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    • 2. 发明申请
    • X-RAY IMAGING SYSTEM FOR PHASE CONTRAST IMAGING USING PHOTON-COUNTING EVENTS
    • WO2020106197A1
    • 2020-05-28
    • PCT/SE2019/051010
    • 2019-10-14
    • PRISMATIC SENSORS AB
    • DANIELSSON, MatsSUNDBERG, Christel
    • G01T1/24A61B6/03G01N23/04G01T1/29
    • There is provided an x-ray imaging system (100) comprising an x-ray source (10), and an associated x-ray detector (20), wherein the x-ray detector (20) is a photon counting x-ray detector for enabling detection of photon-counting events. The x-ray imaging system (100) is configured for enabling acquisition of at least one phase contrast image based on detected photon-counting events. The x-ray detector (20) is based on a number of x-ray detector sub-modules, also referred to as wafers, each of which comprises detector elements, wherein the x-ray detector sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x- rays enter through the edge. Each x-ray detector sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements, also referred to as pixels, are arranged. The x-ray imaging system (100) is further configured to determine an estimate or measure of charge diffusion originating from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in an x-ray detector sub-module or wafer of the x-ray detector, and to determine an estimate of a point of interaction of the incident x-ray photon in the x-ray detector sub-module based on the determined estimate or measure of charge diffusion.
    • 5. 发明申请
    • ENHANCED SPECTRAL X-RAY IMAGING
    • WO2020171748A1
    • 2020-08-27
    • PCT/SE2019/051238
    • 2019-12-06
    • PRISMATIC SENSORS AB
    • BORNEFALK, HansGRÖNBERG, FredrikDANIELSSON, Mats
    • A61B6/03G01N23/04
    • There is provided an apparatus (100) for x-ray imaging comprising an x-ray source (10) and an x-ray detector (20) having a number of detector elements, wherein the x-ray source (10) and the x-ray detector (20) are arranged on a support that is able to rotate around a subject or object to be imaged to enable a set of projections at different view angles. The apparatus (100) is configured to operate the x-ray source (10) in switched kVp mode for alternately applying at least two different voltages, including a lower voltage and a higher voltage, during rotation to enable lower-energy and higher- energy exposures over the set of projections, thereby providing for lower-energy projections and higher-energy projections. The x-ray detector (20) is a photon-counting multi-bin detector configured to allocate photon counts to multiple energy bins, and the apparatus is configured to select counts from at least a subset of the energy bins to provide corresponding photon count information for both lower-energy projections and higher-energy projections. The apparatus (100) is configured to perform material basis decomposition for each of a number of the lower-energy projections and higher- energy projections and/or for each of a number of combinations of at least one lower- energy projection and at least one higher-energy projection, based on the corresponding photon count information.
    • 7. 发明申请
    • SCATTER ESTIMATION AND/OR CORRECTION IN X-RAY IMAGING
    • X射线成像中的散射估计和/或校正
    • WO2016209138A1
    • 2016-12-29
    • PCT/SE2015/051072
    • 2015-10-08
    • PRISMATIC SENSORS AB
    • DANIELSSON, MatsHOFFMAN, David Michael
    • G01T1/24A61B6/00G01T1/29G01T1/36
    • A61B6/5282A61B6/032A61B6/4233A61B6/4241A61B6/4266A61B6/4291G01T1/2985
    • There is provided methods and devices for estimating object scatter and/or internal scatter in a multi-level photon-counting x-ray detector (102, 103), as well as methods and devices for x-ray tomographic imaging of an object while correcting for object scatter and/or internal scatter. The x-ray detector has at least two layers of detector diodes mounted in an edge- on geometry, e.g. designed for 1 ) estimating the object scatter contribution to the counts in a top layer of said at least two layers based on difference(s) in counts between the top layer and lower layer(s) under the assuption the object scatter has a slowly varying spatial distribution, and/or 2) estimating counts from reabsorption of photons that have Compton scattered inside the detector based on selectively blinding some detector elements from primary radiation by placing a highly attenuating beam stop on top of the detector elements, in lower layer(s) or in both top layer and lower layer(s), and measuring the counts in those detector elements.
    • 提供了用于估计多级光子计数X射线检测器(102,103)中的物体散射和/或内部散射的方法和装置,以及用于物体的X射线层析成像的方法和装置,同时校正 用于物体散射和/或内部散射。 x射线检测器具有安装在边缘几何上的至少两层检测器二极管,例如。 设计用于1)基于所述顶层和下层之间的计数的差异来估计对所述至少两个层的顶层中的计数的对象散射贡献,所述对象散射具有缓慢变化 空间分布和/或2)基于通过将检测器元件的高度衰减的光束停止放置在检测器元件的顶部的下层(s)中,基于通过选择性地将一些检测器元件从初级辐射中盲目地估计具有康普顿散射在检测器内部的光子的重新吸收的计数 )或在顶层和下层中,并且测量那些检测器元件中的计数。