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    • 5. 发明授权
    • Method for forming self-aligned channel implants using a gate poly reverse mask
    • 使用栅极多反向掩模形成自对准沟道植入物的方法
    • US06489191B2
    • 2002-12-03
    • US10140571
    • 2002-05-08
    • Kai ShaoYimin WangJian Xun LiShao-Fu Sanford Chu
    • Kai ShaoYimin WangJian Xun LiShao-Fu Sanford Chu
    • H01L218238
    • H01L21/823807Y10S977/712
    • A method for forming a CMOS transistor gate with a self-aligned. channel implant. A semiconductor structure having a first active area is provided. A first insulating layer is formed on the semiconductor structure, and a second insulating layer is formed on the first insulating layer. The second insulating layer is patterned using a poly reverse mask and an etch selective to the first insulating layer to form a first channel implant opening, and the poly reverse mask is removed. A first channel implant mask is formed exposing the first channel implant opening. Impurity ions are implanted through the first channel implant opening to form a first threshhold adjust region and a first anti-punchthrough region. A gate layer is formed over the semiconductor structure, and the first gate layer is planarized to form a gate electrode. The second insulating layer is removed, and lightly doped source and drain regions, sidewall spacers and source and drain regions can be formed adjacent the gate electrode.
    • 一种用于形成具有自对准的CMOS晶体管栅极的方法。 通道植入。 提供具有第一有源区的半导体结构。 在半导体结构上形成第一绝缘层,在第一绝缘层上形成第二绝缘层。 使用多反向掩模和对第一绝缘层选择性地蚀刻第二绝缘层以形成第一沟道注入开口,并且去除多反向掩模。 形成暴露第一通道植入物开口的第一通道植入物掩模。 通过第一通道植入物开口注入杂质离子以形成第一阈值调整区域和第一抗穿透区域。 在半导体结构上形成栅极层,并且第一栅极层被平坦化以形成栅电极。 去除第二绝缘层,并且可以在栅电极附近形成轻掺杂的源极和漏极区域,侧壁间隔物和源极和漏极区域。