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    • 6. 发明申请
    • TAMPER-DETECTING ELECTRONIC SYSTEM
    • 篡改检测电子系统
    • WO2009047585A1
    • 2009-04-16
    • PCT/IB2007/054113
    • 2007-10-09
    • NDS LIMITEDSUDAI, RamiSHLOMOVICH, YonatanKATZ, Samuel
    • SUDAI, RamiSHLOMOVICH, YonatanKATZ, Samuel
    • G06F21/06
    • G06F21/86
    • An apparatus for detecting tampering with an integrated circuit (IC), the apparatus comprising a second circuit comprising at least one conductor for conducting electrical current, the electrical current comprising, during at least one period of time, current of known strength, the electrical current generating a magnetic field, at least one magnetic field sensing device operatively associated with the IC, the sensing device having at least one electrical characteristic responsive to changes in a sensed magnetic field, the magnetic field sensing device being positioned so as to sense the magnetic field generated by current in the at least one conductor, and an analyzer operatively associated with the at least one magnetic field sensing device and the IC, the analyzer determining that the IC is being tampered with based, at least in part, on changes in the at least one electrical characteristic of the at least one magnetic field sensing device in response to changes in the sensed magnetic field generated by the electrical current in the at least one conductor during the at least one period of time. Related apparatus and methods are also described.
    • 一种用于检测篡改集成电路(IC)的装置,该装置包括第二电路,该第二电路包括用于传导电流的至少一个导体,该电流在至少一段时间内包括已知强度的电流,电流 产生磁场,至少一个与所述IC可操作地相关联的磁场感测装置,所述感测装置具有响应于感测磁场的变化的至少一个电特性,所述磁场感测装置被定位成感测磁场 由所述至少一个导体中的电流产生的分析仪以及与所述至少一个磁场感测装置和所述IC可操作地相关联的分析器,所述分析器至少部分地基于所述至少一个磁场感测装置和所述IC的变化来确定所述IC被篡改 响应于所感测的磁体的变化,至少一个磁场感测装置的至少一个电特性 在所述至少一个时间段期间由所述至少一个导体中的电流产生的所述ic场。 还描述了相关装置和方法。