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    • 4. 发明申请
    • PROCÉDÉ DE TRANSFERT D'UNE COUCHE MINCE COMPRENANT UNE PERTURBATION CONTROLÉE D'UNE STRUCTURE CRISTALLINE
    • 传输包含晶体结构受控干扰的薄膜的方法
    • WO2006037783A1
    • 2006-04-13
    • PCT/EP2005/054994
    • 2005-10-04
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESCAYREFOURCQ, IanMAZURE, CarlosBOURDELLE, Konstantin
    • CAYREFOURCQ, IanMAZURE, CarlosBOURDELLE, Konstantin
    • H01L21/762
    • H01L21/76254
    • L'invention concerne un procédé de transfert de couche mince d'un substrat donneur vers un substrat receveur comprenant la création d'une zone de fragilisation dans ie substrat donneur, caractérisé en ce qu'il comprend les étapes consistant à : - Perturber la structure cristalline d'une région de surface du substrat donneur, afin d!y créer une région superficielle perturbée, et définir une interface de perturbation entre ladite région perturbée et la région sous-jacente du substrat donneur dont la structure cristalline est conservée, - Soumettre ledit substrat donneur à un recuit de recristailisation en vue de provoquer - une recristallisation au moins partielle de ladite région perturbée, à partir de la structure cristalline de ladite région sous-jacente du substrat donneur, - et la création d'une zone de défauts cristallins dans le plan de ladite interface de perturbation, - Introduire une ou plusieurs espèces dans l'épaisseur du substrat donneur pour y créer iadite zone de fragilisation, les paramètres de l'introduction d'espèces étant ajustés pour introduire un maximum d'espèces au niveau de ladite zone de défauts cristallins.
    • 本发明涉及一种用于将薄膜从施主衬底转移到接收器衬底的方法,包括在施主衬底中产生弱化区,其特征在于其包括以下步骤:干扰施主衬底的表面区域的晶体结构 以便在其中产生干扰的表面区域,并且限定所述受扰区域与所述晶体结构被保留的所述施主衬底的下方区域之间的干扰界面; 对所述施主衬底进行再结晶退火以使所述受扰区域至少部分重结晶,从所述施主衬底的下面的区域的晶体结构产生,并在所述扰动界面的平面中产生晶体缺陷区域; 将一个或多个物质引入施主衬底的厚度以在其中在其中产生所述弱化区域,引入物质的参数被调整以在晶体缺陷的所述区域处引入最多的物质。
    • 6. 发明申请
    • RELAXATION OF A THIN LAYER AFTER ITS TRANSFER
    • 转移后薄层的放松
    • WO2004077552A1
    • 2004-09-10
    • PCT/IB2004/000927
    • 2004-03-01
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESGHYSELEN, BrunoMAZURE, CarlosARENE, Emmanuel
    • GHYSELEN, BrunoMAZURE, CarlosARENE, Emmanuel
    • H01L21/762
    • H01L21/324H01L21/76254H01L21/76259
    • The invention relates to a method of forming a relaxed or pseudo-relaxed layer on a substrate, the relaxed layer (2’) being in a material selected from semiconductior materials, characterized in that the method comprises the following steps: (a) growing on a donor substrate (1) an elastically strained layer (2) consisting of at least a material selected among the semiconductor materials; (b) forming on the strained layer (2) or on a receiving substrate (7), a vitreous layer (4) made of a material viscous from a viscosity temperature; (c) bonding the receiving substrate (7), to the strained layer (2) via the vitreous layer (4); (d) removing a portion of the donor substrate (1), so as to form a structure comprising the receiving substrate (2), the vitreous layer (4), the strained layer (2) and the unremoved portion of the donor substrate (1) which thereby forms a surface layer (1B); (e) heat treating the structure at a temperature close to or higher than the viscosity temperature. The invention further relates to structures obtained during the method of forming a relaxed or pseudo-relaxed layer on a substrate.
    • 本发明涉及一种在衬底上形成松弛或假松弛层的方法,所述松弛层(2')是选自半导体材料的材料,其特征在于该方法包括以下步骤:(a) 供体衬底(1)由至少由半导体材料中选择的材料组成的弹性应变层(2); (b)在应变层(2)或接收基板(7)上形成玻璃质层(4),其由粘度为粘性的材料制成; (c)经由玻璃质层(4)将接收基板(7)接合到应变层(2); (d)去除供体衬底(1)的一部分,以便形成包括接收衬底(2),玻璃质层(4),应变层(2)和供体衬底的未移动部分 1),由此形成表面层(1B); (e)在接近或高于粘度温度的温度下对结构进行热处理。 本发明还涉及在衬底上形成松弛或假松弛层的方法期间获得的结构。
    • 7. 发明申请
    • DATA-PATH CELL ON AN SeOI SUBSTRATE WITH A BACK CONTROL GATE BENEATH THE INSULATING LAYER
    • 具有后控制门的SeOI基板上的数据路径电池绝缘层
    • WO2011107356A1
    • 2011-09-09
    • PCT/EP2011/052421
    • 2011-02-18
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESMAZURE, CarlosFERRANT, Richard
    • MAZURE, CarlosFERRANT, Richard
    • H01L27/12
    • H01L21/84H01L27/0207H01L27/11807H01L27/1203
    • This invention provides a semiconductor device structure formed on a conventional semiconductor-on-insulator (SeOI) substrate defined by a pattern defining at least one field-effect transistor having: in the thin film of the SeOI substrate, a source region, a drain region, a channel region, and a front control gate region formed above the channel region; and in the base substrate beneath the buried oxide of the SeOI substrate, a back control gate region, arranged under the channel region and configured to shift the threshold voltage of the transistor in response to bias voltages. This invention also provides patterns defining standard-cell-type circuit structures and data-path-cell type circuit structures that include arrays of the FET patterns provided by this invention. Such circuit structures also include back gate lines connecting the back gate control regions. This invention also provides methods of operating and designing such semiconductor device structures.
    • 本发明提供了一种半导体器件结构,其形成在常规的绝缘体上半导体(SeOI)衬底上,该衬底由限定至少一个场效应晶体管的图案限定,该场效应晶体管具有:在SeOI衬底的薄膜中,源极区, ,沟道区和形成在沟道区上方的前控制栅区; 以及位于所述SeOI衬底的所述掩埋氧化物之下的所述基底衬底中,所述背面控制栅极区域布置在所述沟道区域下方并且被配置为响应于偏压而移位所述晶体管的阈值电压。 本发明还提供了定义包括由本发明提供的FET图案的阵列的标准单元型电路结构和数据路径单元型电路结构的图案。 这种电路结构还包括连接背栅控制区的后栅极线。 本发明还提供了操作和设计这种半导体器件结构的方法。
    • 8. 发明申请
    • DATA-PATH CELL ON AN SEOI SUBSTRATE WITH A BACK CONTROL GATE BENEATH THE INSULATING LAYER
    • 具有后控制门的SEOI基板上的数据路径电池绝缘层
    • WO2011107355A1
    • 2011-09-09
    • PCT/EP2011/052413
    • 2011-02-18
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESMAZURE, CarlosFERRANT, Richard
    • MAZURE, CarlosFERRANT, Richard
    • H01L27/12
    • H01L27/1203H01L29/78609H01L29/78648
    • The invention provides a data-path cell specifically adapted to its environment for use in an integrated circuit produced on a semiconductor-on-insulator (SeOI) substrate. The data-path cell includes an array of field-effect transistors, each transistor having a source region, a drain region and a channel region formed in the thin semiconductor layer of the SeOI substrate, and further having a front gate control region formed above the channel region. In particular, one or more transistors of the data-path cell further includes a back gate control region formed in the bulk substrate beneath the channel region and configured so as to modify the performance characteristics of the transistor in dependence on its state of bias. Also, an integrated circuit including one or more of the data-path cells and methods for designing or driving these data-path cells.
    • 本发明提供一种特别适用于其环境的数据通道单元,用于在绝缘体上半导体(SeOI)衬底上制造的集成电路中。 数据通道单元包括场效应晶体管阵列,每个晶体管具有形成在SeOI衬底的薄半导体层中的源极区,漏极区和沟道区,并且还具有形成在栅极上的前栅极控制区 渠道区域。 特别地,数据通道单元的一个或多个晶体管还包括形成在沟道区下面的体衬底中的背栅极控制区域,并且被配置为根据其偏置状态来修改晶体管的性能特性。 而且,包括一个或多个数据路径单元的集成电路以及用于设计或驱动这些数据路径单元的方法。
    • 10. 发明申请
    • SEMICONDUCTOR STRUCTURES
    • 半导体结构
    • WO2010002509A1
    • 2010-01-07
    • PCT/US2009/044372
    • 2009-05-18
    • S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIESNGUYEN, Bich-YenMAZURE, Carlos
    • NGUYEN, Bich-YenMAZURE, Carlos
    • H01L27/12H01L21/70
    • H01L21/76254H01L21/76256
    • In preferred embodiments, this invention provides a semiconductor structure that has a semi-conducting support, an insulating layer arranged on a portion of the support and a semi-conducting superficial layer arranged on the insulating layer. Electronic devices can be formed in the superficial layer and also in the exposed portion of the semi-conducting bulk region of the substrate not covered by the insulating layer. The invention also provides methods of fabricating such semiconductor structures which, starting from a substrate that includes a semi-conducting superficial layer arranged on a continuous insulating layer both of which being arranged on a semi-conducting support, by transforming at least one selected region of a substrate so as to form an exposed semi-conducting bulk region of the substrate.
    • 在优选实施例中,本发明提供一种半导体结构,其具有半导电支撑件,布置在支撑件的一部分上的绝缘层和布置在绝缘层上的半导电表面层。 电子器件可以形成在表面层中,也可以形成在衬底的半导体本体区域的未被绝缘层覆盖的露出部分中。 本发明还提供了制造这样的半导体结构的方法,其从包括布置在连续绝缘层上的半导电表面层的衬底开始,两者均布置在半导电支撑件上,通过将至少一个选定区域 基板,以形成基板的暴露的半导体本体区域。