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    • 2. 发明申请
    • PN-JUNCTION DIODE WITH MULTIPLE CONTACTS AND ANALOG-TO-DIGITAL CONVERTER USING IT
    • 具有多个接点的PN结二极管和使用其的模拟数字转换器
    • WO2015043610A1
    • 2015-04-02
    • PCT/EG2013/000041
    • 2013-12-18
    • KHALEL, Abdel-Rahman Tharwat Refai
    • KHALEL, Abdel-Rahman Tharwat Refai
    • H03M1/36H01L29/808H01L29/10H03K17/687H03K17/76H03K19/094G11C11/56G11C27/00
    • H01L29/808G11C11/56G11C27/005H01L29/1029H01L29/1066H03K17/687H03K17/76H03K19/09425H03K2017/6878H03M1/36
    • The idea is that we can determine Analog Values and use them as a Digital Values in a simple way by using "one Diode" and adjust it to take advantage of the "Depletion-Region" In this case we can build any electronic circuit by using Different Voltages method instead of (0-1) Circuits. Applying this Idea and using this new electronic pieces will enable us to build smaller, faster electronic circuits with better performance and lower cost. For example, Storage device will store more than one number "0, 1, 2, 3, etc." in each storage unit depending on the accuracy of manufacture, while current storage device can store only one values (1 or 0), the new electronic circuits allow us to store more information in storage units less in size and quantity also. This application of the new electronic piece will enable us to use Different Voltages method and replace the conventional method (0-1) circuits. There are many other usages and applications, for instance we can use it in all logic circuits as Processor or any other circuit use (0-1) and convert it to circuits use the Different Voltages method to make data processing.
    • 这个想法是,我们可以通过使用“一个二极管”来简单地确定模拟值并将其用作数字值,并调整它以利用“耗尽区域”在这种情况下,我们可以使用 不同的电压方法代替(0-1)电路。 应用这个想法并使用这个新的电子部件将使我们能够以更好的性能和更低的成本构建更小更快的电子电路。 例如,存储设备将存储多个数字“0,1,2,3等” 在每个存储单元中,根据制造的准确性,当前存储设备只能存储一个值(1或0)时,新的电子电路允许我们在更小的尺寸和数量的存储单元中存储更多的信息。 新电子片的应用将使我们能够使用不同的电压方法和替代传统的方法(0-1)电路。 还有许多其他用途和应用,例如我们可以在所有逻辑电路中使用它作为处理器或任何其他电路使用(0-1),并将其转换为电路使用不同的电压方法进行数据处理。
    • 3. 发明申请
    • TEMPERATURE COMPENSATION METHOD FOR HIGH-DENSITY FLOATING-GATE MEMORY
    • 用于高密度浮动门存储器的温度补偿方法
    • WO2013081991A1
    • 2013-06-06
    • PCT/US2012/066584
    • 2012-11-27
    • BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY
    • CHAKRABARTTY, ShantanuGU, MingHUANG, Chenling
    • G11C16/04G11C27/00G11C27/02
    • H01L27/11526G11C7/04G11C16/0408G11C16/0441G11C27/005G11C27/028H01L27/0629H01L28/40
    • A temperature compensation technique is provided for a non-volatile memory arrangement. The memory arrangement includes: a memory circuit (12) having a floating gate transistor (P3) operating in weak-inversion mode and a varactor (C v ) with a terminal electrically coupled to a gate node of the floating gate transistor; a first current reference circuit (14) having a floating gate transistor (PI); a second current reference circuit (16) having a floating gate transistor (P2); and a control module (18) configured to selectively receive a reference current ( I 1 , l 2 ) from a drain of the floating gate transistor in each of the first and second current reference circuits. The control module operates to determine a ratio between the reference currents received from the first and second current reference circuits, generate a tuning voltage (V x ) in accordance with the ratio between the reference currents and apply the tuning voltage to the varactor in the memory circuit.
    • 为非易失性存储器装置提供温度补偿技术。 存储器装置包括:具有以弱反相模式工作的浮栅晶体管(P3)的存储器电路(12)和与浮栅晶体管的栅极节点电耦合的端子的变容二极管(Cv); 具有浮置栅极晶体管(PI)的第一电流参考电路(14); 具有浮置栅极晶体管(P2)的第二电流参考电路(16); 以及控制模块(18),被配置为从所述第一和第二电流参考电路中的每一个中的所述浮动栅极晶体管的漏极选择性地接收参考电流(I1,I2)。 控制模块操作以确定从第一和第二电流参考电路接收的参考电流之间的比率,根据参考电流之间的比率产生调谐电压(Vx),并将调谐电压施加到存储器电路中的变容二极管 。
    • 4. 发明申请
    • CIRCUIT DE LECTURE D'UN ELEMENT DE RETENTION DE CHARGES POUR MESURE TEMPORELLE
    • 用于读取用于时间测量的负载保持元件的电路
    • WO2008012462A2
    • 2008-01-31
    • PCT/FR2007/051700
    • 2007-07-20
    • STMICROELECTRONICS SALA ROSA, Francesco
    • LA ROSA, Francesco
    • G11C27/00G11C7/10
    • G11C7/06G04F10/10G11C7/062
    • L'invention concerne un procédé et un circuit de lecture d'un élément électronique de rétention de charges (10) pour une mesure temporelle, du type comportant au moins un élément capacitif (C1, C2) dont le diélectrique présente une fuite et un transistor à borne de commande isolée (5) de lecture des charges résiduelles, le circuit de lecture comportant : deux branches parallèles entre deux bornes d'alimentation, chaque branche comportant au moins un transistor d'un premier type (P1, P2) et un transistor d'un deuxième type (N3, 5), le transistor du deuxième type de l'une des branches étant constitué par celui de l'élément à lire et le transistor du deuxième type de l'autre branche recevant, sur sa borne de commande, un signal (VDAC) en escalier, les drains respectifs des transistors du premier type étant connectés aux entrées respectives d'un comparateur (135) dont la sortie (OUT) fournit une indication du niveau de tension résiduel dans l'élément de rétention de charges.
    • 本发明涉及一种方法 和的一个读电路的éL E包换é负载(10),用于进行时间测量,所述类型的,其包括至少一个E L E包换电容(C1,C2),其二的DE电子řé张力 电气呈现泄漏和晶体管。 (5),用于读取残余电荷,所述读取电路包括:在两个供电端子之间的两个并联分支,每个分支包括至少一个第一类型的晶体管(P1, P2)和第二类型的晶体管(N3,5),形成第二类型的一个分支的晶体管。 由那个“ 读和第二&egrave的晶体管;我类型的其他分支接收的,其控制端子,在步骤信号(VDAC)上,所述第一类型E的晶体管作为连接(E S)中,以输入的各自的漏极éES各自d 其输出(OUT)提供电荷保持元件中的剩余电压电平的指示的比较器(135)。

    • 5. 发明申请
    • ANALOG FLOATING GATE VOLTAGE SENSE DURING DUAL CONDUCTION PROGRAMMING
    • 双向导通编程期间模拟浮动门电压检测
    • WO2004070987A3
    • 2005-02-17
    • PCT/US2004001697
    • 2004-01-21
    • XICOR INCOWEN WILLIAM
    • OWEN WILLIAM
    • G11C16/04G11C16/34G11C27/00H03K5/153H03K5/22H03K5/24H04L20060101
    • H03K5/2481G11C16/0441G11C16/3468G11C27/005H03K5/249
    • A method for sensing the voltage on a floating gate in a floating gate circuit during a set mode is disclosed. The method includes the steps of: a) causing the floating gate circuit (30) to enter into a set mode, wherein a first predetermined voltage (Vset) is coupled to the gate of a second transistor (T2) in the floating gate circuit; b) causing the voltage on the floating gate to be sensed relative to the first voltage by a first transistor (T1); c) causing an output voltage (Vout) to be generated by the floating gate circuit; and d) causing the voltage on the floating gate to be modified as a function of the output voltage, including modifying the charge level on said floating gate under the control of a first tunnel device (Te) and a second tunnel device (Tp) operating in dual conduction during said set mode, said first tunnel device formed between said floating gate and a first tunnel electrode (Ee) and said second tunnel device formed between said floating gate and a second tunnel electrode (Ep); and e) repeating steps b) through d) until the voltage on the floating gate is approximately equal to the first voltage.
    • 公开了一种用于在设定模式期间感测浮置栅极电路中的电压的方法。 该方法包括以下步骤:a)使浮置门电路(30)进入设定模式,其中第一预定电压(Vset)耦合到浮置栅极电路中的第二晶体管(T2)的栅极; b)通过第一晶体管(T1)使得浮动栅极上的电压相对于第一电压被感测; c)使浮置电路产生输出电压(Vout); 以及d)使得浮动栅极上的电压作为输出电压的函数被修改,包括在第一隧道装置(Te)和第二隧道装置(Tp)的控制下修改所述浮动栅极上的电荷水平 在所述设定模式期间,在所述浮置栅极和第一隧道电极(Ee)之间形成所述第一隧道装置,所述第二隧道装置形成在所述浮置栅极和第二隧道电极(Ep)之间; 和e)重复步骤b)至d),直到浮动栅极上的电压近似等于第一电压。
    • 6. 发明申请
    • TRACK AND HOLD CIRCUIT
    • 跟踪和保持电路
    • WO2004086408A1
    • 2004-10-07
    • PCT/IB2004/050309
    • 2004-03-22
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.SANDULEANU, Mihai, A., T.STIKVOORT, Eduard, F.
    • SANDULEANU, Mihai, A., T.STIKVOORT, Eduard, F.
    • G11C27/00
    • G11C27/00
    • A track and hold circuit (1) comprising: - a linear amplifier (2) receiving a differential analog signal (D+, D-) and being controlled by a first binary clock signal (H+) having a first phase, - the linear amplifier (2) providing a feed-forward input signal substantially equal with the differential analog signal (D+, D-) to a pseudo latch circuit (3) in the first phase of the first binary clock signal (H+), said pseudo latch circuit (3) being controlled by a second binary clock signal (H-) for memorizing the input signal and providing a differential output signal (LD+, LD-) substantially equal with the input signal during a second phase of the first binary clock signal (H-), the second binary clock signal being substantially in anti­phase with the first binary clock signal (H+).
    • 一种跟踪和保持电路(1),包括: - 线性放大器(2),其接收差分模拟信号(D +,D-)并由具有第一相位的第一二进制时钟信号(H +)控制, - 线性放大器 2)在第一二进制时钟信号(H +)的第一相位向伪锁存电路(3)提供与差分模拟信号(D +,D-)基本相等的前馈输入信号,所述伪锁存电路(3) )由第二二进制时钟信号(H-)控制,用于存储输入信号,并在第一二进制时钟信号(H)的第二相位期间提供与输入信号基本相等的差分输出信号(LD +,LD-) 第二二进制时钟信号基本上与第一二进制时钟信号(H +)反相。
    • 9. 发明申请
    • SEMICONDUCTOR MEMORY CARD AND DATA READING APPARATUS
    • 半导体存储卡和数据读取装置
    • WO00065602A1
    • 2000-11-02
    • PCT/JP2000/002309
    • 2000-04-10
    • G06F12/14G06F1/00G06F21/00G06F21/24G06K17/00G06K19/073G11C16/22G11C27/00H04L9/08H04L9/32
    • G06F21/10G06F21/445G06F21/6218G06F21/78G06F21/79G06F2221/2105G06Q20/3674G11C16/22H04L9/3273H04L2209/603
    • A semiconductor memory card comprising a control IC (302), a flash memory (303), and a ROM (304). The ROM (304) holds information such as a medium ID (341) unique to the semiconductor memory card. The flash memory (303) includes an authentication memory (332) and a non-authentication memory (331). The authentication memory (332) can be accessed only by external devices which have been affirmatively authenticated. The non-authentication memory 331 can be accessed by external devices whether the external devices have been affirmatively authenticated or not. The control IC (302) includes control units (325) and (326), an authentication unit (321) and the like. The control units (325) and (326) control accesses to the authentication memory (332) and the non-authentication memory (331), respectively. The authentication unit (321) executes a mutual authentication with an external device.
    • 一种包括控制IC(302),闪速存储器(303)和ROM(304)的半导体存储卡。 ROM(304)保存诸如半导体存储卡唯一的介质ID(341)的信息。 闪存(303)包括认证存储器(332)和非验证存储器(331)。 认证存储器(332)只能被已经被肯定认证的外部设备访问。 外部设备可以访问非认证存储器331,无论外部设备是否被肯定认证。 控制IC(302)包括控制单元(325)和(326),认证单元(321)等。 控制单元(325)和(326)分别控制对认证存储器(332)和非验证存储器(331)的访问。 认证单元(321)执行与外部设备的相互认证。