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    • 1. 发明申请
    • X-RAY IMAGING SYSTEM FOR PHASE CONTRAST IMAGING USING PHOTON-COUNTING EVENTS
    • WO2020106197A1
    • 2020-05-28
    • PCT/SE2019/051010
    • 2019-10-14
    • PRISMATIC SENSORS AB
    • DANIELSSON, MatsSUNDBERG, Christel
    • G01T1/24A61B6/03G01N23/04G01T1/29
    • There is provided an x-ray imaging system (100) comprising an x-ray source (10), and an associated x-ray detector (20), wherein the x-ray detector (20) is a photon counting x-ray detector for enabling detection of photon-counting events. The x-ray imaging system (100) is configured for enabling acquisition of at least one phase contrast image based on detected photon-counting events. The x-ray detector (20) is based on a number of x-ray detector sub-modules, also referred to as wafers, each of which comprises detector elements, wherein the x-ray detector sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x- rays enter through the edge. Each x-ray detector sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements, also referred to as pixels, are arranged. The x-ray imaging system (100) is further configured to determine an estimate or measure of charge diffusion originating from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in an x-ray detector sub-module or wafer of the x-ray detector, and to determine an estimate of a point of interaction of the incident x-ray photon in the x-ray detector sub-module based on the determined estimate or measure of charge diffusion.