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    • 8. 发明申请
    • METHOD FOR FORMING A BARRIER/SEED LAYER FOR COPPER METALLIZATION
    • 用于形成用于铜金属化的障碍物/种子层的方法
    • WO2006107545A3
    • 2006-12-07
    • PCT/US2006009219
    • 2006-03-14
    • TOKYO ELECTRON LTDTOKYO ELECTRON AMERICA INCSUZUKI KENJI
    • SUZUKI KENJI
    • C23C16/16C23C16/06C23C16/18H01L21/288
    • C23C16/52C23C16/16H01L21/28556H01L21/76843H01L21/76846H01L21/76856H01L21/76873H01L21/76874
    • A method (400) for improving adhesion of Cu to a Ru layer (650a, 650b) in Cu metallization. The method (400) includes providing a substrate (25, 125) in a process chamber (10, 110) of a deposition system (1 , 100), depositing a Ru layer (650a, 650b) on the substrate (25, 125) in a chemical vapor deposition process, and forming a Cu seed layer (660a, 660b) on the Ru layer (650a, 650b) to prevent oxidation of the Ru layer (650a, 650b). The Cu seed layer (660a, 660b) is partially or completely oxidized prior to performing a Cu bulk plating process on the substrate (25, 125). The oxidized portion (660a, 667) of the Cu seed layer (660a, 660b) is substantially dissolved and removed from the substrate (25, 125) during interaction with a Cu plating solution, thereby forming a bulk Cu layer (670a, 670b) with good adhesion to the underlying Ru layer (650a, 650b).
    • 一种用于在Cu金属化中改善Cu与Ru层(650a,650b)的附着力的方法(400)。 方法(400)包括在沉积系统(1,100)的处理室(10,110)中提供衬底(25,125),在衬底(25,125)上沉积Ru层(650a,650b) 在化学气相沉积工艺中,并且在Ru层(650a,650b)上形成Cu籽晶层(660a,660b)以防止Ru层(650a,650b)的氧化。 在对基板(25,125)进行Cu体积电镀处理之前,Cu籽晶层(660a,660b)被部分或完全氧化。 在与Cu电镀溶液相互作用的过程中,Cu籽层(660a,660b)的氧化部分(660a,660b)基本上溶解并从衬底(25,125)除去,从而形成本体Cu层(670a,670b) 与下面的Ru层(650a,650b)具有良好的粘合性。
    • 9. 发明申请
    • METHOD FOR DEPOSITION OF METAL LAYERS FROM METAL CARBONYL PRECURSORS
    • 从金属碳前驱体沉积金属层的方法
    • WO2006057706A3
    • 2006-11-09
    • PCT/US2005035429
    • 2005-10-03
    • TOKYO ELECTRON LTDTOKYO ELECTRON AMERICA INCSUZUKI KENJI
    • SUZUKI KENJI
    • C23C16/16H01L21/768
    • H01L21/76846C23C16/16H01L21/28556
    • A method (300) and a deposition system (1, 100) for increasing deposition rates of metal layers (440, 460) from metal-carbonyl precursors (52, 152) using CO gas and a dilution gas. The method (300) includes providing a substrate (25, 125, 400, 402) in a process chamber (10, 110) of a processing system (1, 100), forming a process gas containing a metal-carbonyl precursor vapor and a CO gas, diluting the process gas in the process chamber (10, 110), and exposing the substrate (25, 125, 400, 402) to the diluted process gas to deposit a metal layer (440, 460) on the substrate (25, 125, 400, 402) by a thermal chemical vapor deposition process. The deposition system (1, 100) contains a substrate holder (20, 120) configured for supporting and heating a substrate (25, 125, 400, 402) in a process chamber (10, 110) having a vapor distribution system (30, 130), a precursor delivery system (105) configured for forming a process gas containing a metal-carbonyl precursor vapor and a CO gas and for introducing the process gas to the vapor distribution system (30, 130), a dilution gas source (37, 137) configured for adding a dilution gas to the process gas in the process chamber (10, 110), and a controller (165) configured for controlling the deposition system (1, 100) during exposure of the substrate (25, 125, 400, 402) to the diluted process gas to deposit a metal layer (440, 460) on the substrate (25, 125, 400, 402) by a thermal chemical vapor deposition process.
    • 一种用于使用CO气体和稀释气体从金属羰基前体(52,152)提高金属层(440,460)的沉积速率的方法(300)和沉积系统(1,100)。 方法(300)包括在处理系统(1,100)的处理室(10,110)中提供衬底(25,125,400,402),形成含有羰基金属前体蒸气和 CO气体,稀释处理室(10,110)中的工艺气体,以及将衬底(25,125,400,402)暴露于稀释工艺气体,以将金属层(440,460)沉积在衬底(25)上 ,125,400,402)通过热化学气相沉积工艺。 沉积系统(1,100)包括衬底保持器(20,120),衬底保持器(20,120)被配置为支撑和加热处理室(10,110)中的衬底(25,125,400,402),所述处理室具有蒸气分配系统 130),前体输送系统(105),其被配置用于形成含有羰基金属前体蒸气和CO气体的工艺气体,并用于将所述工艺气体引入所述蒸气分配系统(30,130);稀释气体源 ,137),被配置为将稀释气体添加到所述处理室(10,110)中的处理气体;以及控制器(165),被配置为在所述基板(25,125)暴露期间控制所述沉积系统(100) 400,402)与稀释的工艺气体通过热化学气相沉积工艺将金属层(440,460)沉积在衬底(25,125,400,402)上。
    • 10. 发明申请
    • METHOD FOR INTEGRATING A CONFORMAL RUTHENIUM LAYER INTO COPPER METALLIZATION OF HIGH ASPECT RATIO FEATURES
    • 将均匀钌层集成到高纵横比铜箔金属化的方法
    • WO2007117802A3
    • 2008-01-03
    • PCT/US2007063570
    • 2007-03-08
    • TOKYO ELECTRON LTDTOKYO ELECTRON AMERICA INCSUZUKI KENJI
    • SUZUKI KENJI
    • H01L21/768
    • H01L21/76843C23C16/16H01L21/28556H01L21/76805H01L21/76844H01L21/76873H01L2221/1089
    • A method of integrated processing of a patterned substrate (400, 600) for copper metallization. The method includes providing the patterned substrate (400, 600) containing a via (426, 626) and a trench (424, 624) in a vacuum processing tool (300), and performing an integrated process on the patterned substrate (400, 600) in the vacuum processing tool (300) by depositing a first metal-containing layer (428, 628) over the patterned substrate (400, 600), removing by sputter etching the first metal-containing layer (428, 628) from the bottom (426b, 626b) of the via (426, 626) and at least partially removing the first metal-containing layer (428, 628) from the bottom (424b, 624b) of the trench (424,624), depositing a conformal Ru layer (432, 632) onto the sputter etched first metal-containing layer (428a, 628a), depositing a non-conformal Cu layer (434,634) on the conformal Ru layer (432), and plating Cu (436, 636) over the patterned substrate (400, 600). According to one embodiment of the invention, the method can further include depositing a second metal-containing layer (430) onto the sputter etched first metal-containing layer (428a) prior to depositing the conformal Ru layer (432).
    • 一种用于铜金属化的图案化衬底(400,600)的集成处理方法。 该方法包括在真空处理工具(300)中提供包含通孔(426,626)和沟槽(424,624)的图案化衬底(400,600),并且在图案化衬底(400,600)上执行集成处理 )通过在图案化衬底(400,600)上沉积第一含金属层(428,628),通过从底部溅射蚀刻去除第一含金属层(428,628)而在真空处理工具(300) (426,626)的至少一部分(426b,626b),并且从沟槽(424,624)的底部(424b,624b)至少部分地去除第一含金属层(428,628),沉积共形Ru层 (428a,628a)上,在共形Ru层(432)上沉积非共形Cu层(434,634),以及在图案化衬底(436,636)上电镀Cu(436,636) (400,600)。 根据本发明的一个实施例,该方法可以进一步包括在沉积共形Ru层(432)之前,在溅射蚀刻的第一含金属层(428a)上沉积第二含金属层(430)。