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    • 4. 发明申请
    • TRACKING READ ACCESSES TO REGIONS OF NON-VOLATILE MEMORY
    • 跟踪非易失性存储区域的访问
    • WO2014092967A1
    • 2014-06-19
    • PCT/US2013/071280
    • 2013-11-21
    • SANDISK TECHNOLOGIES INC.
    • D'ABREU, Manuel AntonioSKALA, Stephen
    • G11C16/34
    • G06F12/0246G11C16/3431G11C16/349
    • A data storage device includes a memory and a controller and may perform a method that includes updating, in the controller, a value of a particular counter of a set of counters in response to a read access to a particular region of the non-volatile memory that is tracked by the particular counter. Read accesses to a first region of the non-volatile memory are tracked by a first counter of the set of counters and read accesses to a second region of the non-volatile memory are tracked by a second counter of the set of counters. The method includes, in response to the value of the particular counter indicating that a count of read accesses to the particular region equals or exceeds a first threshold, initiating a remedial action to the particular region of the non-volatile memory.
    • 数据存储设备包括存储器和控制器,并且可以执行一种方法,该方法包括在控制器中响应于对非易失性存储器的特定区域的读访问来更新一组计数器的特定计数器的值 由特定计数器跟踪。 对非易失性存储器的第一区域的读取访问由该计数器集合的第一计数器跟踪,并且对该非易失性存储器的第二区域的读访问由该组计数器的第二计数器跟踪。 该方法包括响应于特定计数器的值指示对特定区域的读取访问的计数等于或超过第一阈值,向非易失性存储器的特定区域发起补救动作。
    • 9. 发明申请
    • DATA STORAGE DEVICE AND METHOD TO CORRECT BIT VALUES USING MULTIPLE READ VOLTAGES
    • 数据存储设备和使用多个读取电压校正位值的方法
    • WO2013039696A1
    • 2013-03-21
    • PCT/US2012/052889
    • 2012-08-29
    • SANDISK TECHNOLOGIES INC.D'ABREU, Manuel AntonioSKALA, Stephen
    • D'ABREU, Manuel AntonioSKALA, Stephen
    • G06F11/10G11C16/34
    • G06F11/1068G06F11/1048G11C29/52
    • A data storage device includes a memory including a plurality of storage elements. The memory is configured to read a group of the storage elements using a first read voltage to obtain a first plurality of bit values. A controller is coupled to the memory. The controller is configured to initiate a first error correction code (ECC) procedure on the first plurality of bit values. In response to the first ECC procedure determining that the first plurality of bit values is not correctable, the controller is further configured to instruct the memory to read the group of the storage elements using a second read voltage to obtain a second plurality of bit values, and to change one or more values of the first plurality of bit values to corresponding values of the second plurality of bit values to generate a first plurality of corrected bit values.
    • 数据存储装置包括具有多个存储元件的存储器。 存储器被配置为使用第一读取电压读取一组存储元件以获得第一多个位值。 控制器耦合到存储器。 控制器被配置为针对第一多个位值启动第一纠错码(ECC)过程。 响应于第一ECC程序确定第一多个比特值不可校正,控制器还被配置为指示存储器使用第二读取电压读取该组存储元件以获得第二多个比特值, 并且将所述第一多个比特值中的一个或多个值改变为所述第二多个比特值的对应值,以生成第一多个校正比特值。