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1. 发明申请

WO2014125098A1 HIGH - RESOLUTION AMPLITUDE CONTRAST IMAGING 审中-公开
标题翻译：高分辨率放大对比成像
公开(公告)号：WO2014125098A1
公开(公告)日：2014-08-21
申请号：PCT/EP2014/052973
申请日：2014-02-14
申请人： UNIVERSITEIT ANTWERPEN , FEI COMPANY
发明人： VAN DYCK, Dirk , LUCKEN, Uwe , STARK, Holger
IPC分类号： G01N23/04 , H01J37/26
CPC分类号： H01J37/265 , G01N23/04 , G01N2223/0565 , G01N2223/612 , H01J37/06 , H01J37/244 , H01J37/26 , H01J2237/063 , H01J2237/1534 , H01J2237/2602 , H01J2237/2614
摘要： A method for performing high resolution electron microscopy of a soft matter object (17) is described. The method comprises irradiating a soft matter object using an electron microscope (1) having a spherical aberration correction (10) with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.
摘要翻译：描述了用于执行软物体（17）的高分辨率电子显微镜的方法。该方法包括使用具有球面像差校正（10）的电子显微镜（1）照射软物体，该电子显微镜（1）在软物体散射的热散射电子的频带中具有基本恒定的传递函数。该方法包括检测在软物质处散射的热散射散射（TDS）电子，并使用检测到的热散射电子从其中导出软物体的图像。

2. 发明申请

WO2012163860A2 METHODS AND SYSTEMS FOR MATERIAL CHARACTERIZATION 审中-公开
标题翻译：材料表征的方法和系统
公开(公告)号：WO2012163860A2
公开(公告)日：2012-12-06
申请号：PCT/EP2012/059914
申请日：2012-05-25
申请人： UNIVERSITEIT ANTWERPEN , NATIONAL TSING HUA UNIVERSITY , VAN DYCK, Dirk , CHEN, Fu-Rong
发明人： VAN DYCK, Dirk , CHEN, Fu-Rong
IPC分类号： H01J37/22 , H01J37/26 , G01N23/02
CPC分类号： H01J37/265 , G01N23/046 , G01N23/225 , G01N2223/064 , G01N2223/414 , G01N2223/419 , G01N2223/61 , G01N2223/611 , H01J37/222 , H01J37/26 , H01J2237/226 , H01J2237/2614
摘要： The present invention pertains to methods and systems for material characterization. A method (100) is disclosed for determining information regarding an object comprising particles. The method (100) comprises obtaining (110) a wave function representative of the object detected at a detection surface of a detection system for detecting the wave function, deriving (120) at least two spatial frequencies of the detected wave function and deriving (130) for each of said at least two spatial frequencies at least a phase based on the obtained wave function. Furthermore, a functional relationship between the spatial frequency and the phase is analyzed (140) for the spatial frequencies. At least one parameter indicative of a property of the object is derived therefrom. A corresponding system (200) is also disclosed as well as corresponding computer-related products.
摘要翻译：本发明涉及用于材料表征的方法和系统。公开了一种用于确定关于包括粒子的物体的信息的方法（100）。方法（100）包括获得（110）表示在检测系统的检测表面检测到的物体的波函数，用于检测波函数，导出（120）所检测的波函数的至少两个空间频率并导出（130 ）对于所述至少两个空间频率中的每一个至少基于所获得的波函数的相位。此外，空间频率和相位之间的功能关系被分析（140）用于空间频率。从中导出指示对象的属性的至少一个参数。还公开了相应的系统（200）以及相应的计算机相关产品。

3. 发明申请

WO2011033097A1 METHODS AND SYSTEMS FOR TOMOGRAPHIC RECONSTRUCTION OF COHERENT RADIATION IMAGES 审中-公开
标题翻译：用于同位素重建相干辐射图像的方法和系统
公开(公告)号：WO2011033097A1
公开(公告)日：2011-03-24
申请号：PCT/EP2010/063768
申请日：2010-09-20
申请人： UNIVERSITEIT ANTWERPEN , VAN DYCK, Dirk
发明人： VAN DYCK, Dirk
IPC分类号： G06T11/00 , H01J37/22
CPC分类号： G06T11/006 , H01J37/222 , H01J37/26 , H01J2237/226 , H01J2237/2611
摘要： A method and system are described for reconstructing a coherent radiation tomographic image of at least one object. The method comprises performing back-projection, whereby performing back-projection comprises taking into account propagation waves from the point of interaction to a plane of detection. Furthermore a method is described for studying objects, wherein a plurality of objects are imaged on a substrate using coherent radiation tomography and whereby the method as described above is used for characterizing the objects.
摘要翻译：描述了用于重建至少一个对象的相干辐射断层图像的方法和系统。该方法包括执行反投影，由此执行反投影包括考虑从相互作用点到检测平面的传播波。此外，描述了一种用于研究物体的方法，其中使用相干辐射断层摄影将多个物体成像在基底上，并且由此使用上述方法来表征物体。

4. 发明申请

WO2023072840A1 INTRAOCULAR LENS 审中-公开
公开(公告)号：WO2023072840A1
公开(公告)日：2023-05-04
申请号：PCT/EP2022/079610
申请日：2022-10-24
申请人： UNIVERSITEIT ANTWERPEN , UNIVERSITAIR ZIEKENHUIS ANTWERPEN
发明人： VAN DYCK, Dirk , TASSIGNON, Marie-José , GOBIN, Laure
IPC分类号： G02B3/10 , G02C7/06
摘要： The application pertains to an intraocular lens (100) for contributing to the focusing of incident light onto a retina (70) of a user, the intraocular lens (100) comprising: a first surface (110), and a second surface (120), wherein said first surface (110) is configured to refractively focus said incident light, said first surface (110) exhibiting a non-uniform refractive power; wherein said second surface (120) is provided with a diffraction generating profile in the shape of a zero-order Bessel function configured to spatially separate said incident light into at least a first portion having a first spatial frequency characteristic and a second portion having a second spatial frequency characteristic; and wherein said spatial separation and said non-uniform refractive power of said first surface (110) cause said first portion to be refracted by said first surface (110) at a first level of refractive power and said second portion to be refracted by said first surface (110) at a second level of refractive power, said first level of refractive power and said second level of refractive power being different.

5. 发明申请

WO2011033098A1 METHODS AND SYSTEMS FOR USING PHASE PLATES 审中-公开
标题翻译：使用相位板的方法和系统
公开(公告)号：WO2011033098A1
公开(公告)日：2011-03-24
申请号：PCT/EP2010/063769
申请日：2010-09-20
申请人： UNIVERSITEIT ANTWERPEN , VAN DYCK, Dirk
发明人： VAN DYCK, Dirk
IPC分类号： H01J37/26
CPC分类号： H01J37/26 , H01J37/222 , H01J2237/2614 , H01J2237/2802
摘要： A method (100) and system are described for obtaining wave function data from electron microscope measurements. The method comprises receiving (110) electron microscope image intensity data acquired using a phase inducing means whereby the data are acquired over predetermined image recording times and whereby a phase shift induced by the phase inducing means is kept constant. The method furthermore comprises extracting (130) wave function data from the electron microscope image intensity data acquired over predetermined electron microscopy image recording times, whereby the predetermined electron microscopy image recording times are function of a phase shift angle. A corresponding transmission microscope and corresponding computer related products also are disclosed.
摘要翻译：描述了从电子显微镜测量获得波函数数据的方法（100）和系统。该方法包括：接收使用相位诱导装置获取的（110）电子显微镜图像强度数据，由此通过预定图像记录时间获取数据，由此由相位诱导装置引起的相移保持恒定。该方法还包括从预定的电子显微镜图像记录时间获取的电子显微镜图像强度数据中提取（130）波函数数据，由此预定的电子显微镜图像记录时间是相移角的函数。相应的透射显微镜和相应的计算机相关产品也被公开。

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