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1. 发明授权

US06537710B2 Electrically programmable photolithography mask 失效
公开(公告)号：US06537710B2
公开(公告)日：2003-03-25
申请号：US10112559
申请日：2002-03-28
申请人： Douglas J. Cutter , Christophe Pierrat
发明人： Douglas J. Cutter , Christophe Pierrat
IPC分类号： G03F900
CPC分类号： G03F1/34 , G03F1/26 , G03F1/30 , G03F1/32 , G03F7/70291
摘要： An electronically programmed mask is connected to an electronic device, such as a processor. In operation, a mask design is first entered into the processor. The processor controls a display of an image on the electronically programmed mask, wherein the display replicates conventional type masks. The electronically programmed mask is designed such that the display presented on its screen provides optical contrast and characteristics that are easily changed or reprogrammed by the processor. Electronically controlled masks provide the same patterns as mechanical type masks without requiring rigid, permanent type structures to form a desired pattern.

2. 发明授权

US06528217B2 Electrically programmable photolithography mask 有权
公开(公告)号：US06528217B2
公开(公告)日：2003-03-04
申请号：US10109757
申请日：2002-03-28
申请人： Douglas J. Cutter , Christophe Pierrat
发明人： Douglas J. Cutter , Christophe Pierrat
IPC分类号： G03F900
CPC分类号： G03F1/34 , G03F1/26 , G03F1/30 , G03F1/32 , G03F7/70291
摘要： An electronically programmed mask is connected to an electronic device, such as a processor. In operation, a mask design is first entered into the processor. The processor controls a display of an image on the electronically programmed mask, wherein the display replicates conventional type masks. The electronically programmed mask is designed such that the display presented on its screen provides optical contrast and characteristics that are easily changed or reprogrammed by the processor. Electronically controlled masks provide the same patterns as mechanical type masks without requiring rigid, permanent type structures to form a desired pattern.

3. 发明授权

US06484238B1 Apparatus and method for detecting snoop hits on victim lines issued to a higher level cache 失效
标题翻译：用于检测发出到较高级缓存的受害线上的窥探命中的装置和方法
公开(公告)号：US06484238B1
公开(公告)日：2002-11-19
申请号：US09467352
申请日：1999-12-20
申请人： Douglas J Cutter
发明人： Douglas J Cutter
IPC分类号： G06F1208
CPC分类号： G06F12/0831
摘要： Circuitry for detecting snoop hits during the propagation and storage delay when transmitting a victim address to a bus cluster in a multiprocessor system. The circuitry includes stages for detecting the snoop hits during each cycle of the propagation delay. Each stage includes logic gates for comparing the wordline address with a snoop hit and for outputting a snoop hit signal upon detection of a snoop hit relating to the snoop address.
摘要翻译：在多处理器系统中传送受害者地址到总线集群时，在传播和存储延迟期间检测窥探命中的电路。电路包括用于在传播延迟的每个周期期间检测窥探命中的阶段。每个级包括逻辑门，用于将字线地址与窥探命中进行比较，并且在检测到与窥探地址相关的窥探命中时输出窥探命中信号。

4. 发明授权

US06462608B2 Low current redundancy anti-fuse apparatus 失效
标题翻译：低电流冗余反熔丝装置
公开(公告)号：US06462608B2
公开(公告)日：2002-10-08
申请号：US08896490
申请日：1997-07-18
申请人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
发明人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
IPC分类号： H01H3776
CPC分类号： G11C29/785 , G11C17/18 , G11C29/83
摘要： A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.
摘要翻译：可编程电路包括第一节点并且基于第一节点的状态提供编程信号。第一反熔丝具有编程状态和未编程状态，并且当处于编程状态时将第一节点耦合到第一电源并且当处于未编程状态时将第一节点与第一电源解耦。第二反熔丝具有编程状态和未编程状态，并且当处于编程状态时将第一节点耦合到第二电源，并且当处于未编程状态时将第一节点与第二电源解耦。编程信号的状态可用于用冗余电路元件代替集成电路的主电路元件。

5. 发明授权

US06456149B2 Low current redundancy anti-fuse method and apparatus 有权
公开(公告)号：US06456149B2
公开(公告)日：2002-09-24
申请号：US09794685
申请日：2001-02-27
申请人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
发明人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
IPC分类号： H01H3776
CPC分类号： G11C29/785 , G11C17/18 , G11C29/83
摘要： A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.

6. 发明授权

US06444558B1 Methods of forming and programming junctionless antifuses 有权
标题翻译：无连接反熔丝的形成和编程方法
公开(公告)号：US06444558B1
公开(公告)日：2002-09-03
申请号：US09130781
申请日：1998-08-07
申请人： Douglas J. Cutter , Fan Ho , Kurt D. Beigel
发明人： Douglas J. Cutter , Fan Ho , Kurt D. Beigel
IPC分类号： H01L2900
CPC分类号： H01L23/5252 , H01L2924/0002 , H01L2924/00
摘要： A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.
摘要翻译：用于形成无连接反熔丝半导体结构的方法和装置包括在半导体晶片的非有源区域中形成反熔丝。在一个实施例中，反熔丝形成在多晶硅层上，多晶硅层与场氧化物层耦合。在另一实施例中，多晶硅层包括反熔丝中的底部导体层。在另一个实施例中，在多晶硅层和反熔丝之间形成难熔金属硅化物层。在又一个实施例中，难熔金属硅化物层包括反熔丝中的底部导体层。

7. 发明授权

US06365421B2 Method and apparatus for storage of test results within an integrated circuit 失效
标题翻译：在集成电路内存储测试结果的方法和装置
公开(公告)号：US06365421B2
公开(公告)日：2002-04-02
申请号：US09531023
申请日：2000-03-20
申请人： Brett Debenham , Kim Pierce , Douglas J. Cutter , Kurt Beigel , Fan Ho , Patrick J. Mullarkey , Dien Luong , Hua Zheng , Michael Shore , Jeffrey P. Wright , Adrian E. Ong , Todd A. Merritt
发明人： Brett Debenham , Kim Pierce , Douglas J. Cutter , Kurt Beigel , Fan Ho , Patrick J. Mullarkey , Dien Luong , Hua Zheng , Michael Shore , Jeffrey P. Wright , Adrian E. Ong , Todd A. Merritt
IPC分类号： H01L2166
CPC分类号： H01L27/112 , G01R31/31702 , G01R31/3181 , G11C17/10 , G11C17/18
摘要： An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.
摘要翻译：集成电路存储器件具有多个非易失性可编程元件，用于在测试序列中存储所选择的里程碑处的通过/失败状态位。在测试过程的选定点，元件可以被编程以指示设备已经通过与该过程中的所选点相关联的测试。在对设备执行进一步测试之前，读取该元素以验证其在测试过程中通过先前的测试。如果没有编写适当的元素，则设备被拒绝。可以根据先前的测试步骤重新测试被拒绝的设备。激光熔丝，电可编程熔丝或反熔丝用于存储测试结果。使用电可写非易失性存储器元件允许在器件被封装之后对元件进行编程。

8. 发明授权

US6154398A Low current redundancy anti-fuse method and apparatus 失效
公开(公告)号：US6154398A
公开(公告)日：2000-11-28
申请号：US896702
申请日：1997-07-18
申请人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
发明人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
IPC分类号： G11C17/18 , G11C29/00 , G11C7/00
CPC分类号： G11C29/785 , G11C17/18 , G11C29/83
摘要： A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.

9. 发明授权

US6023431A Low current redundancy anti-fuse method and apparatus 失效
公开(公告)号：US6023431A
公开(公告)日：2000-02-08
申请号：US724851
申请日：1996-10-03
申请人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
发明人： Douglas J. Cutter , Kurt D. Beigel , Fan Ho
IPC分类号： G11C17/18 , G11C29/00 , G11C7/00
CPC分类号： G11C29/785 , G11C17/18 , G11C29/83
摘要： A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.

10. 发明授权

US5982656A Method and apparatus for checking the resistance of programmable elements 失效
标题翻译：用于检查可编程元件电阻的方法和装置
公开(公告)号：US5982656A
公开(公告)日：1999-11-09
申请号：US813767
申请日：1997-03-07
申请人： Douglas J. Cutter , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
发明人： Douglas J. Cutter , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
IPC分类号： G11C17/16 , G11C29/02 , G11C17/00
CPC分类号： G11C29/02 , G11C17/16
摘要： Method and apparatus are disclosed for checking the resistance of programmable circuits in an integrated circuit where each programmable circuit includes a programmable element, such as an antifuse. A precharged node is connected to the programmable element and the voltage at the node discharges based on the resistance of the programmable element. An output signal is produced whose binary value is based on the voltage at the node after a sufficient time has elapsed to allow the initial voltage to discharge based on the resistance of the programmable element.
摘要翻译：公开了用于检查集成电路中的可编程电路的电阻的方法和装置，其中每个可编程电路包括诸如反熔丝的可编程元件。预充电节点连接到可编程元件，并且节点处的电压基于可编程元件的电阻而放电。产生输出信号，其二进制值基于经过足够时间之后的节点处的电压，以允许初始电压基于可编程元件的电阻放电。

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