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    • 1. 发明申请
    • NON-VOLATILE MEMORY WITH MULTI-GEAR CONTROL USING ON-CHIP FOLDING OF DATA
    • 使用片上数据折叠的多种控制的非易失性存储器
    • WO2011075594A1
    • 2011-06-23
    • PCT/US2010/060844
    • 2010-12-16
    • SANDISK CORPORATIONHUANG, JianminAVILA, ChrisGAVENS, Lee M.SPROUSE, Steven T.GOROBETS, Sergey AnatolievichHUTCHISON, Neil David
    • HUANG, JianminAVILA, ChrisGAVENS, Lee M.SPROUSE, Steven T.GOROBETS, Sergey AnatolievichHUTCHISON, Neil David
    • G11C16/10G11C11/56
    • G06F3/0608G06F3/0611G06F3/064G06F3/0679G06F12/0246G06F2212/7202G06F2212/7203G11C7/1042G11C11/5621G11C11/5628G11C16/0483G11C16/10G11C2211/5641G11C2211/5648
    • A memory system and methods of its operation are presented. The memory system includes a controller and a non-volatile memory circuit, where the non-volatile memory circuit has a first section, where data is stored in a binary format, and a second section, where data is stored in a multi-state format. The memory system receives data from the host and performs a binary write operation of the received data to the first section of the non-volatile memory circuit. The memory system subsequently folds portions of the data from the first section of the non-volatile memory to the second section of the non-volatile memory, wherein a folding operation includes reading the portions of the data from the first section rewriting it into the second section of the non-volatile memory using a multi-state programming operation. The controller determines to operate the memory system according to one of multiple modes. The modes include a first mode, where the binary write operations to the first section of the memory are interleaved with folding operations at a first rate, and a second mode, where the number of folding operations relative to the number of the binary write operations to the first section of the memory are performed at a higher than in the first mode. The memory system then operates according to determined mode. The memory system may also include a third mode, where folding operations are background operations executed when the memory system is not receiving data from the host.
    • 介绍了一种存储系统及其操作方法。 存储器系统包括控制器和非易失性存储器电路,其中非易失性存储器电路具有数据以二进制格式存储的第一部分和第二部分,其中数据以多状态格式存储 。 存储器系统从主机接收数据,并且对所述非易失性存储器电路的第一部分执行所接收数据的二进制写操作。 存储系统随后将数据的部分从非易失性存储器的第一部分折叠到非易失性存储器的第二部分,其中折叠操作包括从第一部分读取数据的部分,将数据重写成第二部分 使用多状态编程操作的非易失性存储器的一部分。 控制器根据多种模式之一确定操作存储器系统。 这些模式包括第一模式,其中对存储器的第一部分的二进制写入操作以第一速率进行折叠操作和第二模式,其中相对于二进制写入操作的数量的折叠操作的数量 存储器的第一部分在高于第一模式下执行。 然后,存储器系统根据确定的模式进行操作。 存储器系统还可以包括第三模式,其中折叠操作是当存储器系统未从主机接收数据时执行的背景操作。
    • 2. 发明申请
    • DATA TRANSFER FLOWS FOR ON-CHIP FOLDING
    • 数据传输流程用于片上折叠
    • WO2011075597A1
    • 2011-06-23
    • PCT/US2010/060855
    • 2010-12-16
    • SANDISK CORPORATIONHUANG, JianminAVILA, ChrisGAVENS, Lee M.GOROBETS, Sergey AnatolievichHUTCHISON, Neil David
    • HUANG, JianminAVILA, ChrisGAVENS, Lee M.GOROBETS, Sergey AnatolievichHUTCHISON, Neil David
    • G11C11/56G11C16/10G06F12/02
    • G11C11/5628G06F12/0246G06F2212/7203G11C7/1042G11C16/10G11C2211/5641G11C2211/5643
    • A memory system and methods of its operation are presented. The memory system includes a volatile buffer memory and a non-volatile memory circuit, where the non-volatile memory circuit has a first section, where data is stored in a binary format, and a second section, where data is stored in a multi-state format. When writing data to the non-volatile memory, the data is received from a host, stored in the buffer memory, transferred from the buffer memory to into read/write registers of the non-volatile memory circuit, and then written from the read/write registers to the first section of the non-volatile memory circuit using a binary write operation. Portions of the data and then subsequently folded from the first section of the non-volatile memory to the second section of the non-volatile memory, where a folding operation includes reading the portions of the data from multiple locations in the first section into the read/write registers and performing a multi-state programming operation of the potions of the data from the read/write registers into a location the second section of the non-volatile memory. The multi-state programming operations include a first phase and a second phase and one or more of the binary write operations are performed between the phases of the multi-state programming operations.
    • 介绍了一种存储系统及其操作方法。 存储器系统包括易失性缓冲存储器和非易失性存储器电路,其中非易失性存储器电路具有数据以二进制格式存储的第一部分,以及第二部分, 状态格式。 当将数据写入非易失性存储器时,将数据从存储在缓冲存储器中的主机接收,从缓冲存储器传送到非易失性存储器电路的读/写寄存器,然后从读/ 使用二进制写操作将寄存器写入非易失性存储器电路的第一部分。 然后将数据的部分随后从非易失性存储器的第一部分折叠到非易失性存储器的第二部分,其中折叠操作包括将第一部分中的多个位置的数据的部分读入读取 /写入寄存器,并且将数据从读/写寄存器执行到多状态编程操作到非易失性存储器的第二部分的位置。 多状态编程操作包括第一阶段和第二阶段,并且在多状态编程操作的阶段之间执行二进制写入操作中的一个或多个。
    • 5. 发明申请
    • NON-VOLATILE MEMORY AND METHOD WITH ACCELERATED POST-WRITE READ TO MANAGE ERRORS
    • 非易失性存储器和加速后置写入的方法读取管理错误
    • WO2011056483A1
    • 2011-05-12
    • PCT/US2010/053813
    • 2010-10-22
    • SANDISK CORPORATIONCHEN, JianGAVENS, Lee M.
    • CHEN, JianGAVENS, Lee M.
    • G11C11/56G11C16/34
    • G11C11/5628G11C16/3418G11C16/3454G11C29/00G11C2211/5621G11C2211/5641
    • Data errors in non-volatile memory inevitably increase with usage and with higher density of bits stored per cell. The memory is configured to have a first portion operating with less error but of lower density storage, and a second portion operating with a higher density but less robust storage. An error management provides reading and checking the copy after copying to the second portion. If the copy has excessive error bits, it is repeated in a different location either in the second or first portion. The reading and checking of the copy is accelerated by reading only a sample of it. The sample is selected from a subset of the copy having its own ECC and estimated to represent a worst error rate among the copy it is sampling. One embodiment has the sample taken from one bit of each multi-bit memory cell of a group.
    • 非易失性存储器中的数据错误不可避免地随着使用而增加,并且每个单元存储更高密度的位。 存储器被配置为具有以较小误差但是较低密度存储器操作的第一部分,以及以较高密度但较不牢固的存储器操作的第二部分。 错误管理在复制到第二部分后提供读取和检查副本。 如果副本具有过多的错误位,则在第二或第一部分的不同位置重复该复制。 通过只读取样本来读取和检查副本。 从具有其自己的ECC的副本的子集中选择该样本,并且估计该样本表示其正在采样的副本中的最差错误率。 一个实施例具有取自组中的每个多位存储器单元的一位的样本。