专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

91. 发明授权

US06627095B2 Magnetic recording disk and method of manufacturing same 失效
标题翻译：磁记录盘及其制造方法
公开(公告)号：US06627095B2
公开(公告)日：2003-09-30
申请号：US09739381
申请日：2000-12-19
申请人： Masahiro Hatakeyama , Katsunori Ichiki , Kenji Watanabe , Kazuo Yamauchi , Shinta Kunitomo , Yasushi Tohma , Tohru Satake
发明人： Masahiro Hatakeyama , Katsunori Ichiki , Kenji Watanabe , Kazuo Yamauchi , Shinta Kunitomo , Yasushi Tohma , Tohru Satake
IPC分类号： G11B5127
CPC分类号： G11B5/7315 , G11B5/7325 , G11B5/82 , Y10S428/90 , Y10T428/12389 , Y10T428/12465 , Y10T428/12736 , Y10T428/12944 , Y10T428/12993 , Y10T428/266
摘要： A magnetic recording disk having on its surface a texture structure of fine surface irregularities with reduced variations, which is suitable for high-density magnetic recording, and a method of manufacturing such a magnetic recording disk are provided. A magnetic recording disk has a substrate 11, 12 (16) coated on a surface thereof with a magnetic layer 13, a carbon layer 14, and a lubricating film 15. The substrate has on a surface thereof a texture structure of fine surface irregularities for reducing friction when the substrate is brought into contact with a head and controlling an amount of lift of the head. The fine surface irregularities have a height of 20 nm or less and are formed from a pattern shape or profile of a shield with a high-speed atomic beam emitted from a high-speed atomic beam source.
摘要翻译：一种磁记录盘，其表面具有适合于高密度磁记录的具有减小的变化的细小表面凹凸的纹理结构，以及制造这种磁记录盘的方法。磁记录盘具有在其表面上涂覆有磁性层13，碳层14和润滑膜15的基板11,12（16）。该基板在其表面上具有细小的表面凹凸的纹理结构，用于当衬底与头部接触并控制头部的提升量时，减小摩擦。微细表面凹凸具有20nm以下的高度，并且由具有从高速原子束源发射的高速原子束的屏蔽的图案形状或轮廓形成。

92. 发明授权

US06194048B1 Magnetic recording disk 失效
标题翻译：磁记录盘
公开(公告)号：US06194048B1
公开(公告)日：2001-02-27
申请号：US09165637
申请日：1998-10-02
申请人： Masahiro Hatakeyama , Katsunori Ichiki , Kenji Watanabe , Kazuo Yamauchi , Shinta Kunitomo , Yasushi Tohma , Tohru Satake
发明人： Masahiro Hatakeyama , Katsunori Ichiki , Kenji Watanabe , Kazuo Yamauchi , Shinta Kunitomo , Yasushi Tohma , Tohru Satake
IPC分类号： B32B302
CPC分类号： G11B5/7315 , G11B5/7325 , G11B5/82 , Y10S428/90 , Y10T428/12389 , Y10T428/12465 , Y10T428/12736 , Y10T428/12944 , Y10T428/12993 , Y10T428/266
摘要： A magnetic recording disk having on its surface a texture structure of fine surface irregularities with reduced variations, which is suitable for high-density magnetic recording, and a method of manufacturing such a magnetic recording disk are provided. The magnetic recording disk has a substrate 11, 12 (16) coated on a surface thereof with a magnetic layer 13, a carbon layer 14, and a lubricating film 15. The substrate has on a surface thereof a texture structure of fine surface irregularities for reducing friction when the substrate is brought into contact with a head and controlling an amount of lift of the head. The fine surface irregularities have a height of 20 nm or less and are formed from a pattern shape or profile of a shield with a high-speed atomic beam emitted from a high-speed atomic beam source.
摘要翻译：一种磁记录盘，其表面具有适合于高密度磁记录的具有减小的变化的细小表面凹凸的纹理结构和制造这种磁记录盘的方法。磁记录盘具有在其表面上涂覆有磁性层13，碳层14和润滑膜15的基板11,12（16）。该基板在其表面上具有细小的表面凹凸的纹理结构，用于当衬底与头部接触并控制头部的提升量时，减小摩擦。微细表面凹凸具有20nm以下的高度，并且由具有从高速原子束源发射的高速原子束的屏蔽的图案形状或轮廓形成。

93. 发明授权

US6099698A Magnetic disc and method of manufacturing same 失效
标题翻译：磁盘及其制造方法
公开(公告)号：US6099698A
公开(公告)日：2000-08-08
申请号：US165371
申请日：1998-10-02
申请人： Masahiro Hatakeyama , Katsunori Ichiki , Kenji Watanabe , Kazuo Yamauchi , Shinta Kunitomo , Tohru Satake , Yasushi Tohma , Juichi Ishiguro
发明人： Masahiro Hatakeyama , Katsunori Ichiki , Kenji Watanabe , Kazuo Yamauchi , Shinta Kunitomo , Tohru Satake , Yasushi Tohma , Juichi Ishiguro
IPC分类号： C03C19/00 , C03C23/00 , C23C14/04 , C23C16/04 , G11B5/64 , G11B5/82 , G11B5/84 , C23C14/46 , B01J19/08
CPC分类号： G11B5/8408 , C23C14/048 , C23C16/047 , G11B5/84 , G11B5/8404 , G11B5/82
摘要： It is an object of the present invention to provide a method of making a magnetic disk having a uniform textured structure with micro-waviness of fabrication depth of less than 20 nm, preferably less than 10 nm, and a local depth deviation of less than 5%, in which texture patterns are characterized by the fact that lateral surfaces of the structure are sloped or curved. The object has been achieved in a method for making a magnetic disk having micro-waviness on a fabrication surface of a substrate for reducing dynamic friction and controlling head float, by rotating and irradiating the fabrication surface with a high energy beam from a beam source at an inclined angle to the substrate surface, through a shielding mask having a specific pattern, so as to process a transcription pattern on the substrate surface to produce a textured structure with micro-waviness having sloped or curved side surfaces.
摘要翻译：本发明的目的是提供一种制造具有均匀纹理结构的磁盘的方法，其制造深度小于20nm，优选小于10nm，局部深度偏差小于5 ％，其中纹理图案的特征在于结构的侧表面是倾斜的或弯曲的。该目的已经在用于制造具有微波纹的磁盘的方法中实现，该磁盘在基板的制造表面上用于减少动态摩擦并且通过旋转和照射来自光源的高能量束的制造表面来旋转和照射制造表面通过具有特定图案的屏蔽掩模，与基板表面倾斜的角度，以便处理基板表面上的转印图案，以产生具有倾斜或弯曲侧表面的微波纹的纹理结构。

94. 发明授权

US09194826B2 Electron beam apparatus and sample observation method using the same 有权
标题翻译：电子束装置和使用其的样品观察方法
公开(公告)号：US09194826B2
公开(公告)日：2015-11-24
申请号：US12103354
申请日：2008-04-15
申请人： Toru Kaga , Kenji Terao , Masahiro Hatakeyama , Kenji Watanabe , Yoshihiko Naito , Takeshi Murakami , Norio Kimura
发明人： Toru Kaga , Kenji Terao , Masahiro Hatakeyama , Kenji Watanabe , Yoshihiko Naito , Takeshi Murakami , Norio Kimura
IPC分类号： G21K5/04 , G01N23/203 , G01N23/225 , H01J37/28
CPC分类号： G01N23/203 , G01N23/2251 , G01N2223/6116 , H01J37/28 , H01J2237/004 , H01J2237/022 , H01J2237/2446 , H01J2237/2817
摘要： The electron beam apparatus is provided with a stage for mounting a sample thereon, a primary optical system for generating an electron beam having an irradiation area and irradiating the electron beam onto the sample, a secondary optical system for detecting electrons which have been generated through the irradiation of the electron beam onto the sample and have acquired structural information of the sample and acquiring an image of the sample about a viewing area and an irradiation area changing section for changing the position of the irradiation area with respect to the viewing area.
摘要翻译：电子束装置设置有用于在其上安装样品的载物台，用于产生具有照射区域并将电子束照射到样品上的电子束的主光学系统，用于检测通过将电子束照射到样品上并获取样品的结构信息并获取关于观察区域的样品的图像和用于改变照射区域相对于观察区域的位置的照射区域改变部分。

95. 发明授权

US08937283B2 Specimen observation method and device using secondary emission electron and mirror electron detection 有权
标题翻译：使用二次发射电子和镜电子检测的样本观察方法和装置
公开(公告)号：US08937283B2
公开(公告)日：2015-01-20
申请号：US12937145
申请日：2009-04-10
申请人： Masahiro Hatakeyama , Takeshi Murakami , Yoshihiko Naito , Kenji Terao , Norio Kimura , Kenji Watanabe
发明人： Masahiro Hatakeyama , Takeshi Murakami , Yoshihiko Naito , Kenji Terao , Norio Kimura , Kenji Watanabe
IPC分类号： H01J37/29 , H01J37/28 , H01J37/244 , H01L21/66
CPC分类号： H01J37/28 , H01J37/22 , H01J37/244 , H01J37/29 , H01J2237/24475 , H01J2237/24585 , H01J2237/24592 , H01J2237/2805 , H01J2237/2806 , H01J2237/2817 , H01L22/12
摘要： A technique capable of improving the ability to observe a specimen using an electron beam in an energy region which has not been conventionally given attention is provided. This specimen observation method comprises: irradiating the specimen with an electron beam; detecting electrons to be observed which have been generated and have obtained information on the specimen by the electron beam irradiation; and generating an image of the specimen from the detected electrons to be observed. The electron beam irradiation comprises irradiating the specimen with the electron beam with a landing energy set in a transition region between a secondary emission electron region in which secondary emission electrons are detected and a mirror electron region in which mirror electrons are detected, thereby causing the secondary emission electrons and the mirror electrons to be mixed as the electrons to be observed. The detection of the electrons to be observed comprises performing the detection in a state where the secondary emission electrons and the mirror electrons are mixed. Observation and inspection can be quickly carried out for a fine foreign material and pattern of 100 nm or less.
摘要翻译：提供了一种技术，其能够提高在未经常被注意的能量区域中使用电子束观察样本的能力。该样本观察方法包括：用电子束照射样本; 检测已经产生的待观察的电子，并通过电子束照射获得关于样品的信息; 以及从所检测的电子产生待观察的样本的图像。电子束照射包括用电子束照射样本，其中在其中检测到二次发射电子的二次发射电子区域和其中检测到反射镜电子的镜电子区域之间的过渡区域中设置的着陆能量，从而使次级发射电子和镜电子作为待观察的电子进行混合。要观察的电子的检测包括在二次发射电子和镜电子混合的状态下进行检测。对于100nm以下的细小异物和图案，可以快速进行观察和检查。

96. 发明授权

US08624182B2 Electro-optical inspection apparatus and method with dust or particle collection function 有权
标题翻译：电光检测装置及方法，具有灰尘或颗粒收集功能
公开(公告)号：US08624182B2
公开(公告)日：2014-01-07
申请号：US13195927
申请日：2011-08-02
申请人： Kenji Watanabe , Masahiro Hatakeyama , Yoshihiko Naito , Tatsuya Kohama , Kenji Terao , Takeshi Murakami , Takehide Hayashi , Kiwamu Tsukamoto , Hiroshi Sobukawa , Norio Kimura
发明人： Kenji Watanabe , Masahiro Hatakeyama , Yoshihiko Naito , Tatsuya Kohama , Kenji Terao , Takeshi Murakami , Takehide Hayashi , Kiwamu Tsukamoto , Hiroshi Sobukawa , Norio Kimura
IPC分类号： H01J37/244 , H01J37/285 , H01J37/29
CPC分类号： H01J37/22 , H01J37/265 , H01J37/29 , H01J2237/004 , H01J2237/022 , H01J2237/24495 , H01J2237/24564 , H01J2237/2817
摘要： An electro-optical inspection apparatus prevents adhesion of dust or particles to a sample surface, wherein a stage on which a sample is placed is disposed inside a vacuum chamber that can be evacuated, and a dust collecting electrode is disposed to surround a periphery of the sample. The dust collecting electrode is applied with a voltage having the same polarity as a voltage applied to the sample and an absolute value that is the same or larger than an absolute value of the voltage. Because dust or particles adhere to the dust collecting electrode, adhesion of the dust or particles to the sample surface can be reduced. Instead of using the dust collecting electrode, it is possible to form a recess on a wall of the vacuum chamber, or to dispose on the wall a metal plate having a mesh structure to which a predetermined voltage is applied.
摘要翻译：电光检查装置防止灰尘或颗粒附着到样品表面，其中放置样品的阶段设置在可以抽真空的真空室内，并且集尘电极被设置成围绕样品。集尘电极施加与施加到样品的电压极性相同的电压，绝对值等于或大于电压的绝对值。由于灰尘或颗粒附着在集尘电极上，所以可以减少灰尘或颗粒附着到样品表面。代替使用集尘电极，可以在真空室的壁上形成凹部，或者在壁上设置具有施加了预定电压的网状结构的金属板。

97. 发明申请

US20110155905A1 SPECIMEN OBSERVATION METHOD AND DEVICE, AND INSPECTION METHOD AND DEVICE USING THE METHOD AND DEVICE 有权
标题翻译：标本观察方法和装置，以及使用方法和装置的检查方法和装置
公开(公告)号：US20110155905A1
公开(公告)日：2011-06-30
申请号：US12937145
申请日：2009-04-10
申请人： Masahiro Hatakeyama , Takeshi Murakami , Yoshihiko Naito , Kenji Terao , Norio Kimura , Kenji Watanabe
发明人： Masahiro Hatakeyama , Takeshi Murakami , Yoshihiko Naito , Kenji Terao , Norio Kimura , Kenji Watanabe
IPC分类号： G01N23/225 , G01N23/00
CPC分类号： H01J37/28 , H01J37/22 , H01J37/244 , H01J37/29 , H01J2237/24475 , H01J2237/24585 , H01J2237/24592 , H01J2237/2805 , H01J2237/2806 , H01J2237/2817 , H01L22/12
摘要： A technique capable of improving the ability to observe a specimen using an electron beam in an energy region which has not been conventionally given attention is provided. This specimen observation method comprises: irradiating the specimen with an electron beam; detecting electrons to be observed which have been generated and have obtained information on the specimen by the electron beam irradiation; and generating an image of the specimen from the detected electrons to be observed. The electron beam irradiation comprises irradiating the specimen with the electron beam with a landing energy set in a transition region between a secondary emission electron region in which secondary emission electrons are detected and a mirror electron region in which mirror electrons are detected, thereby causing the secondary emission electrons and the mirror electrons to be mixed as the electrons to be observed. The detection of the electrons to be observed comprises performing the detection in a state where the secondary emission electrons and the mirror electrons are mixed. Observation and inspection can be quickly carried out for a fine foreign material and pattern of 100 nm or less.
摘要翻译：提供了一种技术，其能够提高在未经常被注意的能量区域中使用电子束观察样本的能力。该样本观察方法包括：用电子束照射样本; 检测已经产生的待观察的电子，并通过电子束照射获得关于样品的信息; 以及从所检测的电子产生待观察的样本的图像。电子束照射包括用电子束照射样本，其中在其中检测到二次发射电子的二次发射电子区域和其中检测到反射镜电子的镜电子区域之间的过渡区域中设置的着陆能量，从而使次级发射电子和镜电子作为待观察的电子进行混合。要观察的电子的检测包括在二次发射电子和镜电子混合的状态下进行检测。对于100nm以下的细小异物和图案，可以快速进行观察和检查。

98. 发明授权

US07829853B2 Sample surface observation method 有权
标题翻译：样品表面观察法
公开(公告)号：US07829853B2
公开(公告)日：2010-11-09
申请号：US12244139
申请日：2008-10-02
申请人： Kenji Watanabe , Masahiro Hatakeyama , Yoshihiko Naito , Kenji Terao
发明人： Kenji Watanabe , Masahiro Hatakeyama , Yoshihiko Naito , Kenji Terao
IPC分类号： G01N23/00 , G01N23/225 , H01J37/26
CPC分类号： G01N23/2251
摘要： A surface of a sample is observed by acquiring an image of the surface of the sample. An electron beam I irradiated onto the surface of the sample in which wiring including an insulation material and an electrically conductive material is formed. Electrons that acquired structure information regarding a structure of the surface of the sample are detected. An image of the surface of the sample is acquired by a result of the detection of electrons. The surface of the sample is observed using the acquired image of the surface of the sample. The electron beam is irradiated onto the surface of the sample in a state where a brightness of the insulation material and a brightness of the electrically conductive material in the image of the surface of the sample are set equal to each other.
摘要翻译：通过获取样品表面的图像来观察样品的表面。辐射到样品表面上的电子束I，其中形成了包括绝缘材料和导电材料的布线。检测获取关于样品表面结构的结构信息的电子。通过电子检测的结果获得样品表面的图像。使用获取的样品表面的图像观察样品的表面。在将样品表面的图像中的绝缘材料的亮度和导电材料的亮度设定为相等的状态下，将电子束照射在样品的表面上。

99. 植物专利

USPP30148P2 Hydrangea plant named ‘Little Ema’ 有权
公开(公告)号：USPP30148P2
公开(公告)日：2019-01-29
申请号：US15732613
申请日：2017-12-01
申请人： Kenji Watanabe
发明人： Kenji Watanabe
IPC分类号： A01H5/02
摘要： A new and distinct cultivar of Hydrangea plant named ‘Little Ema’, characterized by its white-colored inflorescences, medium green-colored foliage, and moderately vigorous, compact, upright-mounded growth habit, is disclosed.

100. 发明授权

US08849178B2 Sheet detecting apparatus and image forming apparatus 有权
标题翻译：纸张检测装置和图像形成装置
公开(公告)号：US08849178B2
公开(公告)日：2014-09-30
申请号：US13408129
申请日：2012-02-29
申请人： Akira Yoshimura , Kenji Watanabe , Minoru Kawanishi , Motohiro Furusawa , Yohei Suzuki
发明人： Akira Yoshimura , Kenji Watanabe , Minoru Kawanishi , Motohiro Furusawa , Yohei Suzuki
IPC分类号： G03G15/00
CPC分类号： G03G15/6558 , G03G15/235 , G03G15/6561 , G03G2215/00586 , G03G2215/00616 , G03G2215/00721
摘要： A sheet detecting apparatus including: a sheet detecting member having a plurality of abutment surfaces in a peripheral direction thereof, the sheet detecting member being rotated by a conveyed sheet abutting against one of the plurality of abutment surfaces; a detection portion which operates in association with the sheet detecting member; a sensor which generates a signal based on a position of the detection portion; and an urging portion which generates an urging force for positioning the one of the plurality of abutment surfaces of the sheet detecting member in a waiting position in which the leading edge of a sheet conveyed by a conveying portion abuts against the one of the plurality of abutment surfaces, and thereafter the urging portion switching the urging force to an urging force for positioning, in the waiting position, another one of the plurality of abutment surfaces against which a succeeding sheet abuts.
摘要翻译：一种片材检测装置，包括：片材检测部件，其周向具有多个邻接表面，片材检测部件被抵靠在多个邻接表面中的一个的传送片材旋转; 检测部，其与片材检测部件相关联地操作; 传感器，其基于所述检测部的位置生成信号; 以及施力部，其产生用于将片材检测部件的多个抵接面中的一个定位的等待位置，其中由输送部件输送的片材的前缘抵靠在多个抵接部并且此后，所述推动部分将所述推动力切换到用于在所述等待位置中定位另一个所述多个邻接表面中的另一个抵靠表面的推动力，所述多个邻接表面中的另一个邻接表面邻接。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式