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    • 1. 发明申请
    • SIMULTANEOUS MULTI-STATE READ OR VERIFY IN NON-VOLATILE STORAGE
    • 在非易失性存储中同时进行多状态读取或验证
    • WO2011119500A1
    • 2011-09-29
    • PCT/US2011/029256
    • 2011-03-21
    • SANDISK IL LTD.SHARON, EranLI, YanMOKHLESI, Nima
    • SHARON, EranLI, YanMOKHLESI, Nima
    • G11C11/56G11C16/04G11C16/34
    • G11C16/3459G11C11/5642G11C16/0483G11C16/3454G11C2211/5624G11C2211/5631
    • Methods and devices for simultaneously verifying or reading multiple states in non-volatile storage are disclosed. Methods and devices for efficiently reducing or eliminating cross-coupling effects in non-volatile storage are disclosed. Methods and devices for efficiently performing reads at a number of voltages to search for the threshold voltage of a memory cell are disclosed. Memory cells on different NAND strings that are read at the same time may be tested for different threshold voltage levels. Memory cells may be tested for different threshold voltages by applying different gate-to-source voltages to memory cells being tested for different threshold voltages. Memory cells may be tested for different threshold voltages by applying different drain to source voltages to the memory cells. Different amounts of compensation for cross- coupling affects may be applied to memory cells on different NAND strings that are read or programmed at the same time.
    • 公开了用于同时验证或读取非易失性存储器中的多个状态的方法和装置。 公开了用于有效地减少或消除非易失性存储器中的交叉耦合效应的方法和装置。 公开了用于有效执行多个电压读取以搜索存储器单元的阈值电压的方法和装置。 可以在不同的NAND串上同时读取的存储单元测试不同的阈值电压电平。 可以通过对不同阈值电压进行测试的存储器单元施加不同的栅极至源极电压来对不同阈值电压进行存储单元的测试。 可以通过对存储器单元施加不同的漏极到源极电压来对不同的阈值电压测试存储器单元。 交叉耦合影响的不同量的补偿可以应用于同时读取或编程的不同NAND串上的存储单元。
    • 3. 发明申请
    • AUXILIARY PARITY BITS FOR DATA WRITTEN IN MULTI-LEVEL CELLS
    • 用于在多级电池中写入数据的辅助奇偶校验位
    • WO2011073710A1
    • 2011-06-23
    • PCT/IB2009/007789
    • 2009-12-16
    • SANDISK IL LTDSHARON, EranALROD, Idan
    • SHARON, EranALROD, Idan
    • G06F11/10
    • G06F11/1048G06F11/1072
    • Methods of writing data to and reading data from memory devices and systems for writing and reading data are disclosed. In a particular embodiment, a method includes writing data bits a first time into a memory. Auxiliary parity bits are written in the memory, where the auxiliary parity bits are computed based on the data bits. Subsequent to writing the data bits a first time and writing the auxiliary parity bits, the data bits are written a second time into the memory. Writing the data bits the first time and writing the data bits the second time are directed to one or more storage elements at a common physical address in the memory. Subsequent to writing the data bits the second time, the auxiliary parity bits are discarded while maintaining the data bits in the memory.
    • 公开了将数据写入和读取数据的方法,用于从存储器件和系统读取和读取数据。 在特定实施例中,一种方法包括将数据位第一次写入存储器。 辅助奇偶校验位写入存储器中,其中辅助奇偶校验位基于数据位计算。 在第一次写入数据位并写入辅助奇偶校验位之后,将数据位第二次写入存储器。 第一次写入数据位并且第二次写入数据位将被引导到存储器中公共物理地址的一个或多个存储元件。 在第二次写数据位之后,辅助奇偶校验位被丢弃,同时保持存储器中的数据位。
    • 5. 发明申请
    • ADAPTIVE DYNAMIC READING OF FLASH MEMORIES
    • 闪存的自适应动态读取
    • WO2008129534A1
    • 2008-10-30
    • PCT/IL2008/000507
    • 2008-04-14
    • SANDISK IL LTD.SHARON, EranALROD, IdanSHLICK, Marc
    • SHARON, EranALROD, IdanSHLICK, Marc
    • G11C16/28G11C11/56
    • G11C16/10G11C11/5628G11C11/5642G11C16/28G11C2211/5634
    • Each of a plurality of flash memory cells is programmed to a respective one of L≥2 threshold voltage states within a threshold voltage window. A histogram is constructed by determining how many of some or all of the cells have threshold voltages in each of two or more of m≥2 threshold voltage intervals within the threshold voltage window. Reference voltages for reading the cells are selected based on estimated values of shape parameters of the histogram. Alternatively, the cells are read relative to reference voltages that define m≥2 threshold voltage intervals that span the threshold voltage window, to determine numbers of at least a portion of the cells whose threshold voltages are in each of two or more of the threshold voltage intervals. Respective threshold voltage states are assigned to the cells based on the numbers without re-reading the cells.
    • 多个闪存单元中的每一个被编程为阈值电压窗口内的L = 2个阈值电压状态中的相应一个。 通过确定在阈值电压窗口内的两个或多个m = 2阈值电压间隔中的每一个中的一些或全部单元中有多少个具有阈值电压来构造直方图。 基于直方图的形状参数的估计值来选择用于读取单元的参考电压。 或者,相对于限定跨越阈值电压窗口的m = 2个阈值电压间隔的参考电压读取单元,以确定阈值电压处于阈值电压中的两个或更多个阈值电压中的每一个中的至少一部分单元的数量 间隔。 基于数字将各个阈值电压状态分配给单元,而不重新读取单元。
    • 7. 发明申请
    • FLASH MEMORY DEVICE, SYSTEM AND METHOD WITH RANDOMIZING FOR SUPPRESSING ERROR
    • 闪存存储器件,用于抑制误差的随机化的系统和方法
    • WO2008078314A1
    • 2008-07-03
    • PCT/IL2007/001514
    • 2007-12-06
    • SANDISK IL LTDSHARON, EranALROD, Eran
    • SHARON, EranALROD, Eran
    • G11C16/04G11C16/34G11C7/10
    • G11C16/0483G11C7/1006G11C11/5621G11C16/3418
    • A device and method for storing data includes a nonvolatile memory and a controller and/or circuitry that randomize original data to be stored in the memory while preserving the size of the original data, that store the original data in the memory, and that, in response to a request for the original data, retrieve, derandomize and export the original data without authenticating the requesting entity. A system and method for storing data includes a first nonvolatile memory and a processor that similarly stores data in the first nonvolatile memory by executing driver code stored in a second nonvolatile memory. EEC encloding is applied either before or after randomizing; correspondingly, EEC decoding is applied either after or before derandomizing.
    • 用于存储数据的设备和方法包括非易失性存储器和随机化要存储在存储器中的原始数据的控制器和/或电路,同时保留将原始数据存储在存储器中的原始数据的大小,并且在 响应原始数据的请求,检索,脱机和导出原始数据,而不对请求实体进行验证。 用于存储数据的系统和方法包括通过执行存储在第二非易失性存储器中的驱动程序代码,将第一非易失性存储器和处理器类似地存储在第一非易失性存储器中的数据。 随机分组前后应用EEC包围; 相应地,EEC解码应用于脱机之前或之后。
    • 9. 发明申请
    • DATA CODING USING DIVISIONS OF MEMORY CELL STATES
    • 使用存储器状态部分的数据编码
    • WO2012020278A1
    • 2012-02-16
    • PCT/IB2010/002245
    • 2010-09-09
    • SANDISK IL LTD.SHARON, EranALROD, Idan
    • SHARON, EranALROD, Idan
    • G11C7/10G11C11/56G11C16/10G11C16/26H03M13/09
    • G11C7/1006G06F12/0246G11C11/5642G11C16/10G11C16/26
    • Data storage devices and methods to encode and decode data using divisions of memory cell states are disclosed. A method includes dividing data bits into disjoint multiple groups of data bits and storing the data bits into a plurality of memory cells. The storing is done by setting each of the plurality of memory cells to a corresponding state selected from at least three ordered states. For each of the multiple groups of data bits, when a request is received for reading a particular group of the data bits, the request is serviced by selecting a disjoint division of the at least three ordered states of the memory cells into a first set of states and a second set of states. Each of the states in the first set of states has a higher position than any of the states in the second set of states according to the order of the states. For each cell of the plurality of memory cells, a determination is made whether the cell is in the first set of states or the second set of states. Based on the determination, the particular group of the data bits is generated in response to the request for reading the particular group of the data bits without use of additional data that depends upon a state of one of the memory cells.
    • 公开了使用存储单元状态的划分对数据进行编码和解码的数据存储设备和方法。 一种方法包括将数据位分成不相交的多组数据位并将数据位存储到多个存储单元中。 通过将多个存储单元中的每一个设置为从至少三个有序状态中选择的对应状态来进行存储。 对于多组数据位中的每一组,当接收到用于读取特定数据位组的请求时,通过选择存储器单元的至少三个有序状态的不相交分割为第一组 状态和第二组状态。 根据状态的顺序,第一组状态中的每个状态具有比第二组状态中的任何状态更高的位置。 对于多个存储器单元中的每个单元,确定单元是处于第一组状态还是第二组状态。 基于该确定,响应于读取特定数据位组的请求而生成数据位的特定组,而不使用取决于存储器单元之一的状态的附加数据。