 将位于所选择的字线和源极线之间的第一字线充电到用于写入的第一中间电压的开始之后,将位于所选择的字线和位线接触之间的第二字线开始充电到第二 写入中间电压。
    • 97. 发明授权
    • Non-volatile semiconductor memory device
    • 非易失性半导体存储器件
    • US06882569B2
    • 2005-04-19
    • US10918686
    • 2004-08-13
    • Koji HosonoKenichi ImamiyaHiroshi Nakamura
    • Koji HosonoKenichi ImamiyaHiroshi Nakamura
    • G11C16/02G11C16/04G11C16/06G11C16/10G11C16/26
    • G11C16/105G11C16/0483G11C16/10G11C16/102G11C16/26G11C2216/14
    • A non-volatile semiconductor memory device includes a memory cell array with electrically rewritable non-volatile memory cells laid out therein, an address selector circuit for performing memory cell selection of the memory cell array, a data read/write circuit arranged to perform data read of the memory cell array and data write to the memory cell array, and a control circuit for executing a series of copy write operations in such a manner that a data output operation of from the data read/write circuit to outside of a chip and a data write operation of from the data read/write circuit to the memory cell array are overlapped each other, the copy write operation including reading data at a certain address of the memory cell array into the data read/write circuit, outputting read data held in the read/write circuit to outside of the chip and writing write data into another address of the memory cell array, the write data being a modified version of the read data held in the data read/write circuit as externally created outside the chip.
    • 一种非易失性半导体存储器件包括其中布置有电可重写非易失性存储器单元的存储单元阵列,用于执行存储单元阵列的存储单元选择的地址选择器电路,布置成执行数据读取的数据读/写电路 的存储单元阵列和写入存储单元阵列的数据;以及控制电路,用于执行一系列复制写入操作,使得从数据读/写电路到芯片外部的数据输出操作和 从数据读/写电路到存储单元阵列的数据写入操作彼此重叠,复制写操作包括将存储单元阵列的特定地址处的数据读入数据读/写电路,输出保持在 读/写电路到芯片外部,并将写入数据写入存储单元阵列的另一个地址,写数据是保存在数据读/写中的读数据的修改版本 ite电路在芯片外部外部创建。